PL3963320T3 - Nieniszczące wykrywanie nieprawidłowości powierzchniowych i przypowierzchniowych w metalowym produkcie - Google Patents

Nieniszczące wykrywanie nieprawidłowości powierzchniowych i przypowierzchniowych w metalowym produkcie

Info

Publication number
PL3963320T3
PL3963320T3 PL20716548.1T PL20716548T PL3963320T3 PL 3963320 T3 PL3963320 T3 PL 3963320T3 PL 20716548 T PL20716548 T PL 20716548T PL 3963320 T3 PL3963320 T3 PL 3963320T3
Authority
PL
Poland
Prior art keywords
metal product
destructive detection
subsurface
irregularities
subsurface irregularities
Prior art date
Application number
PL20716548.1T
Other languages
English (en)
Inventor
Matthew Brown
Peter Lawrence Crawforth
Bradley Peter Wynne
Hassan Ghadbeigi
Original Assignee
The University Of Sheffield
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The University Of Sheffield filed Critical The University Of Sheffield
Publication of PL3963320T3 publication Critical patent/PL3963320T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2073—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions using neutron detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20—Metals
    • G01N33/204—Structure thereof, e.g. crystal structure
    • G01N33/2045—Defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/1003—Different kinds of radiation or particles monochromatic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/20—Sources of radiation
    • G01N2223/204—Sources of radiation source created from radiated target
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G01N2223/6462—Specific applications or type of materials flaws, defects microdefects

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
PL20716548.1T 2019-04-30 2020-03-25 Nieniszczące wykrywanie nieprawidłowości powierzchniowych i przypowierzchniowych w metalowym produkcie PL3963320T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB1906037.5A GB201906037D0 (en) 2019-04-30 2019-04-30 Non-destructive detection of surface and near surface abnormalities in a metallic product
PCT/GB2020/050795 WO2020221986A1 (en) 2019-04-30 2020-03-25 Non-destructive detection of surface and near surface abnormalities in a metallic product

Publications (1)

Publication Number Publication Date
PL3963320T3 true PL3963320T3 (pl) 2025-02-10

Family

ID=66809100

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20716548.1T PL3963320T3 (pl) 2019-04-30 2020-03-25 Nieniszczące wykrywanie nieprawidłowości powierzchniowych i przypowierzchniowych w metalowym produkcie

Country Status (8)

Country Link
US (1) US11815477B2 (pl)
EP (1) EP3963320B1 (pl)
CA (1) CA3135684A1 (pl)
ES (1) ES2999543T3 (pl)
GB (1) GB201906037D0 (pl)
PL (1) PL3963320T3 (pl)
SG (1) SG11202111005VA (pl)
WO (1) WO2020221986A1 (pl)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5835220A (en) 1995-10-27 1998-11-10 Nkk Corporation Method and apparatus for detecting surface flaws
JPH11295241A (ja) 1998-04-10 1999-10-29 Nkk Corp 表面疵検査装置及びその方法
US7034931B2 (en) 2003-06-30 2006-04-25 United Technologies Corporation Method to grain inspect directionally solidified castings
WO2008007817A1 (en) 2006-07-12 2008-01-17 Postech Foundation A method of bright-field imaging using x-rays
EP2223089A1 (en) * 2007-12-14 2010-09-01 Ab Skf Method of determining fatigue life and remaining life
WO2014050609A1 (ja) 2012-09-28 2014-04-03 Ｊｘ日鉱日石エネルギー株式会社 不規則な凹凸表面を有する基板を検査する装置及びそれを用いた検査方法
US9939393B2 (en) 2015-09-28 2018-04-10 United Technologies Corporation Detection of crystallographic properties in aerospace components
JP6117398B1 (ja) * 2016-03-30 2017-04-19 日新製鋼株式会社 鋼板の表面欠陥検査装置および表面欠陥検査方法

Also Published As

Publication number Publication date
WO2020221986A1 (en) 2020-11-05
EP3963320B1 (en) 2024-10-30
US20220205934A1 (en) 2022-06-30
EP3963320A1 (en) 2022-03-09
ES2999543T3 (en) 2025-02-26
GB201906037D0 (en) 2019-06-12
US11815477B2 (en) 2023-11-14
SG11202111005VA (en) 2021-10-28
CA3135684A1 (en) 2020-11-05

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