PL416867A1 - Powierzchniowe źródło światła bocznego - Google Patents
Powierzchniowe źródło światła bocznegoInfo
- Publication number
- PL416867A1 PL416867A1 PL416867A PL41686716A PL416867A1 PL 416867 A1 PL416867 A1 PL 416867A1 PL 416867 A PL416867 A PL 416867A PL 41686716 A PL41686716 A PL 41686716A PL 416867 A1 PL416867 A1 PL 416867A1
- Authority
- PL
- Poland
- Prior art keywords
- light source
- side lighting
- surface source
- slots
- holes
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Wynalazek dotyczy powierzchniowego źródła światła bocznego do oświetlania materiałów przezroczystych w zautomatyzowanych systemach wizyjnych, wykrywających defekty i oceniających parametry techniczne. Powierzchniowe źródło światła bocznego charakteryzuje się tym, że posiada płaskie, powierzchniowe źródło światła (5), nad którym umieszczono dwie przesłony (3 i 4) z otworami/szczelinami (3a i 4a) w taki sposób, aby otwory/szczeliny (3a i 4a) w przesłonach (3 i 4) nie pokrywały się ze sobą.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL416867A PL416867A1 (pl) | 2016-04-15 | 2016-04-15 | Powierzchniowe źródło światła bocznego |
| EP16460058.7A EP3232184A1 (en) | 2016-04-15 | 2016-08-29 | Surface source of side light |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PL416867A PL416867A1 (pl) | 2016-04-15 | 2016-04-15 | Powierzchniowe źródło światła bocznego |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| PL416867A1 true PL416867A1 (pl) | 2017-10-23 |
Family
ID=56979497
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PL416867A PL416867A1 (pl) | 2016-04-15 | 2016-04-15 | Powierzchniowe źródło światła bocznego |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP3232184A1 (pl) |
| PL (1) | PL416867A1 (pl) |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3814946A (en) | 1972-12-04 | 1974-06-04 | Asahi Glass Co Ltd | Method of detecting defects in transparent and semitransparent bodies |
| DE2909061A1 (de) * | 1979-03-08 | 1980-09-11 | Siemens Ag | Anordnung zum pruefen von bewegten gegenstaenden mittels einer fernsehkamera |
| DE3029678C2 (de) * | 1980-08-01 | 1984-03-22 | Siemens AG, 1000 Berlin und 8000 München | Anordnung zur optisch-elektronischen Ermittlung von Verunreinigungen im Bodenbereich von transparenten Behältern |
| JPS61207953A (ja) | 1985-03-12 | 1986-09-16 | Nec Corp | 自動外観検査装置 |
| DE3926349A1 (de) | 1989-08-09 | 1991-02-14 | Sick Optik Elektronik Erwin | Optische fehlerinspektionsvorrichtung |
| JP3128334B2 (ja) | 1992-07-14 | 2001-01-29 | 沖電気工業株式会社 | 半導体デバイス及びその製造方法 |
| DE102010021853B4 (de) * | 2010-05-28 | 2012-04-26 | Isra Vision Ag | Einrichtung und Verfahren zur optischen Überprüfung eines Gegenstands |
| DE102010043632B4 (de) * | 2010-11-09 | 2017-08-24 | Krones Aktiengesellschaft | Verfahren zur Funktionskontrolle einer Inspektionsvorrichtung und Vorrichtung zur Inspektion eines Produktsstroms |
| DE102012110793B4 (de) * | 2012-11-09 | 2020-09-03 | R.A.M. Realtime Application Measurement Gmbh | Vorrichtung und Verfahren zur Abbildung eines bahnförmigen Materials |
-
2016
- 2016-04-15 PL PL416867A patent/PL416867A1/pl unknown
- 2016-08-29 EP EP16460058.7A patent/EP3232184A1/en not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| EP3232184A1 (en) | 2017-10-18 |
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