PL368785A1 - Obrazujący filtr energii dla elektronów i innych elektrycznie naładowanych cząstek oraz sposób filtrowania energii elektronów i innych elektrycznie naładowanych cząstek w urządzeniach elektrooptycznych za pomocą obrazującego filtru energii - Google Patents
Obrazujący filtr energii dla elektronów i innych elektrycznie naładowanych cząstek oraz sposób filtrowania energii elektronów i innych elektrycznie naładowanych cząstek w urządzeniach elektrooptycznych za pomocą obrazującego filtru energiiInfo
- Publication number
- PL368785A1 PL368785A1 PL368785A PL36878504A PL368785A1 PL 368785 A1 PL368785 A1 PL 368785A1 PL 368785 A PL368785 A PL 368785A PL 36878504 A PL36878504 A PL 36878504A PL 368785 A1 PL368785 A1 PL 368785A1
- Authority
- PL
- Poland
- Prior art keywords
- imaging
- filter
- energy
- electrons
- electro
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
- H01J37/05—Electron or ion-optical arrangements for separating electrons or ions according to their energy or mass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
- H01J49/46—Static spectrometers
- H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter
- H01J49/484—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter with spherical mirrors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/15—Means for deflecting or directing discharge
- H01J2237/151—Electrostatic means
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PL368785A PL368785A1 (pl) | 2004-06-28 | 2004-06-28 | Obrazujący filtr energii dla elektronów i innych elektrycznie naładowanych cząstek oraz sposób filtrowania energii elektronów i innych elektrycznie naładowanych cząstek w urządzeniach elektrooptycznych za pomocą obrazującego filtru energii |
DE102005031537A DE102005031537B4 (de) | 2004-06-28 | 2005-06-27 | Abbildender Energiefilter für geladene Teilchen, insbesondere Elektronen |
US11/168,728 US7126117B2 (en) | 2004-06-28 | 2005-06-28 | Imaging energy filter for electrons and other electrically charged particles and method for energy filtration of the electrons and other electrically charged particles with the imaging energy filter in electro-optical devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PL368785A PL368785A1 (pl) | 2004-06-28 | 2004-06-28 | Obrazujący filtr energii dla elektronów i innych elektrycznie naładowanych cząstek oraz sposób filtrowania energii elektronów i innych elektrycznie naładowanych cząstek w urządzeniach elektrooptycznych za pomocą obrazującego filtru energii |
Publications (1)
Publication Number | Publication Date |
---|---|
PL368785A1 true PL368785A1 (pl) | 2006-01-09 |
Family
ID=35504596
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL368785A PL368785A1 (pl) | 2004-06-28 | 2004-06-28 | Obrazujący filtr energii dla elektronów i innych elektrycznie naładowanych cząstek oraz sposób filtrowania energii elektronów i innych elektrycznie naładowanych cząstek w urządzeniach elektrooptycznych za pomocą obrazującego filtru energii |
Country Status (3)
Country | Link |
---|---|
US (1) | US7126117B2 (pl) |
DE (1) | DE102005031537B4 (pl) |
PL (1) | PL368785A1 (pl) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007024353B4 (de) * | 2007-05-24 | 2009-04-16 | Ceos Corrected Electron Optical Systems Gmbh | Monochromator und Strahlquelle mit Monochromator |
FR2957674B1 (fr) * | 2010-03-19 | 2012-06-08 | Commissariat Energie Atomique | Procede de caracterisation d'un echantillon cristallin par diffusion d'ions ou atomes |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0185789B1 (de) * | 1984-12-22 | 1991-03-06 | Vg Instruments Group Limited | Analysator für geladene Teilchen |
JPH02201857A (ja) * | 1989-01-30 | 1990-08-10 | Shimadzu Corp | 球面型荷電粒子アナライザ |
GB2244369A (en) * | 1990-05-22 | 1991-11-27 | Kratos Analytical Ltd | Charged particle energy analysers |
EP0470299B1 (en) * | 1990-08-08 | 1996-06-26 | Koninklijke Philips Electronics N.V. | Energy filter for charged particle beam apparatus |
DE69529987T2 (de) * | 1994-07-15 | 2004-01-15 | Hitachi Ltd | Elektronischer energiefilter |
DE19633496B4 (de) * | 1996-08-20 | 2006-06-08 | Ceos Corrected Electron Optical Systems Gmbh | Monchromator für die Elektronenoptik, insbesondere Elketronenmikroskopie |
FR2753303B1 (fr) * | 1996-09-12 | 1998-12-04 | Centre Nat Rech Scient | Filtre d'energie, microscope electronique a transmission et procede de filtrage d'energie associe |
PL338538A1 (en) * | 2000-02-20 | 2001-08-27 | Krzysztof Grzelakowski | Emission-type electron microscope |
-
2004
- 2004-06-28 PL PL368785A patent/PL368785A1/pl unknown
-
2005
- 2005-06-27 DE DE102005031537A patent/DE102005031537B4/de not_active Expired - Fee Related
- 2005-06-28 US US11/168,728 patent/US7126117B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE102005031537B4 (de) | 2007-10-11 |
US20050285032A1 (en) | 2005-12-29 |
DE102005031537A1 (de) | 2006-01-19 |
US7126117B2 (en) | 2006-10-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2409180B (en) | High conductivity particle filter | |
TWI350219B (en) | Copper fine particles and method for preparing the same | |
EP1811553A4 (en) | APPARATUS AND METHOD FOR DEPOSITING FINE PARTICLES | |
HK1123526A1 (en) | Copper fine particle dispersion liquid and method for producing same | |
EP2037518A4 (en) | CARBON PARTICLE COATED WITH FINE PARTICLES, PROCESS FOR PRODUCING THE SAME, AND ELECTRODE FOR FUEL CELL | |
EP1702375A4 (en) | CARBON COATED SILICON PARTICULATE POWDER AS ANODE FOR LITHIUM ION BATTERIES AND PROCESS FOR PRODUCING THE SAME | |
HK1105453A1 (en) | Pathogen and particle detector system and method | |
GB0511386D0 (en) | Method for introducing ions into an ion trap and an ion storage apparatus | |
EP1643232A4 (en) | METHOD FOR PREPARING THIN PIECES SPECIMENS AND COMPOSITE CHARGED PARTICLE BEAM DEVICE | |
EP1720636A4 (en) | SCODAPHORESIS, METHODS AND APPARATUS FOR DISPLACING AND CONCENTRATING PARTICLES | |
HUE056248T2 (hu) | Eljárás részecskék manipulálására vezetõ oldatokban | |
IL206034A0 (en) | Ion filter for use in a spectrometer and a spectrometer using such a filter | |
GB2427069B (en) | Method and apparatus for ion fragmentation by electron capture | |
GB0700754D0 (en) | Charged particle analyser and method | |
IL164254A0 (en) | Paramagnetic particles that provide improved relaxivity | |
ZA200704720B (en) | Solar energy collection apparatus and method | |
EP1791570A4 (en) | SUPERPARAMAGNETIC GADOLINIUM OXIDE NANOPARTICLES AND COMPOSITIONS COMPRISING SUCH PARTICULATES | |
GB0303305D0 (en) | Apparatus for collecting particles | |
EP1789365A4 (en) | METHOD AND DEVICE FOR PRODUCING FINE CARBON PARTICLES | |
SG115694A1 (en) | Apparatus and method for removal of surface oxides via fluxless technique involving electron attachment and remote ion generation | |
AU2003283349A8 (en) | Energy filter image generator for electrically charged particles and the use thereof | |
PL368785A1 (pl) | Obrazujący filtr energii dla elektronów i innych elektrycznie naładowanych cząstek oraz sposób filtrowania energii elektronów i innych elektrycznie naładowanych cząstek w urządzeniach elektrooptycznych za pomocą obrazującego filtru energii | |
EP1751801A4 (en) | METHOD AND PROCESS INTERVAL FOR PROTECTION AGAINST ELECTROSTATIC DISCHARGES IN FLAT PANEL IMAGING DETECTORS | |
GB0427686D0 (en) | Method for detection and imaging of synchronous spin and charged particle motion | |
IL178900A0 (en) | Method and apparatus for airborne particle collection |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
DISC | Decisions on discontinuance of the proceedings (taken after the publication of the particulars of the applications) |