PL3935441T3 - Kolimator - Google Patents

Kolimator

Info

Publication number
PL3935441T3
PL3935441T3 PL20714118.5T PL20714118T PL3935441T3 PL 3935441 T3 PL3935441 T3 PL 3935441T3 PL 20714118 T PL20714118 T PL 20714118T PL 3935441 T3 PL3935441 T3 PL 3935441T3
Authority
PL
Poland
Prior art keywords
collimator
Prior art date
Application number
PL20714118.5T
Other languages
English (en)
Inventor
Michael Konrad
Claus Urban
Original Assignee
Konrad Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Konrad Gmbh filed Critical Konrad Gmbh
Publication of PL3935441T3 publication Critical patent/PL3935441T3/pl

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/30—Collimators
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/32—Fiducial marks and measuring scales within the optical system
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/32—Fiducial marks and measuring scales within the optical system
    • G02B27/34—Fiducial marks and measuring scales within the optical system illuminated
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/32—Fiducial marks and measuring scales within the optical system
    • G02B27/36—Fiducial marks and measuring scales within the optical system adjustable
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/695—Control of camera direction for changing a field of view, e.g. pan, tilt or based on tracking of objects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • Geometry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Studio Devices (AREA)
PL20714118.5T 2019-03-06 2020-03-05 Kolimator PL3935441T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102019105622.5A DE102019105622B4 (de) 2019-03-06 2019-03-06 Kollimator und Verfahren zum Testen einer Kamera
PCT/EP2020/055795 WO2020178366A1 (de) 2019-03-06 2020-03-05 Kollimator

Publications (1)

Publication Number Publication Date
PL3935441T3 true PL3935441T3 (pl) 2024-04-08

Family

ID=70005577

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20714118.5T PL3935441T3 (pl) 2019-03-06 2020-03-05 Kolimator

Country Status (8)

Country Link
US (1) US12066638B2 (pl)
EP (1) EP3935441B1 (pl)
CN (1) CN113614617A (pl)
DE (1) DE102019105622B4 (pl)
ES (1) ES2964684T3 (pl)
HU (1) HUE064256T2 (pl)
PL (1) PL3935441T3 (pl)
WO (1) WO2020178366A1 (pl)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114205576A (zh) * 2020-09-02 2022-03-18 晋城三赢精密电子有限公司 摄像头检测装置
DE102022204539A1 (de) 2021-05-20 2022-11-24 Magna Electronics Europe Gmbh & Co. Ohg Verfahren zum Justieren einer Kamera
CN215811551U (zh) * 2021-09-06 2022-02-11 茂莱（南京）仪器有限公司 一种测量光学系统mtf的装置

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1442015A (en) * 1919-07-08 1923-01-09 American Optical Corp Gun sight
GB1569256A (en) * 1975-11-14 1980-06-11 Sira Institute Optical apparatus and method
US4199220A (en) * 1978-09-12 1980-04-22 Casagrande John T Lens system with reticle and diffuser glass
JPS57172221A (en) * 1981-04-16 1982-10-23 Ricoh Co Ltd Mtf measuring device for image sensor
GB2193817B (en) * 1986-08-07 1990-01-10 Leech Collimator device
JPH0626375U (ja) 1992-08-27 1994-04-08 日本ビクター株式会社 ビデオカメラ用コリメータ
DE19823844C1 (de) 1998-03-27 1999-10-14 Leica Camera Ag Linsen-Prüfgerät
WO1999050636A1 (de) 1998-03-27 1999-10-07 Leica Camera Ag Linsen-prüfgerät
US6366349B1 (en) * 1998-05-18 2002-04-02 Lasermax, Inc. Apparatus for aligning optical elements in response to the display of a reflected reticle image and method of aligning
US6025908A (en) * 1998-05-18 2000-02-15 Houde-Walter; William R. Alignment of optical elements in telescopes using a laser beam with a holographic projection reticle
GB0014365D0 (en) 2000-06-14 2000-08-02 Digilens Inc Alignment of holographic diffraction elements
DE102004020881B4 (de) 2004-04-26 2007-03-08 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zum geometrischen Kalibrieren von optoelektronischen Messbildkameras
DE102004056723B4 (de) 2004-11-19 2007-04-05 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung zur geometrischen Kalibrierung eines optoelektronischen Sensorsystems
CN100378436C (zh) * 2004-12-03 2008-04-02 中国地震局第二监测中心 数字水准仪和光学水准仪室内检定装置
BE1016981A3 (fr) * 2006-02-08 2007-11-06 Fn Herstal Sa Viseur ameliore a pont rouge mobile.
DE102007003681B4 (de) 2006-02-10 2017-11-30 Hochschule Bremen Verfahren und Vorrichtung zur Analyse einer optischen Einrichtung
US8675077B2 (en) * 2008-07-23 2014-03-18 Flir Systems, Inc. Alignment metrology and resolution measurement system for imaging arrays
CN201903291U (zh) * 2010-12-06 2011-07-20 西安北方光电有限公司 便携式激光三轴测试仪
CN202393958U (zh) * 2011-05-16 2012-08-22 于书奎 新型平行光管
DE102012200152A1 (de) * 2012-01-05 2013-07-11 Robert Bosch Gmbh Vorrichtung und Verfahren zum Vermessen einer Kamera
KR101481085B1 (ko) * 2013-05-16 2015-01-14 (주) 루리텍 카메라의 성능 평가 장치
DE102013212097A1 (de) 2013-06-25 2015-01-08 Cassidian Optronics Gmbh Kollimatorvorrichtung und Verfahren zur Prüfung und Justierung wenigstens eines optischen Geräts
US9535257B2 (en) * 2014-03-27 2017-01-03 Goodrich Corporation Multiple collimator unit
DE102014209040B4 (de) 2014-05-13 2019-02-14 Carl Mahr Holding Gmbh Verfahren zur Kalibrierung eines Messgerätes
JP6512673B2 (ja) * 2015-03-27 2019-05-15 オリンパス株式会社 偏心測定装置及び偏心測定方法
EP3076148B1 (de) * 2015-03-31 2019-05-08 Trioptics GmbH Vorrichtung und verfahren zum messen von abbildungseigenschaften eines optischen abbildungssystems
EP3166312B1 (de) * 2015-11-06 2020-12-30 Trioptics GmbH Vorrichtung und verfahren zum justieren und/oder kalibrieren eines multi-kamera moduls sowie verwendung einer solchen vorrichtung
JP6561327B2 (ja) * 2016-03-10 2019-08-21 パナソニックＩｐマネジメント株式会社 光学検査装置、鏡筒の製造方法、および光学検査方法
CN106768872B (zh) * 2016-11-17 2019-08-30 孝感华中精密仪器有限公司 一种自动焦距测量仪
CN107346050A (zh) * 2017-07-31 2017-11-14 美国通用光电公司 一种紧凑型光学延迟器
JP7043055B2 (ja) * 2017-10-26 2022-03-29 株式会社カツラ・オプト・システムズ 検査カメラモジュールの調整装置及びその調整方法
CN108278923A (zh) * 2018-01-29 2018-07-13 陕西远航光电有限责任公司 一种校靶镜（或准直仪）的高同轴度接口装置
US11874453B2 (en) * 2018-12-12 2024-01-16 Genemind Biosciences Company Limited Optical system, method for calibrating optical system, and sequencing system
WO2020148574A1 (en) * 2019-01-20 2020-07-23 Lumus Ltd. Optical device testing method and apparatus

Also Published As

Publication number Publication date
US12066638B2 (en) 2024-08-20
WO2020178366A1 (de) 2020-09-10
CN113614617A (zh) 2021-11-05
EP3935441B1 (de) 2023-08-23
EP3935441A1 (de) 2022-01-12
HUE064256T2 (hu) 2024-03-28
EP3935441C0 (de) 2023-08-23
ES2964684T3 (es) 2024-04-09
DE102019105622A1 (de) 2020-09-10
US20220137425A1 (en) 2022-05-05
DE102019105622B4 (de) 2022-03-17

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