NL6811898A - - Google Patents

Info

Publication number
NL6811898A
NL6811898A NL6811898A NL6811898A NL6811898A NL 6811898 A NL6811898 A NL 6811898A NL 6811898 A NL6811898 A NL 6811898A NL 6811898 A NL6811898 A NL 6811898A NL 6811898 A NL6811898 A NL 6811898A
Authority
NL
Netherlands
Application number
NL6811898A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of NL6811898A publication Critical patent/NL6811898A/xx

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2215Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test error correction or detection circuits
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • GPHYSICS
    • G07CHECKING-DEVICES
    • G07CTIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G07C3/14Quality control systems

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Automation & Control Theory (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Circuit Breakers, Generators, And Electric Motors (AREA)
  • Testing And Monitoring For Control Systems (AREA)
NL6811898A 1967-08-22 1968-08-21 NL6811898A (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US66236067A 1967-08-22 1967-08-22
US1891770A 1970-03-12 1970-03-12

Publications (1)

Publication Number Publication Date
NL6811898A true NL6811898A (de) 1969-02-25

Family

ID=26691651

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6811898A NL6811898A (de) 1967-08-22 1968-08-21

Country Status (6)

Country Link
US (2) US3541440A (de)
BE (1) BE719765A (de)
DE (1) DE1766985B1 (de)
FR (1) FR1579183A (de)
GB (1) GB1210289A (de)
NL (1) NL6811898A (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1263644A (en) * 1969-08-07 1972-02-16 Olivetti & Co Spa Apparatus for automatically testing electronic circuits
JPS566134A (en) * 1979-06-28 1981-01-22 Nissan Motor Co Ltd Diagnostic unit of controller for car
US5489843A (en) * 1991-07-23 1996-02-06 Vlsi Technology, Inc. Apparatus and method for testing the calibration of electronic package lead inspection system
US5448164A (en) * 1992-12-24 1995-09-05 Delco Electronics Corp. Electrical test apparatus and method of checking the apparatus
US5903146A (en) * 1993-03-17 1999-05-11 Delta Electronics, Inc. Distributing test system and method
US5488292A (en) * 1993-10-04 1996-01-30 Tokyo Seimitsu Co., Ltd. Wafer inspecting system
US5457390A (en) * 1993-12-13 1995-10-10 Northern Telecom Limited Circuit board manufacture
US5589765A (en) * 1995-01-04 1996-12-31 Texas Instruments Incorporated Method for final testing of semiconductor devices
JP3382059B2 (ja) * 1995-04-28 2003-03-04 株式会社アドバンテスト 半導体試験装置
KR100187727B1 (ko) * 1996-02-29 1999-06-01 윤종용 처리기 접촉 불량을 확인할 수 있는 접촉 점검 장치 및 이를 내장한 집적회로 소자 검사 시스템
US6025708A (en) * 1997-11-26 2000-02-15 Hewlett Packard Company System for verifying signal voltage level accuracy on a digital testing device
EP2379308B1 (de) 2009-01-20 2017-06-28 Gerald Rocha Verfahren und vorrichtung zur herstellung von hakenbefestigern
ES2592683T3 (es) 2010-07-16 2016-12-01 Gerald Rocha Tira de fijador por contacto dimensionalmente flexible
DE102013202975B4 (de) * 2013-02-22 2015-02-05 Korsch Ag Einzelsortiervorrichtung zur sortierung von tabletten, system mit einer solchen einzelsortiervorrichtung und mit einer tablettiervorrichtung und verfahren zur überprüfung einer einzelsortiervorrichtung

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE943575C (de) * 1952-06-28 1956-05-24 Licentia Gmbh Verfahren zur Selbstsicherung fotoelektrischer Schutz- und Steuer-Einrichtungen
US2848681A (en) * 1953-06-26 1958-08-19 Western Electric Co Simulated relay
US2996659A (en) * 1957-12-16 1961-08-15 Hughes Aircraft Co Method and apparatus for testing electron tubes
US3039604A (en) * 1959-09-10 1962-06-19 Texas Instruments Inc Centralized automatic tester for semiconductor units
US3237100A (en) * 1960-06-24 1966-02-22 Chalfin Albert Computer-controlled test apparatus for composite electrical and electronic equipment
US3235797A (en) * 1961-04-03 1966-02-15 Philco Corp Record controlled test set and magazine therefor having frangible finger encoding means
GB1082805A (en) * 1964-03-27 1967-09-13 Forte Engineering Corp Improvements in or relating to the measurement of selective capacitivity related to characteristics of materials

Also Published As

Publication number Publication date
FR1579183A (de) 1969-08-22
DE1766985B1 (de) 1972-03-09
GB1210289A (en) 1970-10-28
BE719765A (de) 1969-02-03
US3541440A (en) 1970-11-17
US3665504A (en) 1972-05-23

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