NL6806335A - - Google Patents

Info

Publication number
NL6806335A
NL6806335A NL6806335A NL6806335A NL6806335A NL 6806335 A NL6806335 A NL 6806335A NL 6806335 A NL6806335 A NL 6806335A NL 6806335 A NL6806335 A NL 6806335A NL 6806335 A NL6806335 A NL 6806335A
Authority
NL
Netherlands
Application number
NL6806335A
Other versions
NL150617B (nl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from FR105259A external-priority patent/FR1529768A/fr
Application filed filed Critical
Publication of NL6806335A publication Critical patent/NL6806335A/xx
Publication of NL150617B publication Critical patent/NL150617B/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
    • H01J37/304—Controlling tubes by information coming from the objects or from the beam, e.g. correction signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL686806335A 1967-05-05 1968-05-03 Werkwijze voor het thermisch behandelen van een materiaal door elektronenbombardement. NL150617B (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR105259A FR1529768A (fr) 1967-05-05 1967-05-05 Procédé et appareillage pour le contrôle de l'élaboration thermique d'un matériau dans une enceinte
FR147120 1968-04-05

Publications (2)

Publication Number Publication Date
NL6806335A true NL6806335A (enrdf_load_stackoverflow) 1968-11-06
NL150617B NL150617B (nl) 1976-08-16

Family

ID=26176186

Family Applications (1)

Application Number Title Priority Date Filing Date
NL686806335A NL150617B (nl) 1967-05-05 1968-05-03 Werkwijze voor het thermisch behandelen van een materiaal door elektronenbombardement.

Country Status (6)

Country Link
US (1) US3585385A (enrdf_load_stackoverflow)
CH (1) CH476995A (enrdf_load_stackoverflow)
DE (1) DE1765323B1 (enrdf_load_stackoverflow)
FR (1) FR1569830A (enrdf_load_stackoverflow)
GB (1) GB1224233A (enrdf_load_stackoverflow)
NL (1) NL150617B (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3780256A (en) * 1972-08-08 1973-12-18 Atomic Energy Commission Method for producing spike-free electron beam partial penetration welds
US4348576A (en) * 1979-01-12 1982-09-07 Steigerwald Strahltechnik Gmbh Position regulation of a charge carrier beam
US4659437A (en) * 1985-01-19 1987-04-21 Tokusen Kogyo Kabushiki Kaisha Method of thermal diffusion alloy plating for steel wire on continuous basis
US6777676B1 (en) * 2002-07-05 2004-08-17 Kla-Tencor Technologies Corporation Non-destructive root cause analysis on blocked contact or via

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3103584A (en) * 1963-09-10 Electron microanalyzer system
US3080481A (en) * 1959-04-17 1963-03-05 Sprague Electric Co Method of making transistors
US3204095A (en) * 1960-12-21 1965-08-31 Hitachi Ltd Electron probe microanalyzer with means to eliminate the effect of surface irregularities
NL289708A (enrdf_load_stackoverflow) * 1962-03-05
US3196246A (en) * 1962-11-29 1965-07-20 Rca Corp Means for observing a workpiece in electron beam machining apparatus
BE634419A (enrdf_load_stackoverflow) * 1963-07-02 1964-01-02
DE1245613B (de) * 1964-04-01 1967-07-27 Ass Sans But Lucratif Spektrometer, bestehend aus einem Hochvakuumbehaelter mit einer von einer schraegen Ebene umrandeten OEffnung

Also Published As

Publication number Publication date
NL150617B (nl) 1976-08-16
US3585385A (en) 1971-06-15
DE1765323B1 (de) 1972-04-27
CH476995A (fr) 1969-08-15
GB1224233A (en) 1971-03-03
FR1569830A (enrdf_load_stackoverflow) 1969-06-06

Similar Documents

Publication Publication Date Title
AU5765369A (enrdf_load_stackoverflow)
AU342066A (enrdf_load_stackoverflow)
AU2277767A (enrdf_load_stackoverflow)
AU2454867A (enrdf_load_stackoverflow)
AU2116667A (enrdf_load_stackoverflow)
AU610966A (enrdf_load_stackoverflow)
AU3189468A (enrdf_load_stackoverflow)
AU2977667A (enrdf_load_stackoverflow)
AU2256867A (enrdf_load_stackoverflow)
AU2528767A (enrdf_load_stackoverflow)
BE426053A (enrdf_load_stackoverflow)
BE609869A (enrdf_load_stackoverflow)
AU25066A (enrdf_load_stackoverflow)
AU23366A (enrdf_load_stackoverflow)
BE711309A (enrdf_load_stackoverflow)
AU3054676A (enrdf_load_stackoverflow)
AU1868267A (enrdf_load_stackoverflow)
AU1763766A (enrdf_load_stackoverflow)
NL6806335A (enrdf_load_stackoverflow)
AU408412B2 (enrdf_load_stackoverflow)
AU1677166A (enrdf_load_stackoverflow)
AU1614766A (enrdf_load_stackoverflow)
AU97666A (enrdf_load_stackoverflow)
BE162295A (enrdf_load_stackoverflow)
BE711138A (enrdf_load_stackoverflow)

Legal Events

Date Code Title Description
V1 Lapsed because of non-payment of the annual fee
NL80 Abbreviated name of patent owner mentioned of already nullified patent

Owner name: O N E R A