NL6913045A - - Google Patents
Info
- Publication number
- NL6913045A NL6913045A NL6913045A NL6913045A NL6913045A NL 6913045 A NL6913045 A NL 6913045A NL 6913045 A NL6913045 A NL 6913045A NL 6913045 A NL6913045 A NL 6913045A NL 6913045 A NL6913045 A NL 6913045A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19681789019 DE1789019B1 (en) | 1968-09-23 | 1968-09-23 | METHOD OF GENERATING A STEREO IMAGE BY USING ELECTRON BEAM MICROSCOPY |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL6913045A true NL6913045A (en) | 1970-03-25 |
Family
ID=5706761
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL6913045A NL6913045A (en) | 1968-09-23 | 1969-08-26 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US3629577A (en) |
| CH (2) | CH508213A (en) |
| DE (1) | DE1789019B1 (en) |
| FR (1) | FR2018682A1 (en) |
| GB (1) | GB1274252A (en) |
| NL (1) | NL6913045A (en) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3993909A (en) * | 1973-03-16 | 1976-11-23 | U.S. Philips Corporation | Substrate holder for etching thin films |
| US4128765A (en) * | 1976-10-29 | 1978-12-05 | Joseph Franks | Ion beam machining techniques and apparatus |
| US4587431A (en) * | 1983-04-22 | 1986-05-06 | Jeol Ltd. | Specimen manipulating mechanism for charged-particle beam instrument |
| DE8328167U1 (en) * | 1983-09-30 | 1986-04-10 | Siemens AG, 1000 Berlin und 8000 München | Sample holder for secondary ion mass spectrometry and other sensitive particle beam analysis methods |
| JPS625548A (en) * | 1985-07-01 | 1987-01-12 | Hitachi Ltd | Ion beam processing device |
| NL8803101A (en) * | 1988-12-19 | 1990-07-16 | Philips Nv | OBJECT HOLDER FOR POSITIONING AN OBJECT IN A BEAM. |
| NL8803153A (en) * | 1988-12-23 | 1990-07-16 | Philips Nv | ELECTRON BUNDLE DEVICE WITH DYNAMIC FOCUSING. |
| US4975586A (en) * | 1989-02-28 | 1990-12-04 | Eaton Corporation | Ion implanter end station |
| JP3133307B2 (en) * | 1989-10-13 | 2001-02-05 | 株式会社日立製作所 | electronic microscope |
| DE4140710A1 (en) * | 1991-12-10 | 1993-06-17 | Integrated Circuit Testing | POSITIONING SYSTEM |
| US5337178A (en) * | 1992-12-23 | 1994-08-09 | International Business Machines Corporation | Titlable optical microscope stage |
| US5481111A (en) * | 1994-01-03 | 1996-01-02 | Philips Electronics North America Corporation | Electron microscope having a goniometer controlled from the image frame of reference |
| US5734164A (en) * | 1996-11-26 | 1998-03-31 | Amray, Inc. | Charged particle apparatus having a canted column |
| IT247963Y1 (en) * | 1999-12-23 | 2002-09-20 | Fiat Auto Spa | ACCESSORY SAMPLE HOLDER DEVICE, FOR STEREOSCOPIC ANALYSIS. ELECTRONIC SCANNING MICROSCOPE. |
| EP1158563A1 (en) * | 2000-05-22 | 2001-11-28 | Advantest Corporation | Particle beam system |
| DE102010021534A1 (en) * | 2010-05-19 | 2011-11-24 | Eberhard-Karls-Universität Tübingen Universitätsklinikum | Direct investigation of biological material ex vivo |
| US20120043712A1 (en) * | 2010-08-17 | 2012-02-23 | Varian Semiconductor Equipment Associates, Inc. | Mechanism and method for aligning a workpiece to a shadow mask |
| US9720220B2 (en) * | 2015-03-11 | 2017-08-01 | University Of Manitoba | Tomography accessory device for microscopes |
| US9921400B2 (en) * | 2015-12-17 | 2018-03-20 | City University Of Hong Kong | System and method for manipulating an object for imaging |
| CN108626546A (en) * | 2018-08-10 | 2018-10-09 | 韶关旭日国际有限公司 | A kind of Universal rotary holder |
| CN110993475B (en) * | 2019-12-05 | 2020-08-28 | 山东省分析测试中心 | Scanning electron microscope universal rotating sample table for fracture analysis and scanning electron microscope |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2360677A (en) * | 1941-11-21 | 1944-10-17 | Rca Corp | Object support for electron microscopes |
| DE1226228B (en) * | 1959-07-24 | 1966-10-06 | Max Planck Gesellschaft | Movable preparation table for a body beam apparatus, in particular an electron microscope or electron diffraction device |
| DE1539063C3 (en) * | 1965-03-06 | 1974-07-04 | Ugo Prof. Bologna Valdre (Italien) | Preparation cartridge for electron microscopes with slide carrier that can be tilted in all directions |
-
1968
- 1968-09-23 DE DE19681789019 patent/DE1789019B1/en active Pending
-
1969
- 1969-08-26 NL NL6913045A patent/NL6913045A/xx unknown
- 1969-09-15 CH CH1389669A patent/CH508213A/en not_active IP Right Cessation
- 1969-09-15 CH CH1389769A patent/CH514840A/en not_active IP Right Cessation
- 1969-09-22 GB GB46673/69A patent/GB1274252A/en not_active Expired
- 1969-09-22 US US859791A patent/US3629577A/en not_active Expired - Lifetime
- 1969-09-23 FR FR6932347A patent/FR2018682A1/fr not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| CH514840A (en) | 1971-10-31 |
| FR2018682A1 (en) | 1970-06-26 |
| US3629577A (en) | 1971-12-21 |
| DE1789019B1 (en) | 1972-04-27 |
| GB1274252A (en) | 1972-05-17 |
| CH508213A (en) | 1971-05-31 |