NL98752C - - Google Patents

Info

Publication number
NL98752C
NL98752C NL98752DA NL98752C NL 98752 C NL98752 C NL 98752C NL 98752D A NL98752D A NL 98752DA NL 98752 C NL98752 C NL 98752C
Authority
NL
Netherlands
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of NL98752C publication Critical patent/NL98752C/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67121Apparatus for making assemblies not otherwise provided for, e.g. package constructions
    • CCHEMISTRY; METALLURGY
    • C10PETROLEUM, GAS OR COKE INDUSTRIES; TECHNICAL GASES CONTAINING CARBON MONOXIDE; FUELS; LUBRICANTS; PEAT
    • C10KPURIFYING OR MODIFYING THE CHEMICAL COMPOSITION OF COMBUSTIBLE GASES CONTAINING CARBON MONOXIDE
    • C10K1/00Purifying combustible gases containing carbon monoxide
    • C10K1/08Purifying combustible gases containing carbon monoxide by washing with liquids; Reviving the used wash liquors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2637Circuits therefor for testing other individual devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Combustion & Propulsion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Organic Chemistry (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
NL98752D 1955-02-04 NL98752C (enrdf_load_stackoverflow)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US486073A US2748349A (en) 1955-02-04 1955-02-04 Fabrication of junction transistors

Publications (1)

Publication Number Publication Date
NL98752C true NL98752C (enrdf_load_stackoverflow)

Family

ID=23930493

Family Applications (2)

Application Number Title Priority Date Filing Date
NL98752D NL98752C (enrdf_load_stackoverflow) 1955-02-04
NL201406D NL201406A (enrdf_load_stackoverflow) 1955-02-04

Family Applications After (1)

Application Number Title Priority Date Filing Date
NL201406D NL201406A (enrdf_load_stackoverflow) 1955-02-04

Country Status (5)

Country Link
US (1) US2748349A (enrdf_load_stackoverflow)
BE (1) BE543825A (enrdf_load_stackoverflow)
FR (1) FR1147942A (enrdf_load_stackoverflow)
GB (1) GB789712A (enrdf_load_stackoverflow)
NL (2) NL201406A (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2951204A (en) * 1957-04-08 1960-08-30 Texas Instruments Inc Method and apparatus for locating the base section of a transistor bar
BE571509A (enrdf_load_stackoverflow) * 1957-09-26 1900-01-01
US2956230A (en) * 1958-08-29 1960-10-11 Texas Instruments Inc Method for locating p-n junctions in semiconductor bodies
US3067387A (en) * 1959-07-14 1962-12-04 Ibm P-n junction position determination
US3185927A (en) * 1961-01-31 1965-05-25 Kulicke & Soffa Mfg Co Probe instrument for inspecting semiconductor wafers including means for marking defective zones
US3351733A (en) * 1963-08-21 1967-11-07 Hitachi Ltd Welding method
US3548491A (en) * 1967-02-03 1970-12-22 Ibm Mass production of electronic devices

Also Published As

Publication number Publication date
BE543825A (enrdf_load_stackoverflow)
US2748349A (en) 1956-05-29
NL201406A (enrdf_load_stackoverflow)
FR1147942A (fr) 1957-12-02
GB789712A (en) 1958-01-29

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