NO20040756L - Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller - Google Patents

Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller

Info

Publication number
NO20040756L
NO20040756L NO20040756A NO20040756A NO20040756L NO 20040756 L NO20040756 L NO 20040756L NO 20040756 A NO20040756 A NO 20040756A NO 20040756 A NO20040756 A NO 20040756A NO 20040756 L NO20040756 L NO 20040756L
Authority
NO
Norway
Prior art keywords
traceability
wafers
solar cells
establishing compliance
compliance
Prior art date
Application number
NO20040756A
Other languages
English (en)
Other versions
NO20040756D0 (no
Inventor
Erik Sauar
Thor Christian Tuv
Original Assignee
Renewable Energy Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renewable Energy Corp filed Critical Renewable Energy Corp
Priority to NO20040756A priority Critical patent/NO20040756L/no
Publication of NO20040756D0 publication Critical patent/NO20040756D0/no
Priority to JP2006554043A priority patent/JP2007523489A/ja
Priority to PCT/NO2005/000061 priority patent/WO2005080950A1/en
Priority to DE112005000410.4T priority patent/DE112005000410B4/de
Priority to CNB2005800051604A priority patent/CN100549680C/zh
Priority to US10/598,123 priority patent/US7920738B2/en
Publication of NO20040756L publication Critical patent/NO20040756L/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System
    • H01L31/182—Special manufacturing methods for polycrystalline Si, e.g. Si ribbon, poly Si ingots, thin films of polycrystalline Si
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/546—Polycrystalline silicon PV cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
NO20040756A 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller NO20040756L (no)

Priority Applications (6)

Application Number Priority Date Filing Date Title
NO20040756A NO20040756L (no) 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller
JP2006554043A JP2007523489A (ja) 2004-02-20 2005-02-18 ウェハと太陽電池セルとの間の対応およびトレーサビリティの確立
PCT/NO2005/000061 WO2005080950A1 (en) 2004-02-20 2005-02-18 Establishing correspondence and traceability between wafers and solar cells
DE112005000410.4T DE112005000410B4 (de) 2004-02-20 2005-02-18 Verfahren und System zum Einrichten einer Entsprechung und einer Rückverfolgbarkeit zwischen Wafern und Solarzellen
CNB2005800051604A CN100549680C (zh) 2004-02-20 2005-02-18 用于生产太阳能电池的方法和系统
US10/598,123 US7920738B2 (en) 2004-02-20 2005-02-18 Establishing correspondence and traceability between wafers and solar cells

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NO20040756A NO20040756L (no) 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller

Publications (2)

Publication Number Publication Date
NO20040756D0 NO20040756D0 (no) 2004-02-20
NO20040756L true NO20040756L (no) 2005-08-22

Family

ID=34793440

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20040756A NO20040756L (no) 2004-02-20 2004-02-20 Fremgangsmate og system for a etablere samsvar og sporbarhet mellom vaffere og solceller

Country Status (6)

Country Link
US (1) US7920738B2 (no)
JP (1) JP2007523489A (no)
CN (1) CN100549680C (no)
DE (1) DE112005000410B4 (no)
NO (1) NO20040756L (no)
WO (1) WO2005080950A1 (no)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008294364A (ja) * 2007-05-28 2008-12-04 Sanyo Electric Co Ltd 太陽電池モジュール及びその製造方法
CN101861643B (zh) * 2007-08-30 2012-11-21 Bt成像股份有限公司 光生伏打电池制造
EP2414111A1 (de) * 2009-04-03 2012-02-08 Singulus Technologies AG Verfahren und vorrichtung zur identifizierung von gegenständen sowie zum verfolgen von gegenständen in einem produktionsprozess
US20100300259A1 (en) * 2009-05-29 2010-12-02 Applied Materials, Inc. Substrate side marking and identification
US8768040B2 (en) * 2011-01-14 2014-07-01 Varian Semiconductor Equipment Associates, Inc. Substrate identification and tracking through surface reflectance
DE102012213793B3 (de) 2012-08-03 2013-10-24 Solarworld Innovations Gmbh Untersuchung eines Siliziumsubstrats für eine Solarzelle
US9754365B2 (en) * 2014-02-21 2017-09-05 Applied Materials, Inc. Wafer inspection method and software
US10379449B2 (en) * 2017-02-10 2019-08-13 Kla-Tencor Corporation Identifying process variations during product manufacture
JP6431643B1 (ja) * 2018-03-30 2018-11-28 日新製鋼株式会社 金属板の表面欠陥検査方法および表面欠陥検査装置
CN112071952B (zh) * 2020-08-31 2022-03-22 泰州隆基乐叶光伏科技有限公司 一种硅片的制作方法及电池片、光伏组件

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4256681A (en) * 1976-12-16 1981-03-17 Semix Incorporated Method of producing semicrystalline silicon
JPH0677509A (ja) * 1992-08-25 1994-03-18 Sanyo Electric Co Ltd 太陽電池に於けるセル識別方式
US5757474A (en) * 1993-05-10 1998-05-26 Midwest Research Institute System for characterizing semiconductor materials and photovoltaic devices through calibration
JPH0722635A (ja) 1993-06-28 1995-01-24 Sanyo Electric Co Ltd 多結晶太陽電池識別方法
JP3491977B2 (ja) 1994-07-29 2004-02-03 キヤノン株式会社 多結晶シリコン太陽電池
JP2943673B2 (ja) 1995-10-31 1999-08-30 日本電気株式会社 半導体基板の製造装置及び製造方法
US5716459A (en) * 1995-12-13 1998-02-10 Hughes Aircraft Company Monolithically integrated solar cell microarray and fabrication method
US6542830B1 (en) 1996-03-19 2003-04-01 Hitachi, Ltd. Process control system
JP3213563B2 (ja) 1997-03-11 2001-10-02 株式会社スーパーシリコン研究所 ノッチレスウェーハの製造方法
JP3819993B2 (ja) 1997-05-23 2006-09-13 株式会社ルネサステクノロジ ウエハ検査装置
WO2000002236A2 (en) 1998-07-07 2000-01-13 Memc Electronic Materials, Inc. Radio frequency identification system and method for tracking silicon wafers
US6140140A (en) * 1998-09-16 2000-10-31 Advanced Micro Devices, Inc. Method for detecting process sensitivity to integrated circuit layout by compound processing
US6482661B1 (en) * 2000-03-09 2002-11-19 Intergen, Inc. Method of tracking wafers from ingot
JP2001313274A (ja) 2000-04-28 2001-11-09 Nippei Toyama Corp ウエーハの回収方法
GB0107618D0 (en) * 2001-03-27 2001-05-16 Aoti Operating Co Inc Detection and classification of micro-defects in semi-conductors
US7065239B2 (en) * 2001-10-24 2006-06-20 Applied Materials, Inc. Automated repetitive array microstructure defect inspection
JP2003243675A (ja) 2002-02-19 2003-08-29 Kyocera Corp 太陽電池用多結晶シリコンウエハおよびその製造方法
US7144457B1 (en) * 2002-03-21 2006-12-05 Takeda San Diego, Inc. Methods and devices for analyzing crystalline content of precipitates and crystals without isolation

Also Published As

Publication number Publication date
CN1922472A (zh) 2007-02-28
JP2007523489A (ja) 2007-08-16
US7920738B2 (en) 2011-04-05
DE112005000410B4 (de) 2018-05-09
CN100549680C (zh) 2009-10-14
NO20040756D0 (no) 2004-02-20
US20080160648A1 (en) 2008-07-03
DE112005000410T5 (de) 2007-01-11
WO2005080950A1 (en) 2005-09-01

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