PL435899A1 - Układ do kontroli bezpieczeństwa - Google Patents

Układ do kontroli bezpieczeństwa

Info

Publication number
PL435899A1
PL435899A1 PL435899A PL43589920A PL435899A1 PL 435899 A1 PL435899 A1 PL 435899A1 PL 435899 A PL435899 A PL 435899A PL 43589920 A PL43589920 A PL 43589920A PL 435899 A1 PL435899 A1 PL 435899A1
Authority
PL
Poland
Prior art keywords
backscatter
support device
height
backscattering
security control
Prior art date
Application number
PL435899A
Other languages
English (en)
Inventor
Hao Yu
Ying Li
Weizhen Wang
Quanwei Song
Dongyu Wang
Haojie Chi
Jianmin Li
Yulan Li
Chunguang ZONG
Zhiqiang Chen
Yuanjing Li
Li Zhang
Original Assignee
Tsinghua University
Nuctech Company Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Company Limited filed Critical Tsinghua University
Publication of PL435899A1 publication Critical patent/PL435899A1/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20066—Measuring inelastic scatter of gamma rays, e.g. Compton effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Geophysics And Detection Of Objects (AREA)

Abstract

Niniejsze ujawnienie dotyczy technicznej dziedziny kontroli bezpieczeństwa, a w szczególności układu do kontroli bezpieczeństwa. Układ do kontroli bezpieczeństwa zawiera urządzenie skanujące rozproszeniem wstecznym i urządzenie wsporcze (2), przy czym urządzenie wsporcze tworzy kanał kontrolny, przez który przechodzi obiekt, który ma być poddany wykrywaniu, przy czym urządzenie skanujące rozproszeniem wstecznym jest umieszczone w górnej części urządzenia wsporczego i zawiera urządzenie źródła promieniowania rozproszenia wstecznego wraz z detektorem rozproszenia wstecznego, a wysokość urządzenia skanującego rozproszeniem wstecznym jest regulowana przez urządzenie wsporcze. Urządzenie wsporcze układu do kontroli bezpieczeństwa jest skonfigurowane tak, że reguluje wysokość zamontowanego na nim urządzenia skanującego rozproszeniem wstecznym, tak że można łatwo regulować rzut ruchomej plamki rozproszenia wstecznego i kąt pola w procesie skanowania zgodnie z wysokością obiektów a, które mają być poddane wykrywaniu, skutecznie poprawiając w ten sposób jakość obrazów rozproszenia wstecznego.
PL435899A 2018-05-09 2020-11-05 Układ do kontroli bezpieczeństwa PL435899A1 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201810436690.3A CN108732192A (zh) 2018-05-09 2018-05-09 安全检查系统
PCT/CN2019/076609 WO2019214324A1 (zh) 2018-05-09 2019-03-01 安全检查系统

Publications (1)

Publication Number Publication Date
PL435899A1 true PL435899A1 (pl) 2021-07-19

Family

ID=63937287

Family Applications (1)

Application Number Title Priority Date Filing Date
PL435899A PL435899A1 (pl) 2018-05-09 2020-11-05 Układ do kontroli bezpieczeństwa

Country Status (3)

Country Link
CN (1) CN108732192A (pl)
PL (1) PL435899A1 (pl)
WO (1) WO2019214324A1 (pl)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109254328A (zh) * 2018-02-24 2019-01-22 北京首都机场航空安保有限公司 一种行李安检系统
CN108732192A (zh) * 2018-05-09 2018-11-02 清华大学 安全检查系统
US10859719B2 (en) * 2018-12-13 2020-12-08 The Boeing Company Adjustable multifacet x-ray sensor array
CN109521480A (zh) * 2019-01-04 2019-03-26 同方威视科技（北京）有限公司 辐射检查设备和辐射检查方法
CN109521481A (zh) 2019-01-04 2019-03-26 同方威视技术股份有限公司 检查装置
CN109521485A (zh) 2019-01-04 2019-03-26 同方威视技术股份有限公司 扫描装置及其转场方法
CN109490977A (zh) * 2019-01-04 2019-03-19 清华大学 检查设备
CN112346137B (zh) * 2019-08-09 2022-11-11 同方威视技术股份有限公司 检查站和检查方法
CN110579808A (zh) * 2019-09-12 2019-12-17 浙江智探安防科技有限公司 一种升降式x光安全检查设备
CN112711057A (zh) * 2020-12-22 2021-04-27 武汉第二船舶设计研究所(中国船舶重工集团公司第七一九研究所) 一种可移动快速展开通道式车辆监测装置
CN115931937A (zh) * 2021-08-17 2023-04-07 同方威视技术股份有限公司 背散射检查设备
CN115789410B (zh) * 2021-09-09 2024-03-12 同方威视技术股份有限公司 支撑平台和辐射检查设备
CN115508392A (zh) * 2022-10-28 2022-12-23 同方威视技术股份有限公司 扫描成像设备和扫描成像方法
CN118011511A (zh) * 2022-10-28 2024-05-10 同方威视技术股份有限公司 具有检查区域的自主检查系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19532965C2 (de) * 1995-09-07 1998-07-16 Heimann Systems Gmbh & Co Röntgenprüfanlage für großvolumige Güter
TW201225921A (en) * 2010-12-22 2012-07-01 Ind Tech Res Inst Dynamometer
US8734013B2 (en) * 2011-04-05 2014-05-27 Satpal Singh Small mobile x-ray scanning system
CN205982133U (zh) * 2016-08-23 2017-02-22 中国电建集团核电工程公司 旋转调节式射线机支架
CN106371146A (zh) * 2016-11-25 2017-02-01 同方威视技术股份有限公司 检查系统
CN206399865U (zh) * 2016-12-29 2017-08-11 同方威视技术股份有限公司 可移动物品检查系统
CN107300721B (zh) * 2017-08-10 2023-12-15 苏州曼德克光电有限公司 一种基于射线的载货车辆三维成像检测系统
CN208283316U (zh) * 2018-05-09 2018-12-25 清华大学 安全检查系统
CN108732192A (zh) * 2018-05-09 2018-11-02 清华大学 安全检查系统

Also Published As

Publication number Publication date
CN108732192A (zh) 2018-11-02
WO2019214324A1 (zh) 2019-11-14

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