PL4471413T3 - Linia produkcyjna z głowicą pomiarową fluorescencji rentgenowskiej do określania ilości co najmniej jednego primera naniesionego na co najmniej jeden materiał nośny - Google Patents

Linia produkcyjna z głowicą pomiarową fluorescencji rentgenowskiej do określania ilości co najmniej jednego primera naniesionego na co najmniej jeden materiał nośny

Info

Publication number
PL4471413T3
PL4471413T3 PL23176405.1T PL23176405T PL4471413T3 PL 4471413 T3 PL4471413 T3 PL 4471413T3 PL 23176405 T PL23176405 T PL 23176405T PL 4471413 T3 PL4471413 T3 PL 4471413T3
Authority
PL
Poland
Prior art keywords
determining
amount
production line
support material
ray fluorescence
Prior art date
Application number
PL23176405.1T
Other languages
English (en)
Inventor
Sabrina Pfeiffer
Norbert Kalwa
Original Assignee
SWISS KRONO Tec AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SWISS KRONO Tec AG filed Critical SWISS KRONO Tec AG
Publication of PL4471413T3 publication Critical patent/PL4471413T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F19/00—Apparatus or machines for carrying out printing operations combined with other operations
    • B41F19/001—Apparatus or machines for carrying out printing operations combined with other operations with means for coating or laminating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F23/00—Devices for treating the surfaces of sheets, webs, or other articles in connection with printing
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F23/00—Devices for treating the surfaces of sheets, webs, or other articles in connection with printing
    • B41F23/04—Devices for treating the surfaces of sheets, webs, or other articles in connection with printing by heat drying, by cooling, by applying powders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41F—PRINTING MACHINES OR PRESSES
    • B41F33/00—Indicating, counting, warning, control or safety devices
    • B41F33/02—Arrangements of indicating devices, e.g. counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/61—Specific applications or type of materials thin films, coatings

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL23176405.1T 2023-05-31 2023-05-31 Linia produkcyjna z głowicą pomiarową fluorescencji rentgenowskiej do określania ilości co najmniej jednego primera naniesionego na co najmniej jeden materiał nośny PL4471413T3 (pl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP23176405.1A EP4471413B1 (de) 2023-05-31 2023-05-31 Produktionslinie mit röntgenfluoreszenzmesskopf zur bestimmung einer auf mindestens ein trägermaterial aufgetragenen menge von mindestens einem primer

Publications (1)

Publication Number Publication Date
PL4471413T3 true PL4471413T3 (pl) 2026-07-27

Family

ID=86646654

Family Applications (1)

Application Number Title Priority Date Filing Date
PL23176405.1T PL4471413T3 (pl) 2023-05-31 2023-05-31 Linia produkcyjna z głowicą pomiarową fluorescencji rentgenowskiej do określania ilości co najmniej jednego primera naniesionego na co najmniej jeden materiał nośny

Country Status (5)

Country Link
EP (2) EP4471413B1 (pl)
CN (1) CN121079591A (pl)
ES (1) ES3069437T3 (pl)
PL (1) PL4471413T3 (pl)
WO (1) WO2024245997A1 (pl)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE455441B (sv) * 1986-11-24 1988-07-11 Refina Instr Ab Sett att styra och/eller meta tjockleken av skikt sasom ytskikt pa underlag
US5212260A (en) * 1990-11-07 1993-05-18 Hoechst Celanese Corporation Primer coating composition for silicone release applications
ES2606205T3 (es) 2014-07-29 2017-03-23 Flooring Technologies Ltd. Procedimiento para fabricar un producto impregnado, producto impregnado y procedimiento para fabricar un laminado a partir del producto impregnado
JP6361624B2 (ja) * 2014-10-17 2018-07-25 信越化学工業株式会社 活性エネルギー線硬化型シリコーンコーティング組成物及び被覆物品
WO2016116129A1 (en) * 2015-01-19 2016-07-28 Hewlett-Packard Indigo B.V. Primer composition and method
CN109506602B (zh) * 2018-12-28 2021-04-16 宝钢湛江钢铁有限公司 一种锌铝镁镀层钢板的镀层厚度测量方法

Also Published As

Publication number Publication date
EP4471413A1 (de) 2024-12-04
EP4471413B1 (de) 2026-03-18
EP4720649A1 (de) 2026-04-08
CN121079591A (zh) 2025-12-05
WO2024245997A1 (de) 2024-12-05
ES3069437T3 (en) 2026-06-08
EP4471413C0 (de) 2026-03-18