PL2044423T3 - Przyrząd oraz metoda charakteryzowania powierzchni - Google Patents

Przyrząd oraz metoda charakteryzowania powierzchni

Info

Publication number
PL2044423T3
PL2044423T3 PL07803851T PL07803851T PL2044423T3 PL 2044423 T3 PL2044423 T3 PL 2044423T3 PL 07803851 T PL07803851 T PL 07803851T PL 07803851 T PL07803851 T PL 07803851T PL 2044423 T3 PL2044423 T3 PL 2044423T3
Authority
PL
Poland
Prior art keywords
characterizing surfaces
characterizing
Prior art date
Application number
PL07803851T
Other languages
English (en)
Polish (pl)
Inventor
Hocine Khemliche
Philippe Roncin
Patrick Rousseau
Original Assignee
Centre National De La Recherche Scientifique
Universite Paris-Sud (Paris 11)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National De La Recherche Scientifique, Universite Paris-Sud (Paris 11) filed Critical Centre National De La Recherche Scientifique
Publication of PL2044423T3 publication Critical patent/PL2044423T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20058—Measuring diffraction of electrons, e.g. low energy electron diffraction [LEED] method or reflection high energy electron diffraction [RHEED] method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Physical Vapour Deposition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
PL07803851T 2006-07-07 2007-07-05 Przyrząd oraz metoda charakteryzowania powierzchni PL2044423T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0606211A FR2903494B1 (fr) 2006-07-07 2006-07-07 Dispositif et procede de caracterisation de surfaces. notamment cristallines, a l'aide d'un faisceau d'atomes ou molecules neutres
EP07803851.0A EP2044423B1 (fr) 2006-07-07 2007-07-05 Dispositif et procede de caracterisation de surfaces
PCT/FR2007/001146 WO2008003865A2 (fr) 2006-07-07 2007-07-05 Dispositif et procede de caracterisation de surfaces

Publications (1)

Publication Number Publication Date
PL2044423T3 true PL2044423T3 (pl) 2018-09-28

Family

ID=38158198

Family Applications (1)

Application Number Title Priority Date Filing Date
PL07803851T PL2044423T3 (pl) 2006-07-07 2007-07-05 Przyrząd oraz metoda charakteryzowania powierzchni

Country Status (6)

Country Link
US (1) US8232518B2 (ja)
EP (1) EP2044423B1 (ja)
JP (1) JP5480621B2 (ja)
FR (1) FR2903494B1 (ja)
PL (1) PL2044423T3 (ja)
WO (1) WO2008003865A2 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5658219B2 (ja) * 2012-11-21 2015-01-21 住友ゴム工業株式会社 高分子材料のエネルギーロス、耐チッピング性能及び耐摩耗性能を評価する方法
US20150109431A1 (en) * 2013-10-18 2015-04-23 Edax, Materials Analysis Division Of Ametek Inc. Systems and Methods for Material Texture Analysis
CN108362721A (zh) * 2018-01-16 2018-08-03 长春理工大学 一种原位监测ald沉积薄膜材料质量的装置及方法
EP4099005A1 (fr) 2021-06-04 2022-12-07 Centre national de la recherche scientifique Dispositif d'analyse de surface par diffraction d'atomes rapides dans un environnement haute pression

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0633230B2 (ja) * 1989-07-15 1994-05-02 松下電器産業株式会社 結晶成長方法および結晶成長装置
JPH0763708A (ja) * 1993-08-26 1995-03-10 Shimadzu Corp 結晶成長分析装置
US5883005A (en) * 1994-03-25 1999-03-16 California Institute Of Technology Semiconductor etching by hyperthermal neutral beams
JPH10239254A (ja) * 1997-02-26 1998-09-11 Hitachi Ltd 粒子散乱分析方法及び装置，並びに半導体装置の製造方法
US6783643B2 (en) * 1999-06-22 2004-08-31 President And Fellows Of Harvard College Control of solid state dimensional features
EP1401007B1 (en) * 2002-09-18 2005-06-15 Staib Instrumente GmbH An electron diffraction system for use in production environment and for high pressure deposition techniques

Also Published As

Publication number Publication date
FR2903494A1 (fr) 2008-01-11
JP5480621B2 (ja) 2014-04-23
US8232518B2 (en) 2012-07-31
WO2008003865A3 (fr) 2008-03-06
JP2009542903A (ja) 2009-12-03
EP2044423B1 (fr) 2018-03-28
EP2044423A2 (fr) 2009-04-08
US20090250600A1 (en) 2009-10-08
FR2903494B1 (fr) 2008-09-26
WO2008003865A2 (fr) 2008-01-10

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