NO954729L - Fölerkrets og framgangsmåte for kompensasjon - Google Patents
Fölerkrets og framgangsmåte for kompensasjonInfo
- Publication number
- NO954729L NO954729L NO954729A NO954729A NO954729L NO 954729 L NO954729 L NO 954729L NO 954729 A NO954729 A NO 954729A NO 954729 A NO954729 A NO 954729A NO 954729 L NO954729 L NO 954729L
- Authority
- NO
- Norway
- Prior art keywords
- transducer
- amplifier
- microprocessor
- sensor circuit
- network
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2268—Arrangements for correcting or for compensating unwanted effects
- G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2268—Arrangements for correcting or for compensating unwanted effects
- G01L1/2275—Arrangements for correcting or for compensating unwanted effects for non linearity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L25/00—Testing or calibrating of apparatus for measuring force, torque, work, mechanical power, or mechanical efficiency
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Measuring Fluid Pressure (AREA)
- Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
Abstract
Det er beskrevet en sensorkrets (20) og en framgangsmåte for kalibrering og temperatur-kompensering av forskyvning og spennvidde av sensorkretsen (20). Sensorkretsen (20) inkluderer en transducer (21) koplet til en mikroprosessor (22) via en forsterker (23) og en temperaturavfølingskrets (24). En utgangsport av mikroprosessoren (22) er koplet til en første inngangsnode av forsterkeren (23) via et transducer-forskyvningskompenserings- nettverk (23) og til en andre inngangsnode av forsterkeren (23) via et transducer-spennvidde- kompenseringsnettverk (34), og dermed dannes et lukket-sløyfe-tilbakekoplingsnettverk. I operasjon blir transducer-utgangssignalet sendt til mikroprosessoren (22) via forsterkeren (23). Mikroprosessoren (22) genererer et transducer-kompenseringssignal som tilbakekoples til inngangsnodene til forsterkeren (23) via transducer-forskyvningskompenseringsnettverk (33) og tranducer-spennviddekompenseringsnettverk (34) for å generere et kalibrert og temperaturkompensert transducer-utgangssignal (SCA).
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US36763995A | 1995-01-03 | 1995-01-03 |
Publications (2)
Publication Number | Publication Date |
---|---|
NO954729D0 NO954729D0 (no) | 1995-11-23 |
NO954729L true NO954729L (no) | 1996-07-04 |
Family
ID=23447993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO954729A NO954729L (no) | 1995-01-03 | 1995-11-23 | Fölerkrets og framgangsmåte for kompensasjon |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0721099A3 (no) |
JP (1) | JPH08240499A (no) |
NO (1) | NO954729L (no) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3384753B2 (ja) * | 1998-10-15 | 2003-03-10 | タカタ株式会社 | シート荷重計測装置 |
DE10005445C2 (de) | 1999-02-08 | 2002-08-14 | Takata Corp | Diagnoseverfahren für eine Sitzlastmessvorrichtung |
US6377110B1 (en) * | 1999-09-10 | 2002-04-23 | Keystone Thermometrics | Low-cost temperature sensor providing relatively high accuracy, a wide dynamic range and high linearity |
DE10023114A1 (de) * | 2000-05-11 | 2001-11-29 | Infineon Technologies Ag | Verstärkerschaltung mit Offset-Kompensation, insbesondere für digitale Modulationseinrichtungen |
US7091902B2 (en) * | 2003-12-17 | 2006-08-15 | Xerox Corporation | Systems and methods for characterizing the coverage of ad hoc sensor networks |
EP1602907A1 (en) * | 2004-05-31 | 2005-12-07 | Gefran Sensori S.r.l. | Automatic sensor correction with feedback microprocessor |
US20060284627A1 (en) * | 2005-06-17 | 2006-12-21 | Ford Greg E | Apparatus for correcting electrical signals |
EP2546620B1 (de) * | 2011-07-13 | 2014-04-09 | ELMOS Semiconductor AG | Vorrichtung zur Umgebungslichtkompensation für gleichermaßen Nutzlicht und Umgebungslicht ausgesetzten optischen Sensoren |
JP2015177205A (ja) * | 2014-03-13 | 2015-10-05 | ヤマハ株式会社 | オフセットキャンセル回路 |
US10778173B2 (en) * | 2018-07-25 | 2020-09-15 | Cirrus Logic, Inc. | Audio distortion compensation |
CN113917966B (zh) * | 2021-08-17 | 2022-07-22 | 中国科学院高能物理研究所 | 一种开关电容阵列芯片直流偏置实时校正方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4437164A (en) * | 1981-03-05 | 1984-03-13 | Bristol Babcock Inc. | Ridge circuit compensation for environmental effects |
US4478527A (en) * | 1982-12-02 | 1984-10-23 | General Signal Corporation | Temperature compensation for zero and span changes in a measurement circuit |
JPH0640036B2 (ja) * | 1985-09-24 | 1994-05-25 | 工業技術院長 | 圧覚センサ出力信号前処理装置 |
US4872349A (en) * | 1986-10-31 | 1989-10-10 | General Electric Company | Microcomputerized force transducer |
US4969059A (en) * | 1988-03-28 | 1990-11-06 | Rigidyne Corporation | Offset nulling system for computer disk drives |
JPH0777266B2 (ja) * | 1988-12-28 | 1995-08-16 | 株式会社豊田中央研究所 | 半導体歪み検出装置 |
US5031461A (en) * | 1990-02-05 | 1991-07-16 | Motorola, Inc. | Matched pair of sensor and amplifier circuits |
US5115193A (en) * | 1990-12-05 | 1992-05-19 | Data Instruments, Inc. | Inductive linear displacement transducer and temperature-compensating signal processor |
US5193393A (en) * | 1991-02-04 | 1993-03-16 | Motorola, Inc. | Pressure sensor circuit |
US5187985A (en) * | 1991-09-19 | 1993-02-23 | Honeywell Inc. | Amplified pressure transducer |
US5460049A (en) * | 1994-01-26 | 1995-10-24 | Instrumention Northwest, Inc. | Digitally-temperature-compensated strain-gauge pressure measuring apparatus |
-
1995
- 1995-11-23 NO NO954729A patent/NO954729L/no not_active Application Discontinuation
- 1995-12-18 EP EP95119920A patent/EP0721099A3/en not_active Withdrawn
- 1995-12-29 JP JP7353286A patent/JPH08240499A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPH08240499A (ja) | 1996-09-17 |
EP0721099A3 (en) | 1996-12-04 |
NO954729D0 (no) | 1995-11-23 |
EP0721099A2 (en) | 1996-07-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FC2A | Withdrawal, rejection or dismissal of laid open patent application |