NL7108719A - - Google Patents
Info
- Publication number
- NL7108719A NL7108719A NL7108719A NL7108719A NL7108719A NL 7108719 A NL7108719 A NL 7108719A NL 7108719 A NL7108719 A NL 7108719A NL 7108719 A NL7108719 A NL 7108719A NL 7108719 A NL7108719 A NL 7108719A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Microscoopes, Condenser (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB3145670 | 1970-06-29 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL7108719A true NL7108719A (xx) | 1971-12-31 |
Family
ID=10323351
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL7108719A NL7108719A (xx) | 1970-06-29 | 1971-06-24 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3727051A (xx) |
| DE (1) | DE2131268A1 (xx) |
| GB (1) | GB1304944A (xx) |
| NL (1) | NL7108719A (xx) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2206542B1 (xx) * | 1972-11-15 | 1976-10-29 | Thomson Csf | |
| JPS55104057A (en) * | 1979-02-02 | 1980-08-09 | Hitachi Ltd | Ion implantation device |
| JPH01110204A (ja) * | 1987-10-23 | 1989-04-26 | Jeol Ltd | 電子顕微鏡用走査トンネル顕微鏡 |
| US5179280A (en) * | 1990-10-12 | 1993-01-12 | Chi & Associated Inc. | Computer control of the electron microscope sample stage |
| US5481111A (en) * | 1994-01-03 | 1996-01-02 | Philips Electronics North America Corporation | Electron microscope having a goniometer controlled from the image frame of reference |
| US20110017922A1 (en) * | 2009-07-24 | 2011-01-27 | Omniprobe, Inc. | Variable-tilt tem specimen holder for charged-particle beam instruments |
| JP5581851B2 (ja) * | 2009-12-25 | 2014-09-03 | ソニー株式会社 | ステージ制御装置、ステージ制御方法、ステージ制御プログラム及び顕微鏡 |
| JP5403560B2 (ja) * | 2010-11-17 | 2014-01-29 | コリア ベイシック サイエンス インスティテュート | 透過電子顕微鏡の、３方向以上から試片を観察し分析するための３軸駆動が可能な試片ホルダー |
| USD794816S1 (en) * | 2013-10-24 | 2017-08-15 | Hitachi High-Technologies Corporation | Sample holder for an electron microscope |
| JP6622056B2 (ja) * | 2015-10-23 | 2019-12-18 | 日本電子株式会社 | 検出装置および荷電粒子線装置 |
| US9739994B1 (en) | 2016-12-09 | 2017-08-22 | William A. Loeb | Methods and apparatus for reacquiring a target on a microscope slide |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB646019A (en) * | 1946-01-05 | 1950-11-15 | Philips Nv | Improvements in or relating to electron microscopes |
| US3240934A (en) * | 1962-02-14 | 1966-03-15 | Jeol Ltd | Specimen holding device with means to tilt, rotate and shift the specimen |
-
1970
- 1970-06-29 GB GB3145670A patent/GB1304944A/en not_active Expired
-
1971
- 1971-06-22 US US00155474A patent/US3727051A/en not_active Expired - Lifetime
- 1971-06-24 DE DE19712131268 patent/DE2131268A1/de active Pending
- 1971-06-24 NL NL7108719A patent/NL7108719A/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| GB1304944A (xx) | 1973-01-31 |
| DE2131268A1 (de) | 1972-01-05 |
| US3727051A (en) | 1973-04-10 |