PL2932282T3 - Układ obwodów i sposób wytwarzania napięcia probierczego oraz urządzenie probiercze do wyznaczania współczynnika strat, które zawiera ten układ obwodów - Google Patents

Układ obwodów i sposób wytwarzania napięcia probierczego oraz urządzenie probiercze do wyznaczania współczynnika strat, które zawiera ten układ obwodów

Info

Publication number
PL2932282T3
PL2932282T3 PL13814039T PL13814039T PL2932282T3 PL 2932282 T3 PL2932282 T3 PL 2932282T3 PL 13814039 T PL13814039 T PL 13814039T PL 13814039 T PL13814039 T PL 13814039T PL 2932282 T3 PL2932282 T3 PL 2932282T3
Authority
PL
Poland
Prior art keywords
testing device
circuit assembly
producing
determining
test voltage
Prior art date
Application number
PL13814039T
Other languages
English (en)
Inventor
Rudolf Blank
Michael Furxer
Stefan Baldauf
Original Assignee
B2 Electronics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=49883051&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=PL2932282(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by B2 Electronics Gmbh filed Critical B2 Electronics Gmbh
Publication of PL2932282T3 publication Critical patent/PL2932282T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
    • G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/0067—Converter structures employing plural converter units, other than for parallel operation of the units on a single load
    • H02M1/007—Plural converter units in cascade
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/0067—Converter structures employing plural converter units, other than for parallel operation of the units on a single load
    • H02M1/0077—Plural converter units whose outputs are connected in series
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/08—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters
    • H02M1/088—Circuits specially adapted for the generation of control voltages for semiconductor devices incorporated in static converters for the simultaneous control of series or parallel connected semiconductor devices
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of dc power input into dc power output
    • H02M3/22—Conversion of dc power input into dc power output with intermediate conversion into ac
    • H02M3/24—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters
    • H02M3/28—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac
    • H02M3/325—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal
    • H02M3/335—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only
    • H02M3/33561—Conversion of dc power input into dc power output with intermediate conversion into ac by static converters using discharge tubes with control electrode or semiconductor devices with control electrode to produce the intermediate ac using devices of a triode or a transistor type requiring continuous application of a control signal using semiconductor devices only having more than one ouput with independent control

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
PL13814039T 2012-12-17 2013-12-13 Układ obwodów i sposób wytwarzania napięcia probierczego oraz urządzenie probiercze do wyznaczania współczynnika strat, które zawiera ten układ obwodów PL2932282T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102012024560.2A DE102012024560B3 (de) 2012-12-17 2012-12-17 Schaltungsanordnung und Verfahren zur Erzeugung einer Prüfspannung und Prüfgerät zur Ermittlung eines Verlustfaktors, welches die Schaltungsanordnung enthält
EP13814039.7A EP2932282B1 (de) 2012-12-17 2013-12-13 Schaltungsanordnung und verfahren zur erzeugung einer prüfspannung und prüfgerät zur ermittlung eines verlustfaktors, welches die schaltungsanordnung enthält
PCT/EP2013/003762 WO2014095009A1 (de) 2012-12-17 2013-12-13 Schaltungsanordnung und verfahren zur erzeugung einer prüfspannung und prüfgerät zur ermittlung eines verlustfaktors, welches die schaltungsanordnung enthält

Publications (1)

Publication Number Publication Date
PL2932282T3 true PL2932282T3 (pl) 2020-07-13

Family

ID=49883051

Family Applications (1)

Application Number Title Priority Date Filing Date
PL13814039T PL2932282T3 (pl) 2012-12-17 2013-12-13 Układ obwodów i sposób wytwarzania napięcia probierczego oraz urządzenie probiercze do wyznaczania współczynnika strat, które zawiera ten układ obwodów

Country Status (6)

Country Link
US (1) US9778304B2 (pl)
EP (1) EP2932282B1 (pl)
DE (1) DE102012024560B3 (pl)
ES (1) ES2778030T3 (pl)
PL (1) PL2932282T3 (pl)
WO (1) WO2014095009A1 (pl)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013008611A1 (de) * 2013-05-22 2014-11-27 B2 Electronic Gmbh Hochleistungs-Hochspannungsprüfgerät
DE102015202597B4 (de) 2015-02-12 2017-09-21 Hagenuk KMT Kabelmeßtechnik GmbH Schaltungsanordnung zur Kabelprüfung, Kabeltestung, Kabeldiagnose und/oder Kabelfehlerortung und Gerät mit einer derartigen Schaltungsanordnung
CN104698356B (zh) * 2015-03-31 2018-07-31 广东威恒输变电工程有限公司 一种gis终端试验装置用的试验套管
CN105353283A (zh) * 2015-11-30 2016-02-24 中国南方电网有限责任公司超高压输电公司检修试验中心 一种500kV GIL设备的交流耐压试验方法
CN105954545B (zh) * 2016-05-30 2018-03-02 国网河北省电力公司电力科学研究院 一种变压器介损试验接线装置
CN110909497B (zh) * 2019-11-14 2022-07-15 国网安徽省电力有限公司电力科学研究院 一种高压开关设备在冲击电压下的暂态电场计算方法
CN111830322B (zh) * 2020-05-28 2022-12-16 江苏省送变电有限公司 一种gil导体电联结状态评价装置
CN112600425B (zh) * 2020-12-02 2022-03-18 南京民联仪器制造有限公司 一种小电流可控整流器及其控制整流方法
DE102023106958A1 (de) 2023-03-20 2024-09-26 B2 Electronics Gmbh Prüfgerät und Verfahren zur Prüfung eines Hoch- oder Mittelspannungskabels

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60219965A (ja) * 1984-04-13 1985-11-02 Fuji Electric Co Ltd 超低周波交流高電圧発生装置
JPS6365383A (ja) * 1986-09-08 1988-03-23 Hitoshi Terase 高電圧発生装置
DE3737373C2 (de) * 1987-03-28 1996-02-22 Baur Pruef Und Mestechnik Kg Verfahren zur Isolationsprüfung von verlegten Kabeln und zur Ortung von Kabelfehlern sowie Vorrichtung zur Durchführung des Verfahrens
DE19513441C5 (de) * 1995-04-13 2008-07-31 BAUR Prüf-und Messtechnik GmbH Schaltungsanordnung zur Erzeugung einer Prüfspannung für die Prüfung elektrischer Betriebsmittel
DE19519744A1 (de) * 1995-05-30 1996-12-05 Daetwyler Ag Verfahren und Vorrichtung zum Bestimmen von Isolationseigenschaften von Prüfobjekten
US7405494B2 (en) * 2004-07-07 2008-07-29 Eaton Corporation AC power supply apparatus, methods and computer program products using PWM synchronization
CN101919150B (zh) * 2007-09-18 2013-12-18 菲莱贝克能源公司 从局部能源产生具有低谐波畸变的交流功率的电流波形结构
US7855933B2 (en) * 2008-01-08 2010-12-21 Hynix Semiconductor Inc. Clock synchronization circuit and operation method thereof
DE102015202597B4 (de) * 2015-02-12 2017-09-21 Hagenuk KMT Kabelmeßtechnik GmbH Schaltungsanordnung zur Kabelprüfung, Kabeltestung, Kabeldiagnose und/oder Kabelfehlerortung und Gerät mit einer derartigen Schaltungsanordnung

Also Published As

Publication number Publication date
DE102012024560B3 (de) 2014-03-27
WO2014095009A1 (de) 2014-06-26
US9778304B2 (en) 2017-10-03
EP2932282A1 (de) 2015-10-21
US20150316596A1 (en) 2015-11-05
EP2932282B1 (de) 2020-01-15
ES2778030T3 (es) 2020-08-07

Similar Documents

Publication Publication Date Title
PL2932282T3 (pl) Układ obwodów i sposób wytwarzania napięcia probierczego oraz urządzenie probiercze do wyznaczania współczynnika strat, które zawiera ten układ obwodów
TWI563275B (en) Automated test equipment and testing methods
HK1220770A1 (zh) 測試裝置的校準方法
PL2676606T3 (pl) Szybko testujące urządzenie i sposób
PL2994736T3 (pl) Układ badania szczelności i sposób badania szczelności
SG11201510024VA (en) A probe card assembly for testing electronic devices
EP2817617A4 (en) DEVICES, METHODS AND TEST KITS FOR ELECTRONIC ANALYTE ASSAY
GB201217046D0 (en) Device, arrangement and method for verifying the operation of electrity meter
SG11201406561XA (en) Test probe assembly and related methods
HK1214360A1 (zh) 用於電化學分析的檢測裝置
PL2865628T3 (pl) Test kontrolny dla wind bez stosowania dodatkowych obciążników
PL2815245T3 (pl) Obwód do wytwarzania napięcia probierczego, w szczególności w celu sprawdzania izolacyjności ułożonych kabli elektroenergetycznych
HK1202927A1 (en) Test system and method for testing high-voltage technology devices
HK1221503A1 (zh) 分析測試儀
AU347210S (en) Analyte test meter
PL2678654T3 (pl) Sposób kontroli działania maszyn wirnikowych oraz urządzenie kontrolne w tym celu
HK1212735A1 (zh) 用於評估免疫組庫的方法
EP2938417A4 (en) DOUBLE DOUBLE FILTER INTEGRITY inspection system
HK1202621A1 (en) Analyte meter for test strips
HK1215730A1 (zh) 樣品測試裝置
GB201309302D0 (en) Method and test enviroment for testing an integrated circuit
EP2802869A4 (en) OBJEKTTRÄGER FOR IMMUNOASSAY
EP2992419A4 (en) PROGRAM TESTING SERVICE
IL243045B (en) A method for developing and testing a device connectivity driver
GB201200494D0 (en) Vehicle test and diagnostics arrangement and method (fusebox)