NO881578L - Fremgangsmaate for kvantitativ analyse ved hjelp av det midlere atomtall av faser inneholdende et lett element ved bruk av et scanderende mikroskop og en bildeanalysator. - Google Patents
Fremgangsmaate for kvantitativ analyse ved hjelp av det midlere atomtall av faser inneholdende et lett element ved bruk av et scanderende mikroskop og en bildeanalysator.Info
- Publication number
- NO881578L NO881578L NO881578A NO881578A NO881578L NO 881578 L NO881578 L NO 881578L NO 881578 A NO881578 A NO 881578A NO 881578 A NO881578 A NO 881578A NO 881578 L NO881578 L NO 881578L
- Authority
- NO
- Norway
- Prior art keywords
- atomic number
- analyzer
- determination
- present
- procedure
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 9
- 238000004445 quantitative analysis Methods 0.000 title claims description 3
- 239000000523 sample Substances 0.000 claims description 7
- 238000011088 calibration curve Methods 0.000 claims description 4
- 239000000203 mixture Substances 0.000 claims description 3
- 230000001133 acceleration Effects 0.000 claims description 2
- 239000013074 reference sample Substances 0.000 claims description 2
- 239000000126 substance Substances 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 7
- 150000001875 compounds Chemical class 0.000 description 2
- 229910001148 Al-Li alloy Inorganic materials 0.000 description 1
- 241001448862 Croton Species 0.000 description 1
- 229910006309 Li—Mg Inorganic materials 0.000 description 1
- 229910019400 Mg—Li Inorganic materials 0.000 description 1
- 241000158147 Sator Species 0.000 description 1
- 229910004012 SiCx Inorganic materials 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 239000001989 lithium alloy Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 229910052705 radium Inorganic materials 0.000 description 1
- HCWPIIXVSYCSAN-UHFFFAOYSA-N radium atom Chemical compound [Ra] HCWPIIXVSYCSAN-UHFFFAOYSA-N 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000004621 scanning probe microscopy Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
Landscapes
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
- Electron Tubes For Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR8705562A FR2613834A1 (fr) | 1987-04-13 | 1987-04-13 | Methode de dosage a l'aide du numero atomique moyen de phases contenant un element leger a l'aide d'un microscope a balayage et d'un analyseur d'images |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| NO881578D0 NO881578D0 (no) | 1988-04-12 |
| NO881578L true NO881578L (no) | 1988-10-14 |
Family
ID=9350291
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO881578A NO881578L (no) | 1987-04-13 | 1988-04-12 | Fremgangsmaate for kvantitativ analyse ved hjelp av det midlere atomtall av faser inneholdende et lett element ved bruk av et scanderende mikroskop og en bildeanalysator. |
Country Status (13)
| Country | Link |
|---|---|
| US (1) | US4847495A (pt) |
| EP (1) | EP0291420A1 (pt) |
| JP (1) | JPS63290948A (pt) |
| KR (1) | KR880013007A (pt) |
| AU (1) | AU597167B2 (pt) |
| BR (1) | BR8801732A (pt) |
| DK (1) | DK195788A (pt) |
| FI (1) | FI881694A (pt) |
| FR (1) | FR2613834A1 (pt) |
| IL (1) | IL85995A0 (pt) |
| IS (1) | IS3331A7 (pt) |
| NO (1) | NO881578L (pt) |
| PT (1) | PT87223A (pt) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3345060B2 (ja) * | 1992-11-09 | 2002-11-18 | 日本テキサス・インスツルメンツ株式会社 | 走査形電子顕微鏡における画像信号処理方法およびその装置 |
| JP2013011474A (ja) * | 2011-06-28 | 2013-01-17 | Akita Univ | Ｍｇ−Ｌｉ系合金の微細組織・構造の評価方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL7800869A (nl) * | 1978-01-25 | 1979-07-27 | Philips Nv | Elektronenmikroskoop. |
| US4559450A (en) * | 1982-08-06 | 1985-12-17 | Unisearch Limited | Quantitative compositional analyser for use with scanning electron microscopes |
| AU558630B2 (en) * | 1982-08-06 | 1987-02-05 | Unisearch Limited | Auantitative compositional analyser for use with scanning electron microscopes |
| US4697080A (en) * | 1986-01-06 | 1987-09-29 | The United States Of America As Represented By The United States Department Of Energy | Analysis with electron microscope of multielement samples using pure element standards |
-
1987
- 1987-04-13 FR FR8705562A patent/FR2613834A1/fr active Pending
-
1988
- 1988-03-17 US US07/169,601 patent/US4847495A/en not_active Expired - Fee Related
- 1988-04-06 IL IL85995A patent/IL85995A0/xx unknown
- 1988-04-07 IS IS3331A patent/IS3331A7/is unknown
- 1988-04-11 DK DK195788A patent/DK195788A/da not_active Application Discontinuation
- 1988-04-11 EP EP88420116A patent/EP0291420A1/fr not_active Withdrawn
- 1988-04-12 FI FI881694A patent/FI881694A/fi not_active IP Right Cessation
- 1988-04-12 AU AU14520/88A patent/AU597167B2/en not_active Ceased
- 1988-04-12 KR KR1019880004124A patent/KR880013007A/ko not_active Application Discontinuation
- 1988-04-12 NO NO881578A patent/NO881578L/no unknown
- 1988-04-12 BR BR8801732A patent/BR8801732A/pt unknown
- 1988-04-12 JP JP63090143A patent/JPS63290948A/ja active Pending
- 1988-04-12 PT PT87223A patent/PT87223A/pt not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| AU597167B2 (en) | 1990-05-24 |
| PT87223A (pt) | 1989-05-12 |
| US4847495A (en) | 1989-07-11 |
| IS3331A7 (is) | 1988-10-14 |
| FR2613834A1 (fr) | 1988-10-14 |
| KR880013007A (ko) | 1988-11-29 |
| AU1452088A (en) | 1988-10-20 |
| DK195788D0 (da) | 1988-04-11 |
| FI881694A0 (fi) | 1988-04-12 |
| EP0291420A1 (fr) | 1988-11-17 |
| FI881694A (fi) | 1988-10-14 |
| JPS63290948A (ja) | 1988-11-28 |
| NO881578D0 (no) | 1988-04-12 |
| BR8801732A (pt) | 1988-11-16 |
| DK195788A (da) | 1988-10-14 |
| IL85995A0 (en) | 1988-09-30 |
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