RU94035715A - Multiple-beam interference unit - Google Patents

Abstract

FIELD: optical instruments using holography. SUBSTANCE: Homogeneous medium, which refraction index is n0, has point source of coherent linear-polarization light with wavelength λ, and optical element, which refraction index is n and which has parallel spherical surfaces with common curvature center but with different curvature radiuses r1 - r2 = d. Both optical element and light source are located on common optical axis. Convexity of both surfaces is directed towards light source. Distance between spherical surfaces conform to condition d=n•r1/(f•(n-n0)+n•r1),, where r1 is curvature radius of greater surface, f is focal length. Interference pattern is projected to matrix of photodetectors using charge-coupling devices. Period for arrangement of photodetectors is T. Light receiver is not perpendicular to optical axis, where light source and optical element are located, but is displaced with respect to perpendicular to optical axis by angle of α=arcsin λ/T.. EFFECT: increased precision of measuring interference alternation in shape of light wave edge, simplified design of interferometer.

Claims (1)

The invention relates to the field of optical measurements and to the construction of control and measuring devices using holography. The invention solves the problem of improving the accuracy of interference measurements of the shape of the wavefront of the radiation, and also provides a simpler scheme for constructing an interferometer. For this, in a homogeneous medium with a refractive index on one optical axis, a point source of coherent linearly polarized radiation of a certain wavelength is installed, an optical element with a refractive index and parallel spherical surfaces having one center of curvature, but different radii of curvature, the convexity of both surfaces is oriented to the side radiation source. The distance between the spherical surfaces is selected from the ratio. The interference pattern is projected onto a matrix of photosensitive elements on charge-coupled devices with a period of placement of photosensitive elements T. Moreover, the radiation receiver is not perpendicular to the optical axis, on which the radiation source and optical element are located, but is offset by an angle relative to the perpendicular to the optical axis.