SE0202780L - Metod, en portabel anordning och ett mätinstrument för standardisering av ett satellitmätinstrument till ett motsvarande huvudmätinstrument - Google Patents

Metod, en portabel anordning och ett mätinstrument för standardisering av ett satellitmätinstrument till ett motsvarande huvudmätinstrument

Info

Publication number
SE0202780L
SE0202780L SE0202780A SE0202780A SE0202780L SE 0202780 L SE0202780 L SE 0202780L SE 0202780 A SE0202780 A SE 0202780A SE 0202780 A SE0202780 A SE 0202780A SE 0202780 L SE0202780 L SE 0202780L
Authority
SE
Sweden
Prior art keywords
measuring instrument
standardizing
portable device
satellite
corresponding main
Prior art date
Application number
SE0202780A
Other languages
English (en)
Other versions
SE523545C2 (sv
SE0202780D0 (sv
Inventor
Bo Buechmann
Mark Westerhaus
Sven-Anders Nilsson
Anders Ebelin
Original Assignee
Foss Tecator Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Foss Tecator Ab filed Critical Foss Tecator Ab
Priority to SE0202780A priority Critical patent/SE523545C2/sv
Publication of SE0202780D0 publication Critical patent/SE0202780D0/sv
Priority to US10/283,170 priority patent/US7227623B2/en
Priority to EP03797784.0A priority patent/EP1546692B1/en
Priority to NZ549634A priority patent/NZ549634A/xx
Priority to NZ539140A priority patent/NZ539140A/en
Priority to AU2003261061A priority patent/AU2003261061B2/en
Priority to JP2004538111A priority patent/JP4509784B2/ja
Priority to PCT/SE2003/001467 priority patent/WO2004027404A1/en
Priority to ES03797784.0T priority patent/ES2527040T3/es
Publication of SE0202780L publication Critical patent/SE0202780L/sv
Publication of SE523545C2 publication Critical patent/SE523545C2/sv
Priority to US11/790,754 priority patent/US7486388B2/en
Priority to AU2008229761A priority patent/AU2008229761B8/en
Priority to JP2009212361A priority patent/JP4880734B2/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
    • G01N2021/3155—Measuring in two spectral ranges, e.g. UV and visible
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/278—Constitution of standards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/022—Casings
    • G01N2201/0221—Portable; cableless; compact; hand-held

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
SE0202780A 2002-09-19 2002-09-19 Metod, en portabel anordning och ett mätinstrument för standardisering av ett satellitmätinstrument till ett motsvarande huvudmätinstrument SE523545C2 (sv)

Priority Applications (12)

Application Number Priority Date Filing Date Title
SE0202780A SE523545C2 (sv) 2002-09-19 2002-09-19 Metod, en portabel anordning och ett mätinstrument för standardisering av ett satellitmätinstrument till ett motsvarande huvudmätinstrument
US10/283,170 US7227623B2 (en) 2002-09-19 2002-10-30 Method and apparatus for standardization of a measuring instrument
ES03797784.0T ES2527040T3 (es) 2002-09-19 2003-09-19 Método y aparato para la estandarización de un instrumento de medida
JP2004538111A JP4509784B2 (ja) 2002-09-19 2003-09-19 測定器具の標準化のための方法および装置
NZ549634A NZ549634A (en) 2002-09-19 2003-09-19 Method and apparatus for standardization of a measuring instrument
NZ539140A NZ539140A (en) 2002-09-19 2003-09-19 Method and apparatus for standardization of a measuring instrument
AU2003261061A AU2003261061B2 (en) 2002-09-19 2003-09-19 Method and apparatus for standardization of a measuring instrument
EP03797784.0A EP1546692B1 (en) 2002-09-19 2003-09-19 Method and apparatus for standardization of a measuring instrument
PCT/SE2003/001467 WO2004027404A1 (en) 2002-09-19 2003-09-19 Method and apparatus for standardization of a measuring instrument
US11/790,754 US7486388B2 (en) 2002-09-19 2007-04-27 Method and apparatus for standardization of a measuring instrument
AU2008229761A AU2008229761B8 (en) 2002-09-19 2008-10-02 A measuring instrument
JP2009212361A JP4880734B2 (ja) 2002-09-19 2009-09-14 測定器具の標準化のための方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE0202780A SE523545C2 (sv) 2002-09-19 2002-09-19 Metod, en portabel anordning och ett mätinstrument för standardisering av ett satellitmätinstrument till ett motsvarande huvudmätinstrument

Publications (3)

Publication Number Publication Date
SE0202780D0 SE0202780D0 (sv) 2002-09-19
SE0202780L true SE0202780L (sv) 2004-03-20
SE523545C2 SE523545C2 (sv) 2004-04-27

Family

ID=20289039

Family Applications (1)

Application Number Title Priority Date Filing Date
SE0202780A SE523545C2 (sv) 2002-09-19 2002-09-19 Metod, en portabel anordning och ett mätinstrument för standardisering av ett satellitmätinstrument till ett motsvarande huvudmätinstrument

Country Status (5)

Country Link
US (2) US7227623B2 (sv)
JP (1) JP4880734B2 (sv)
AU (1) AU2008229761B8 (sv)
ES (1) ES2527040T3 (sv)
SE (1) SE523545C2 (sv)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7667854B2 (en) * 2006-12-18 2010-02-23 Battelle Energy Alliance, Llc Hand-held survey probe
NZ554258A (en) * 2007-03-29 2009-01-31 Khipu Systems Ltd Predictive model implementation system and methodology
WO2009055348A1 (en) * 2007-10-23 2009-04-30 Nanodrop Technologies Llc Photometer with modular light emitter
JP6308357B2 (ja) * 2014-01-10 2018-04-11 横河電機株式会社 校正用サンプルの製造方法
EP3734243A1 (en) * 2019-05-01 2020-11-04 Kaiser Optical Systems Inc. Standard reference material interface for raman probe

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US3776642A (en) * 1972-08-01 1973-12-04 Dickey John Corp Grain analysis computer
US3960497A (en) * 1975-08-19 1976-06-01 Beckman Instruments, Inc. Chemical analyzer with automatic calibration
US4890916A (en) * 1988-09-07 1990-01-02 Rainer E H Illuminator for a refractometer
JP2958353B2 (ja) 1988-12-15 1999-10-06 シスメックス株式会社 光学系調整用の標準物質およびその製造方法
US4988211A (en) * 1989-04-27 1991-01-29 The Dow Chemical Company Process and apparatus for contactless measurement of sample temperature
DE69215204T2 (de) * 1992-01-29 1997-03-13 Hewlett Packard Gmbh Verfahren und System zur Überwachung von Lebensfunktionen
DE69414918T2 (de) * 1993-05-27 1999-04-29 Scantronic Ltd., Greenford Fernidentifizierungssystem
US5724025A (en) * 1993-10-21 1998-03-03 Tavori; Itzchak Portable vital signs monitor
US5488571A (en) * 1993-11-22 1996-01-30 Timex Corporation Method and apparatus for downloading information from a controllable light source to a portable information device
US5754283A (en) * 1994-10-26 1998-05-19 Byk-Gardner Usa, Division Of Atlana Color measuring device having interchangeable optical geometries
DE19603000A1 (de) 1996-01-27 1997-07-31 Philips Patentverwaltung Verfahren zum Kalibrieren einer Anordnung zur Ermittlung des Impulsübertragsspektrums und Kalibriereinheit zur Durchführung des Verfahrens
US5691812A (en) * 1996-03-22 1997-11-25 Ade Optical Systems Corporation Calibration standard for calibrating a defect inspection system and a method of forming same
DE19637383A1 (de) * 1996-09-13 1998-04-02 Siemens Ag Datenerfassungs- und Auswertevorrichtung für eine Person
US5946083A (en) * 1997-10-01 1999-08-31 Texas Instruments Incorporated Fixed optic sensor system and distributed sensor network
JP3043506U (ja) * 1997-05-16 1997-11-28 株式会社トーセ 手持ち型液晶ゲーム機用魚群探知具
FR2764704B1 (fr) * 1997-06-16 1999-08-20 Stago Diagnostica Dispositif pour la lecture automatique d'un code d'identification porte par des recipients tubulaires
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US6073476A (en) * 1998-04-02 2000-06-13 Lucent Technologies Inc. Calibration sample for particle analyzers and method for making the same
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Also Published As

Publication number Publication date
US20080168822A1 (en) 2008-07-17
US7227623B2 (en) 2007-06-05
SE523545C2 (sv) 2004-04-27
AU2008229761A1 (en) 2008-10-30
AU2008229761B2 (en) 2011-03-31
SE0202780D0 (sv) 2002-09-19
US7486388B2 (en) 2009-02-03
AU2008229761B9 (en) 2011-05-12
US20040057038A1 (en) 2004-03-25
JP2010008422A (ja) 2010-01-14
AU2008229761B8 (en) 2011-05-12
JP4880734B2 (ja) 2012-02-22
ES2527040T3 (es) 2015-01-19

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