NL7209350A - - Google Patents
Info
- Publication number
- NL7209350A NL7209350A NL7209350A NL7209350A NL7209350A NL 7209350 A NL7209350 A NL 7209350A NL 7209350 A NL7209350 A NL 7209350A NL 7209350 A NL7209350 A NL 7209350A NL 7209350 A NL7209350 A NL 7209350A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/24—Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE2149108A DE2149108C3 (en) | 1971-09-28 | 1971-09-28 | Device for adjusting the magnification of an electron microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7209350A true NL7209350A (en) | 1973-03-30 |
Family
ID=5821228
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7209350A NL7209350A (en) | 1971-09-28 | 1972-07-04 |
Country Status (5)
Country | Link |
---|---|
US (1) | US3757117A (en) |
JP (1) | JPS4843261A (en) |
DE (1) | DE2149108C3 (en) |
GB (1) | GB1394102A (en) |
NL (1) | NL7209350A (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5354465A (en) * | 1976-10-28 | 1978-05-17 | Jeol Ltd | Lens control circuit for electromicroscope or the like |
JPS563125Y2 (en) * | 1977-09-16 | 1981-01-23 | ||
JPS54107646U (en) * | 1978-01-17 | 1979-07-28 | ||
JPS57212754A (en) * | 1981-06-24 | 1982-12-27 | Hitachi Ltd | Electron-beam controller for electron microscope |
JPS5814460A (en) * | 1981-07-17 | 1983-01-27 | Internatl Precision Inc | Focus adjustment of electron microscope and photographing method and device to which said focus adjustment is applied |
JPS63207612A (en) * | 1987-02-24 | 1988-08-29 | 日本碍子株式会社 | Ceramic extruding method and device |
US4818873A (en) * | 1987-10-30 | 1989-04-04 | Vickers Instruments (Canada) Inc. | Apparatus for automatically controlling the magnification factor of a scanning electron microscope |
JP2673900B2 (en) * | 1988-12-05 | 1997-11-05 | 株式会社日立製作所 | electronic microscope |
JP4727777B2 (en) * | 1999-05-24 | 2011-07-20 | 株式会社日立製作所 | Measuring method by scanning electron microscope |
-
1971
- 1971-09-28 DE DE2149108A patent/DE2149108C3/en not_active Expired
-
1972
- 1972-07-04 NL NL7209350A patent/NL7209350A/xx not_active Application Discontinuation
- 1972-07-17 GB GB3330572A patent/GB1394102A/en not_active Expired
- 1972-09-15 US US00289531A patent/US3757117A/en not_active Expired - Lifetime
- 1972-09-27 JP JP47096977A patent/JPS4843261A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
DE2149108C3 (en) | 1975-05-15 |
JPS4843261A (en) | 1973-06-22 |
DE2149108B2 (en) | 1974-10-03 |
US3757117A (en) | 1973-09-04 |
DE2149108A1 (en) | 1973-04-05 |
GB1394102A (en) | 1975-05-14 |
Similar Documents
Legal Events
Date | Code | Title | Description |
---|---|---|---|
BA | A request for search or an international-type search has been filed | ||
BV | The patent application has lapsed |