PL2005146T3 - Kontrola jakości szyby - Google Patents

Kontrola jakości szyby

Info

Publication number
PL2005146T3
PL2005146T3 PL07733588T PL07733588T PL2005146T3 PL 2005146 T3 PL2005146 T3 PL 2005146T3 PL 07733588 T PL07733588 T PL 07733588T PL 07733588 T PL07733588 T PL 07733588T PL 2005146 T3 PL2005146 T3 PL 2005146T3
Authority
PL
Poland
Prior art keywords
glazing
inspection
glazing inspection
Prior art date
Application number
PL07733588T
Other languages
English (en)
Inventor
Barry Raymond Hill
Original Assignee
Pilkington Group Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pilkington Group Ltd filed Critical Pilkington Group Ltd
Publication of PL2005146T3 publication Critical patent/PL2005146T3/pl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G01N2021/8825—Separate detection of dark field and bright field
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
PL07733588T 2006-03-29 2007-03-28 Kontrola jakości szyby PL2005146T3 (pl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0606217.8A GB0606217D0 (en) 2006-03-29 2006-03-29 Glazing inspection
EP07733588A EP2005146B1 (en) 2006-03-29 2007-03-28 Glazing inspection
PCT/GB2007/050165 WO2007110672A1 (en) 2006-03-29 2007-03-28 Glazing inspection

Publications (1)

Publication Number Publication Date
PL2005146T3 true PL2005146T3 (pl) 2009-12-31

Family

ID=36424747

Family Applications (1)

Application Number Title Priority Date Filing Date
PL07733588T PL2005146T3 (pl) 2006-03-29 2007-03-28 Kontrola jakości szyby

Country Status (9)

Country Link
US (1) US7760350B2 (pl)
EP (1) EP2005146B1 (pl)
JP (1) JP2009531701A (pl)
CN (1) CN101449151B (pl)
DE (1) DE602007001601D1 (pl)
ES (1) ES2329736T3 (pl)
GB (1) GB0606217D0 (pl)
PL (1) PL2005146T3 (pl)
WO (1) WO2007110672A1 (pl)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT10869U1 (de) * 2008-01-31 2009-11-15 Axel Dr Kulcke Verfahren und vorrichtung zum spektralbasierten sortieren transparenter und semitransparenter schüttgüter sowie beleuchtungseinheit hiefür
IT1395116B1 (it) * 2009-07-29 2012-09-05 Utpvision S R L Sistema di rilevamento ottico di difetti superficiali
CN103857567B (zh) * 2011-06-17 2016-06-15 罗伯特·博世有限公司 用于识别车辆的窗玻璃上的定向结构的方法和设备
CN104237137B (zh) * 2013-06-07 2016-12-28 昆山胜泽光电科技有限公司 测量玻璃不同角度颜色、亮度和反射率光谱的装置
CN104897693A (zh) * 2015-06-12 2015-09-09 武汉中导光电设备有限公司 一种玻璃表面缺陷增强装置及其检测方法
CN105738384A (zh) * 2016-03-11 2016-07-06 伍祥辰 玻璃表面缺陷检测装置
JP6893219B2 (ja) 2016-05-30 2021-06-23 ボブスト メックス ソシエテ アノニムＢｏｂｓｔ Ｍｅｘ ＳＡ 表面検査システム及び表面検査方法
EP3762344A1 (en) * 2018-03-07 2021-01-13 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on wavelength(s) analysis
US10481097B1 (en) 2018-10-01 2019-11-19 Guardian Glass, LLC Method and system for detecting inclusions in float glass based on spectral reflectance analysis
KR102666694B1 (ko) * 2018-11-13 2024-05-20 삼성디스플레이 주식회사 피검체의 결함 검사 시스템 및 결함 검사 방법
CN111323433A (zh) * 2018-12-13 2020-06-23 深圳中科飞测科技有限公司 检测装置及其检测方法
US12313566B2 (en) 2019-08-02 2025-05-27 Hitachi High-Tech Corporation Defect inspection device and defect inspection method
US12345661B2 (en) 2019-08-14 2025-07-01 Hitachi High-Tech Corporation Defect inspection apparatus and defect inspection method
JP2023506778A (ja) * 2019-12-13 2023-02-20 コーニング インコーポレイテッド レーザを利用した内包異物検出システム及び方法
US12366538B2 (en) 2020-04-02 2025-07-22 Hitachi High-Tech Corporation Defect inspection apparatus and defect inspection method
EP4036798A1 (de) * 2021-01-27 2022-08-03 Siemens Healthcare GmbH Computer-implementiertes verfahrens zur automatischen klassifikation von emitter-strukturen, vorrichtung zur durchführung des verfahrens, maschinenlesbarer programmcode und speichermedium
WO2022162881A1 (ja) * 2021-01-29 2022-08-04 株式会社日立ハイテク 欠陥検査装置
IT202100003293A1 (it) 2021-02-15 2022-08-15 Soffieria Bertolini S P A Metodo per controllare la conformità di un contenitore e relativo apparato
CN113933319A (zh) * 2021-09-01 2022-01-14 郑州旭飞光电科技有限公司 玻璃缺陷检测装置
CN113933026B (zh) * 2021-09-17 2023-08-18 南京森林警察学院 一种基于透射反射混合照明的透镜表面瑕疵检测装置及方法
CN115165926B (zh) * 2022-07-29 2024-01-19 湖南科洛德科技有限公司 压延玻璃缺陷检测系统
CA3264552A1 (en) 2022-08-22 2024-02-29 Industrial Dynamics Company, Ltd. HYBRID STAR READING SYSTEM FOR INSPECTION OF AN EMPTY BOTTLE

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Publication number Priority date Publication date Assignee Title
US4341469A (en) * 1980-06-18 1982-07-27 Discovision Associates Laser shadowgraph
FR2500630A1 (fr) * 1981-02-25 1982-08-27 Leser Jacques Procede pour la recherche des defauts des feuilles de verre et dispositif mettant en oeuvre ce procede
US4645337A (en) * 1984-10-31 1987-02-24 Ppg Industries, Inc. System for detecting variations in surface composition of an article
NL8901380A (nl) * 1989-02-14 1990-09-03 Heuft Qualiplus Bv Simultane dubbele inspectie.
JP3053133B2 (ja) * 1991-01-29 2000-06-19 ホーヤ株式会社 光学部材評価装置
US5280170A (en) * 1992-12-22 1994-01-18 Emhart Glass Machinery Investments Inc. Machine for inspecting the shape of a container having a two dimensional camera for viewing the shadow of the projection of the container
JPH08327561A (ja) 1995-06-05 1996-12-13 Nippon Sheet Glass Co Ltd 連続シート状物体の欠点検査装置
EP0930498A3 (en) 1997-12-26 1999-11-17 Nidek Co., Ltd. Inspection apparatus and method for detecting defects
CA2252308C (en) * 1998-10-30 2005-01-04 Image Processing Systems, Inc. Glass inspection system
AUPQ262299A0 (en) * 1999-09-02 1999-09-23 Resolve Engineering Pty Ltd Detection of inclusions in glass
US20010030744A1 (en) 1999-12-27 2001-10-18 Og Technologies, Inc. Method of simultaneously applying multiple illumination schemes for simultaneous image acquisition in an imaging system
US6909502B2 (en) * 2001-12-27 2005-06-21 General Electric Method and apparatus for measuring ripple and distortion in a transparent material
DE10239548A1 (de) * 2002-08-23 2004-03-04 Leica Microsystems Semiconductor Gmbh Vorrichtung und Verfahren zur Inspektion eines Objekts
GB0307345D0 (en) * 2003-03-29 2003-05-07 Pilkington Plc Glazing inspection
JP2005233695A (ja) * 2004-02-17 2005-09-02 Sumitomo Osaka Cement Co Ltd 透明板欠陥検査装置
WO2006012551A1 (en) 2004-07-23 2006-02-02 Nextech Solutions, Inc. Large substrate flat panel inspection system
US8040502B2 (en) 2004-09-17 2011-10-18 Wdi Wise Device Inc. Optical inspection of flat media using direct image technology

Also Published As

Publication number Publication date
JP2009531701A (ja) 2009-09-03
US7760350B2 (en) 2010-07-20
EP2005146A1 (en) 2008-12-24
US20090185179A1 (en) 2009-07-23
EP2005146B1 (en) 2009-07-15
WO2007110672A1 (en) 2007-10-04
DE602007001601D1 (en) 2009-08-27
CN101449151A (zh) 2009-06-03
GB0606217D0 (en) 2006-05-10
ES2329736T3 (es) 2009-11-30
CN101449151B (zh) 2011-06-29

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