NL7110157A - - Google Patents
Info
- Publication number
- NL7110157A NL7110157A NL7110157A NL7110157A NL7110157A NL 7110157 A NL7110157 A NL 7110157A NL 7110157 A NL7110157 A NL 7110157A NL 7110157 A NL7110157 A NL 7110157A NL 7110157 A NL7110157 A NL 7110157A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D3/00—Control of position or direction
- G05D3/12—Control of position or direction using feedback
- G05D3/14—Control of position or direction using feedback using an analogue comparing device
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D3/00—Control of position or direction
- G05D3/12—Control of position or direction using feedback
- G05D3/20—Control of position or direction using feedback using a digital comparing device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/681—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment using optical controlling means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Control Of Position Or Direction (AREA)
- Optical Transform (AREA)
- Machine Tool Positioning Apparatuses (AREA)
- Processing Or Creating Images (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US6621170A | 1970-08-24 | 1970-08-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7110157A true NL7110157A (enExample) | 1972-02-28 |
Family
ID=22067996
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7110157A NL7110157A (enExample) | 1970-08-24 | 1971-07-23 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3671748A (enExample) |
| JP (1) | JPS5128465B1 (enExample) |
| FR (1) | FR2107046A5 (enExample) |
| GB (1) | GB1334128A (enExample) |
| NL (1) | NL7110157A (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3723745A (en) * | 1971-12-28 | 1973-03-27 | Nasa | Radiant source tracker independent of non-constant irradiance |
| US3814845A (en) * | 1973-03-01 | 1974-06-04 | Bell Telephone Labor Inc | Object positioning |
| US4021711A (en) * | 1975-06-27 | 1977-05-03 | International Business Machines Corporation | Article positioner with zero position sensing means |
| JPS52121144A (en) * | 1976-04-03 | 1977-10-12 | Nippon Gakki Seizo Kk | High potential switch |
| US4199816A (en) * | 1978-06-28 | 1980-04-22 | Humphrey Instruments, Inc. | Optical calibration apparatus and procedure |
| DD158824A1 (de) * | 1980-11-03 | 1983-02-02 | Adelbrecht Schorcht | Anordnung zur automatischen justierung mindestens eines gegenstandes |
| GB2131162B (en) * | 1982-11-27 | 1986-04-30 | Ferranti Plc | Aligning objects |
| FR2540666B1 (fr) * | 1983-02-04 | 1986-10-10 | Telemecanique Electrique | Interrupteur limiteur |
| US4713784A (en) * | 1983-07-04 | 1987-12-15 | Canon Kabushiki Kaisha | Alignment apparatus |
| DE3927890A1 (de) * | 1989-08-24 | 1991-02-28 | Thomson Brandt Gmbh | Verfahren zum justieren einer positioniervorrichtung |
| JPH0724278B2 (ja) * | 1991-01-10 | 1995-03-15 | 信越半導体株式会社 | パターンシフト測定方法 |
| JP4171953B2 (ja) * | 2000-01-18 | 2008-10-29 | ソニー株式会社 | ディスク搬送装置及びディスク搬送方法 |
| US6677602B1 (en) * | 2000-08-18 | 2004-01-13 | Sensys Instruments Corporation | Notch and flat sensor for wafer alignment |
| JP3982270B2 (ja) * | 2002-01-29 | 2007-09-26 | 信越半導体株式会社 | 半導体ウエーハの製造方法および半導体ウエーハ製造の受注方法ならびに半導体ウエーハ製造の受注システム |
| CN101140894A (zh) * | 2003-03-26 | 2008-03-12 | 阿森姆布里昂股份有限公司 | 用于校准装置的方法、用于校准多个并排放置的装置的方法以及适于实施这种方法的物体 |
| US7492449B2 (en) * | 2004-04-12 | 2009-02-17 | Georgia Tech Research Corporation | Inspection systems and methods |
| US8860456B2 (en) | 2011-08-02 | 2014-10-14 | Medtronic, Inc. | Non-destructive tilt data measurement to detect defective bumps |
| CN109029315B (zh) * | 2018-06-04 | 2024-04-09 | 深圳先进技术研究院 | 感应器的刻度系统及其刻度方法 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2969707A (en) * | 1955-05-07 | 1961-01-31 | Zeiss Carl | Method and means for automatically adjusting a measuring or observation instrument |
-
1970
- 1970-08-24 US US66211A patent/US3671748A/en not_active Expired - Lifetime
-
1971
- 1971-07-23 NL NL7110157A patent/NL7110157A/xx not_active Application Discontinuation
- 1971-07-30 FR FR7128157A patent/FR2107046A5/fr not_active Expired
- 1971-08-11 JP JP46060360A patent/JPS5128465B1/ja active Pending
- 1971-08-17 GB GB3857571A patent/GB1334128A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DE2136439B2 (de) | 1976-03-11 |
| JPS5128465B1 (enExample) | 1976-08-19 |
| DE2136439A1 (de) | 1972-03-02 |
| US3671748A (en) | 1972-06-20 |
| FR2107046A5 (enExample) | 1972-05-05 |
| GB1334128A (en) | 1973-10-17 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| BB | A search report has been drawn up | ||
| BC | A request for examination has been filed | ||
| CNR | Transfer of rights (patent application after its laying open for public inspection) |
Free format text: APPLIED MATERIALS, INC. |
|
| A85 | Still pending on 85-01-01 | ||
| BV | The patent application has lapsed |