NL7105978A - - Google Patents
Info
- Publication number
- NL7105978A NL7105978A NL7105978A NL7105978A NL7105978A NL 7105978 A NL7105978 A NL 7105978A NL 7105978 A NL7105978 A NL 7105978A NL 7105978 A NL7105978 A NL 7105978A NL 7105978 A NL7105978 A NL 7105978A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/2055—Analysing diffraction patterns
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06G—ANALOGUE COMPUTERS
- G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
- G06G7/48—Analogue computers for specific processes, systems or devices, e.g. simulators
- G06G7/75—Analogue computers for specific processes, systems or devices, e.g. simulators for component analysis, e.g. of mixtures, of colours
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
Priority Applications (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7105978A NL7105978A (de) | 1971-04-30 | 1971-04-30 | |
DE2217501A DE2217501C3 (de) | 1971-04-30 | 1972-04-12 | Vorrichtung zur Aufzeichnung von Diffraktogrammen |
US00245784A US3800081A (en) | 1971-04-30 | 1972-04-20 | Device for recording diffraction images |
AU41532/72A AU464230B2 (en) | 1971-04-30 | 1972-04-26 | Device for recording diffraction images |
IT68308/72A IT954785B (it) | 1971-04-30 | 1972-04-27 | Dispositivo per la registrazione delle immagini di diffrazione |
GB1955672A GB1393591A (en) | 1971-04-30 | 1972-04-27 | Apparatus for processing image information |
CA140,711,A CA951019A (en) | 1971-04-30 | 1972-04-27 | Device for recording diffraction images |
CH630172A CH553978A (de) | 1971-04-30 | 1972-04-27 | Vorrichtung zur darstellung und verarbeitung der bildinformation eines zentrische symmetrie aufweisenden diagramms. |
SE7205562A SE376112B (de) | 1971-04-30 | 1972-04-27 | |
JP4322772A JPS5332676B1 (de) | 1971-04-30 | 1972-04-28 | |
FR7215204A FR2134640B1 (de) | 1971-04-30 | 1972-04-28 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL7105978A NL7105978A (de) | 1971-04-30 | 1971-04-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
NL7105978A true NL7105978A (de) | 1972-11-01 |
Family
ID=19813061
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7105978A NL7105978A (de) | 1971-04-30 | 1971-04-30 |
Country Status (11)
Country | Link |
---|---|
US (1) | US3800081A (de) |
JP (1) | JPS5332676B1 (de) |
AU (1) | AU464230B2 (de) |
CA (1) | CA951019A (de) |
CH (1) | CH553978A (de) |
DE (1) | DE2217501C3 (de) |
FR (1) | FR2134640B1 (de) |
GB (1) | GB1393591A (de) |
IT (1) | IT954785B (de) |
NL (1) | NL7105978A (de) |
SE (1) | SE376112B (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2132343A (en) * | 1982-12-07 | 1984-07-04 | Bicc Plc | Monitoring an electric cable core |
PL338538A1 (en) * | 2000-02-20 | 2001-08-27 | Krzysztof Grzelakowski | Emission-type electron microscope |
JP3867524B2 (ja) * | 2001-07-05 | 2007-01-10 | 株式会社日立製作所 | 電子線を用いた観察装置及び観察方法 |
JP5034295B2 (ja) * | 2006-03-31 | 2012-09-26 | 富士通株式会社 | 応力測定方法及び装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2510070A (en) * | 1945-05-18 | 1950-06-06 | Farnsworth Res Corp | Television scanning system |
US2674917A (en) * | 1951-03-06 | 1954-04-13 | Gen Electric | Noncontacting width gauge |
FR1098908A (fr) * | 1952-01-25 | 1955-08-26 | Thomson Houston Comp Francaise | Perfectionnements aux intégrateurs linéaires |
US3411030A (en) * | 1967-01-20 | 1968-11-12 | Bunker Ramo | Apparatus for generating crt deflection signals for describing a circular pattern |
-
1971
- 1971-04-30 NL NL7105978A patent/NL7105978A/xx unknown
-
1972
- 1972-04-12 DE DE2217501A patent/DE2217501C3/de not_active Expired
- 1972-04-20 US US00245784A patent/US3800081A/en not_active Expired - Lifetime
- 1972-04-26 AU AU41532/72A patent/AU464230B2/en not_active Expired
- 1972-04-27 IT IT68308/72A patent/IT954785B/it active
- 1972-04-27 GB GB1955672A patent/GB1393591A/en not_active Expired
- 1972-04-27 CA CA140,711,A patent/CA951019A/en not_active Expired
- 1972-04-27 CH CH630172A patent/CH553978A/de not_active IP Right Cessation
- 1972-04-27 SE SE7205562A patent/SE376112B/xx unknown
- 1972-04-28 FR FR7215204A patent/FR2134640B1/fr not_active Expired
- 1972-04-28 JP JP4322772A patent/JPS5332676B1/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
FR2134640B1 (de) | 1977-08-26 |
IT954785B (it) | 1973-09-15 |
AU4153272A (en) | 1973-11-01 |
SE376112B (de) | 1975-05-05 |
FR2134640A1 (de) | 1972-12-08 |
CH553978A (de) | 1974-09-13 |
DE2217501B2 (de) | 1978-03-02 |
US3800081A (en) | 1974-03-26 |
AU464230B2 (en) | 1975-08-21 |
CA951019A (en) | 1974-07-09 |
GB1393591A (en) | 1975-05-07 |
DE2217501C3 (de) | 1978-10-19 |
DE2217501A1 (de) | 1972-11-09 |
JPS5332676B1 (de) | 1978-09-09 |