PL3445537T3 - Pomiar optyczny zakrętki zamykającej - Google Patents

Pomiar optyczny zakrętki zamykającej

Info

Publication number
PL3445537T3
PL3445537T3 PL17723759T PL17723759T PL3445537T3 PL 3445537 T3 PL3445537 T3 PL 3445537T3 PL 17723759 T PL17723759 T PL 17723759T PL 17723759 T PL17723759 T PL 17723759T PL 3445537 T3 PL3445537 T3 PL 3445537T3
Authority
PL
Poland
Prior art keywords
sealing cover
optical measurement
measurement
optical
sealing
Prior art date
Application number
PL17723759T
Other languages
English (en)
Inventor
Sebastian Hargens
Original Assignee
Silgan Holdings Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Silgan Holdings Inc. filed Critical Silgan Holdings Inc.
Publication of PL3445537T3 publication Critical patent/PL3445537T3/pl

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Program-controlled manipulators
    • B25J9/16—Program controls
    • B25J9/1679—Program controls characterised by the tasks executed
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Program-controlled manipulators
    • B25J9/16—Program controls
    • B25J9/1694—Program controls characterised by use of sensors other than normal servo-feedback from position, speed or acceleration sensors, perception control, multi-sensor controlled systems, sensor fusion
    • B25J9/1697—Vision controlled systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32179—Quality control, monitor production tool with multiple sensors
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32183—Test cell
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32197—Inspection at different locations, stages of manufacturing
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/39—Robotics, robotics to robotics hand
    • G05B2219/39107—Pick up article, object, measure, test it during motion path, place it
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Robotics (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Manipulator (AREA)
PL17723759T 2016-04-19 2017-04-19 Pomiar optyczny zakrętki zamykającej PL3445537T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102016004713.5A DE102016004713A1 (de) 2016-04-19 2016-04-19 Vorrichtung und Verfahren zur optischen Vermessung eines Objekts
PCT/IB2017/052256 WO2017182968A1 (de) 2016-04-19 2017-04-19 Optische vermessung eines verschlussdeckels
EP17723759.1A EP3445537B1 (de) 2016-04-19 2017-04-19 Optische vermessung eines verschlussdeckels

Publications (1)

Publication Number Publication Date
PL3445537T3 true PL3445537T3 (pl) 2020-11-30

Family

ID=58709507

Family Applications (1)

Application Number Title Priority Date Filing Date
PL17723759T PL3445537T3 (pl) 2016-04-19 2017-04-19 Pomiar optyczny zakrętki zamykającej

Country Status (7)

Country Link
EP (1) EP3445537B1 (pl)
CN (1) CN109153119A (pl)
DE (1) DE102016004713A1 (pl)
LT (1) LT3445537T (pl)
PL (1) PL3445537T3 (pl)
RU (1) RU2754071C2 (pl)
WO (1) WO2017182968A1 (pl)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102017219407A1 (de) * 2017-10-27 2019-05-02 Robert Bosch Gmbh Erfassungsvorrichtung
DE102018209365A1 (de) * 2018-06-12 2019-12-12 Henkel Ag & Co. Kgaa Verfahren zur Qualitätskontrolle eines Verschlusses einer Wasch- und Spülmittelflasche
CN117283594A (zh) * 2022-06-17 2023-12-26 宝山钢铁股份有限公司 鱼雷罐保温盖和罐口中心定位方法
DE102024000103B3 (de) * 2024-01-13 2025-05-08 Manfred Sommer Vorrichtung und Verfahren zum Vermessen eines Doppelfalzes einer Dose

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE50011253D1 (de) * 1999-04-19 2006-02-09 Fraunhofer Ges Forschung Bildbearbeitung zur vorbereitung einer texturanalyse
EP1319164B2 (de) * 2000-09-22 2014-01-01 Werth Messtechnik GmbH Verfahren zum messen einer objektgeometrie mittels eines koordinationsmessgerätes
DE20017739U1 (de) * 2000-10-16 2001-01-11 Mycrona Gesellschaft für innovative Messtechnik mbH, 66793 Saarwellingen Vorrichtungen zur optischen Vermessung eines Objektes, mit einem Koordinatenmeßgerät mit Kamera
WO2005008737A2 (en) * 2003-07-14 2005-01-27 August Technology Corporation Inspection and metrology module cluster tool with multi-tool manager
DE102006016677A1 (de) * 2006-04-08 2007-10-11 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zur Vermessung geometrischer Merkmale von Objekten mit einem robotergeführten Lasersensor
DE102008019435B4 (de) 2008-04-17 2012-06-06 Aicon Metrology Gmbh Verfahren zum berührungslosen Vermessen dreidimensionaler, komplex geformter Bauteile
CN102019565B (zh) * 2009-09-21 2015-10-14 Abb技术有限公司 用于制造部件的质量控制系统和方法
CN102192911B (zh) * 2010-03-17 2014-04-23 中国科学院自动化研究所 一种基于机器视觉的金属瓶盖质量检测系统
CN102136061B (zh) * 2011-03-09 2013-05-08 中国人民解放军海军航空工程学院 一种矩形石英晶片缺陷自动检测分类识别方法

Also Published As

Publication number Publication date
RU2754071C2 (ru) 2021-08-25
WO2017182968A1 (de) 2017-10-26
EP3445537A1 (de) 2019-02-27
EP3445537B1 (de) 2020-06-17
RU2018132533A (ru) 2020-05-19
LT3445537T (lt) 2020-10-12
CN109153119A (zh) 2019-01-04
DE102016004713A1 (de) 2017-10-19
RU2018132533A3 (pl) 2020-08-04

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