PL2067025T3 - Sposób i urządzenie do kontrolowania na bieżąco złącz spajanych przy użyciu promieniowania rentgenowskiego oraz analizy wartości szarości - Google Patents
Sposób i urządzenie do kontrolowania na bieżąco złącz spajanych przy użyciu promieniowania rentgenowskiego oraz analizy wartości szarościInfo
- Publication number
- PL2067025T3 PL2067025T3 PL07803297T PL07803297T PL2067025T3 PL 2067025 T3 PL2067025 T3 PL 2067025T3 PL 07803297 T PL07803297 T PL 07803297T PL 07803297 T PL07803297 T PL 07803297T PL 2067025 T3 PL2067025 T3 PL 2067025T3
- Authority
- PL
- Poland
- Prior art keywords
- joints
- real
- time inspection
- inspection
- time
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K31/00—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups
- B23K31/12—Processes relevant to this subclass, specially adapted for particular articles or purposes, but not covered by only one of the preceding main groups relating to investigating the properties, e.g. the weldability, of materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/401—Imaging image processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/629—Specific applications or type of materials welds, bonds, sealing compounds
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/646—Specific applications or type of materials flaws, defects
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10116—X-ray image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30152—Solder
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- Mechanical Engineering (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Quality & Reliability (AREA)
- Theoretical Computer Science (AREA)
- Image Processing (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006000480A DE102006000480A1 (de) | 2006-09-26 | 2006-09-26 | Verfahren und Vorrichtung zur Echtzeit-Kontrolle von Fügeverbindungen |
EP07803297.6A EP2067025B1 (de) | 2006-09-26 | 2007-09-06 | Verfahren und vorrichtung zur echtzeitkontrolle von fügeverbindungen mit röntgenstrahlung und grauwertauswertung |
PCT/EP2007/059343 WO2008037580A2 (de) | 2006-09-26 | 2007-09-06 | Verfahren und vorrichtung zur echtzeitkontrolle von fügeverbindungen mit röntgenstrahlung und grauwertauswertung |
Publications (1)
Publication Number | Publication Date |
---|---|
PL2067025T3 true PL2067025T3 (pl) | 2013-08-30 |
Family
ID=39133890
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PL07803297T PL2067025T3 (pl) | 2006-09-26 | 2007-09-06 | Sposób i urządzenie do kontrolowania na bieżąco złącz spajanych przy użyciu promieniowania rentgenowskiego oraz analizy wartości szarości |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP2067025B1 (pl) |
DE (1) | DE102006000480A1 (pl) |
DK (1) | DK2067025T3 (pl) |
ES (1) | ES2410539T3 (pl) |
PL (1) | PL2067025T3 (pl) |
WO (1) | WO2008037580A2 (pl) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102566487A (zh) * | 2012-02-09 | 2012-07-11 | 上海高晶检测科技股份有限公司 | 高能量x射线异物检测控制系统及方法 |
JP6239230B2 (ja) * | 2012-12-05 | 2017-11-29 | 三菱日立パワーシステムズ株式会社 | タービンロータの製造方法 |
DE102015016513B4 (de) * | 2015-12-18 | 2021-08-05 | Audi Ag | Online-Prozessüberwachung und Online-Prozessregelung beim Verfahren zum form- oder stoffschlüssigen Verbinden zumindest zweier Bauteile durch ein Fügeverfahren mittels einer Radiometrievorrichtung |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4484081A (en) * | 1980-09-19 | 1984-11-20 | Trw Inc. | Defect analysis system |
DE3533913A1 (de) * | 1985-09-23 | 1987-04-02 | Muenchener Apparatebau Fuer El | Anordnung zur zerstoerungsfreien pruefung von schweissnaehten |
US4896278A (en) * | 1988-07-11 | 1990-01-23 | Northrop Corporation | Automated defect recognition system |
WO2000011455A1 (en) * | 1998-08-18 | 2000-03-02 | Lockheed Martin Corporation | Digital radiographic weld inspection system |
US7315609B2 (en) * | 2004-09-16 | 2008-01-01 | The Boeing Company | Real-time X-ray scanner and remote crawler apparatus and method |
-
2006
- 2006-09-26 DE DE102006000480A patent/DE102006000480A1/de not_active Withdrawn
-
2007
- 2007-09-06 DK DK07803297.6T patent/DK2067025T3/da active
- 2007-09-06 PL PL07803297T patent/PL2067025T3/pl unknown
- 2007-09-06 WO PCT/EP2007/059343 patent/WO2008037580A2/de active Application Filing
- 2007-09-06 EP EP07803297.6A patent/EP2067025B1/de not_active Not-in-force
- 2007-09-06 ES ES07803297T patent/ES2410539T3/es active Active
Also Published As
Publication number | Publication date |
---|---|
DK2067025T3 (da) | 2013-05-27 |
WO2008037580A2 (de) | 2008-04-03 |
EP2067025A2 (de) | 2009-06-10 |
ES2410539T3 (es) | 2013-07-02 |
EP2067025B1 (de) | 2013-04-24 |
DE102006000480A1 (de) | 2008-04-03 |
WO2008037580A3 (de) | 2008-07-17 |
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