PL3270102T3 - Sposób badania kształtu, urządzenie do badania kształtu oraz program - Google Patents

Sposób badania kształtu, urządzenie do badania kształtu oraz program

Info

Publication number
PL3270102T3
PL3270102T3 PL16792779T PL16792779T PL3270102T3 PL 3270102 T3 PL3270102 T3 PL 3270102T3 PL 16792779 T PL16792779 T PL 16792779T PL 16792779 T PL16792779 T PL 16792779T PL 3270102 T3 PL3270102 T3 PL 3270102T3
Authority
PL
Poland
Prior art keywords
shape inspection
program
inspection device
inspection method
shape
Prior art date
Application number
PL16792779T
Other languages
English (en)
Inventor
Atsuhiro HIBI
Yusuke Konno
Nobuhiro FURUYA
Tomohiro KUROIWA
Original Assignee
Nippon Steel Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corporation filed Critical Nippon Steel Corporation
Publication of PL3270102T3 publication Critical patent/PL3270102T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T11/00—2D [Two Dimensional] image generation
    • G06T11/003—Reconstruction from projections, e.g. tomography
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
PL16792779T 2015-05-13 2016-05-13 Sposób badania kształtu, urządzenie do badania kształtu oraz program PL3270102T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2015098031 2015-05-13
EP16792779.7A EP3270102B1 (en) 2015-05-13 2016-05-13 Shape inspection method, shape inspection device, and program
PCT/JP2016/064266 WO2016182055A1 (ja) 2015-05-13 2016-05-13 形状検査方法、形状検査装置及びプログラム

Publications (1)

Publication Number Publication Date
PL3270102T3 true PL3270102T3 (pl) 2020-01-31

Family

ID=57249161

Family Applications (1)

Application Number Title Priority Date Filing Date
PL16792779T PL3270102T3 (pl) 2015-05-13 2016-05-13 Sposób badania kształtu, urządzenie do badania kształtu oraz program

Country Status (10)

Country Link
US (1) US10274314B2 (pl)
EP (1) EP3270102B1 (pl)
JP (1) JP6451839B2 (pl)
KR (1) KR101966580B1 (pl)
CN (1) CN107532887B (pl)
BR (1) BR112017022247B1 (pl)
CA (1) CA2983577C (pl)
ES (1) ES2750856T3 (pl)
PL (1) PL3270102T3 (pl)
WO (1) WO2016182055A1 (pl)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6968568B2 (ja) * 2017-04-20 2021-11-17 株式会社日立製作所 形状計測システム、及び、形状計測方法
CN109990979B (zh) * 2019-04-11 2021-12-03 业成科技（成都）有限公司 检测治具及检测系统
US11555694B2 (en) * 2020-07-17 2023-01-17 Systemes Pavemetrics Inc. Method and system for controlling a laser profiler
CN113281341A (zh) * 2021-04-19 2021-08-20 唐山学院 热镀锌带钢的双传感器表面质量检测系统的检测优化方法
CN114485483B (zh) * 2022-04-15 2022-06-24 中国空气动力研究与发展中心低速空气动力研究所 一种基于多相机组合成像的冰形在线测量方法及装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4234701A (en) 1977-10-06 1980-11-18 General Electric Company Compositions comprising copolymers of a vinyl aromatic compound and an unsaturated cyclic anhydride and impact improvers
JPH0797020B2 (ja) 1987-09-19 1995-10-18 株式会社豊田中央研究所 座標測定装置
US4961155A (en) * 1987-09-19 1990-10-02 Kabushiki Kaisha Toyota Chuo Kenkyusho XYZ coordinates measuring system
JP3243385B2 (ja) 1994-11-28 2002-01-07 株式会社豊田中央研究所 物体の形状検査装置
US5671056A (en) * 1995-05-11 1997-09-23 Technology Research Association Of Medical & Welfare Apparatus Three-dimensional form measuring apparatus and method
JPH08327338A (ja) 1995-06-02 1996-12-13 Technol Res Assoc Of Medical & Welfare Apparatus ３次元形状測定装置
JPH11125508A (ja) 1997-10-21 1999-05-11 Toyota Central Res & Dev Lab Inc 断面形状測定方法
US7207251B2 (en) * 1999-02-05 2007-04-24 Hitachi Koki Co., Ltd. Cutter with laser generator that irradiates cutting position on workpiece to facilitate alignment of blade with cutting position
US7321394B1 (en) * 2000-09-29 2008-01-22 Lucid, Inc. Automatic gain control for a confocal imaging system
JP4388318B2 (ja) * 2003-06-27 2009-12-24 オリンパス株式会社 画像処理装置
US7652275B2 (en) * 2006-07-28 2010-01-26 Mitutoyo Corporation Non-contact probe control interface
JP5488953B2 (ja) 2008-09-17 2014-05-14 新日鐵住金株式会社 凹凸疵検査方法及び装置
EP2634530B1 (en) * 2010-10-27 2022-05-04 Nikon Corporation Shape measuring device, shape measuring method, and structure manufacturing method
JP2013213733A (ja) * 2012-04-02 2013-10-17 Suzuki Motor Corp 検査対象物の検査装置およびその検査方法

Also Published As

Publication number Publication date
US10274314B2 (en) 2019-04-30
JPWO2016182055A1 (ja) 2018-02-01
BR112017022247A2 (pt) 2018-07-10
CN107532887B (zh) 2020-01-14
KR101966580B1 (ko) 2019-04-05
KR20170132872A (ko) 2017-12-04
CA2983577A1 (en) 2016-11-17
JP6451839B2 (ja) 2019-01-16
BR112017022247B1 (pt) 2022-12-06
EP3270102B1 (en) 2019-08-21
EP3270102A1 (en) 2018-01-17
ES2750856T3 (es) 2020-03-27
WO2016182055A1 (ja) 2016-11-17
US20180143009A1 (en) 2018-05-24
CA2983577C (en) 2019-09-24
EP3270102A4 (en) 2018-08-22
CN107532887A (zh) 2018-01-02

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