NL7116275A - - Google Patents
Info
- Publication number
- NL7116275A NL7116275A NL7116275A NL7116275A NL7116275A NL 7116275 A NL7116275 A NL 7116275A NL 7116275 A NL7116275 A NL 7116275A NL 7116275 A NL7116275 A NL 7116275A NL 7116275 A NL7116275 A NL 7116275A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Relating To Insulation (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US9332270A | 1970-11-27 | 1970-11-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7116275A true NL7116275A (https=) | 1972-05-30 |
Family
ID=22238299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7116275A NL7116275A (https=) | 1970-11-27 | 1971-11-26 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3701021A (https=) |
| JP (1) | JPS5110947B1 (https=) |
| CA (1) | CA943186A (https=) |
| DE (1) | DE2158612C3 (https=) |
| FR (1) | FR2116102A5 (https=) |
| GB (1) | GB1364695A (https=) |
| IT (1) | IT941788B (https=) |
| NL (1) | NL7116275A (https=) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58169710U (ja) * | 1982-04-30 | 1983-11-12 | 日本ビクター株式会社 | 増幅回路 |
| DE3340185A1 (de) * | 1983-11-07 | 1985-05-15 | Multitest Elektronische Systeme GmbH, 8200 Rosenheim | Vorrichtung zum aufnehmen von bauteilen, insbesondere von integrierten chips, in einem eingangs- und/oder ausgangsmagazin einer bauteile-pruefmaschine |
| US4588092A (en) * | 1983-11-15 | 1986-05-13 | Automated Electronic Technology, Inc. | Integrated circuit handling and contact system |
| US4564110A (en) * | 1984-06-22 | 1986-01-14 | At&T Technologies, Inc. | Apparatus for positioning gravity fed components in an electrical test facility |
| US4691831A (en) * | 1984-06-25 | 1987-09-08 | Takeda Riken Co., Ltd. | IC test equipment |
| US4703858A (en) * | 1986-01-02 | 1987-11-03 | Multitest Elektronische Systeme Gmbh | Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips |
| US4776747A (en) * | 1986-01-03 | 1988-10-11 | Motorola Inc. | High speed integrated circuit handler |
| US4709801A (en) * | 1986-01-03 | 1987-12-01 | Motorola, Inc. | Input buffer and article injector mechanism for an automated article handler |
| US4674625A (en) * | 1986-01-03 | 1987-06-23 | Motorola Inc. | Transport mechanism for an automated integrated circuit handler |
| US4676359A (en) * | 1986-01-03 | 1987-06-30 | Motorola Inc. | Article ejector/sorter for an automated article handling system |
| US4660710A (en) * | 1986-01-03 | 1987-04-28 | Motorola Inc. | Integrated circuit sleeve handler |
| DE8605799U1 (de) * | 1986-03-03 | 1986-09-11 | Microhandling Handhabungsgeräte GmbH, 8000 München | Vorrichtung zum Vereinzeln von IC's |
| US4970460A (en) * | 1987-10-05 | 1990-11-13 | Aetrium, Inc. | Controlled impedance testsite |
| US5065089A (en) * | 1990-06-01 | 1991-11-12 | Tovex Tech, Inc. | Circuit handler with sectioned rail |
| US5436567A (en) * | 1993-02-08 | 1995-07-25 | Automated Test Engineering, Inc. | Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts |
| US6794890B1 (en) * | 1999-07-27 | 2004-09-21 | Mitsubishi Denki Kabushiki Kaisha | Test socket, method of manufacturing the test socket, test method using the test socket, and member to be tested |
| US6853087B2 (en) | 2000-09-19 | 2005-02-08 | Nanopierce Technologies, Inc. | Component and antennae assembly in radio frequency identification devices |
| EP1328373A2 (en) * | 2000-10-24 | 2003-07-23 | Nanopierce Technologies Inc. | Method and materials for printing particle-enhanced electrical contacts |
| US6897668B1 (en) * | 2003-11-28 | 2005-05-24 | Premtek International Inc. | Double-faced detecting devices for an electronic substrate |
| TWI271832B (en) * | 2005-10-07 | 2007-01-21 | King Yuan Electronics Co Ltd | Feeding apparatus |
| KR20100062326A (ko) * | 2008-12-02 | 2010-06-10 | 삼성전자주식회사 | 반도체 디바이스 테스트 장치 |
| CN114084570B (zh) * | 2022-01-20 | 2022-06-03 | 百信信息技术有限公司 | 一种服务器包装测试线 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3274534A (en) * | 1963-12-02 | 1966-09-20 | Gen Dynamics Corp | Electrical connector |
| US3363179A (en) * | 1964-03-23 | 1968-01-09 | Tektronix Inc | Apparatus for automatically testing electronic devices with movable probe containinga test circuit |
| US3408565A (en) * | 1966-03-02 | 1968-10-29 | Philco Ford Corp | Apparatus for sequentially testing electrical components under controlled environmental conditions including a component support mating test head |
-
1970
- 1970-11-27 US US93322A patent/US3701021A/en not_active Expired - Lifetime
-
1971
- 1971-11-16 GB GB5318571A patent/GB1364695A/en not_active Expired
- 1971-11-26 DE DE2158612A patent/DE2158612C3/de not_active Expired
- 1971-11-26 CA CA128,731A patent/CA943186A/en not_active Expired
- 1971-11-26 NL NL7116275A patent/NL7116275A/xx unknown
- 1971-11-26 FR FR7142478A patent/FR2116102A5/fr not_active Expired
- 1971-11-26 IT IT31700/71A patent/IT941788B/it active
- 1971-11-27 JP JP46095707A patent/JPS5110947B1/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE2158612C3 (de) | 1974-08-15 |
| US3701021A (en) | 1972-10-24 |
| CA943186A (en) | 1974-03-05 |
| IT941788B (it) | 1973-03-10 |
| JPS5110947B1 (https=) | 1976-04-07 |
| DE2158612A1 (de) | 1972-07-20 |
| FR2116102A5 (https=) | 1972-07-07 |
| DE2158612B2 (de) | 1974-01-24 |
| GB1364695A (en) | 1974-08-29 |