NL6515207A - - Google Patents

Info

Publication number
NL6515207A
NL6515207A NL6515207A NL6515207A NL6515207A NL 6515207 A NL6515207 A NL 6515207A NL 6515207 A NL6515207 A NL 6515207A NL 6515207 A NL6515207 A NL 6515207A NL 6515207 A NL6515207 A NL 6515207A
Authority
NL
Netherlands
Application number
NL6515207A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to NL6515207A priority Critical patent/NL6515207A/xx
Priority to DE19661497539 priority patent/DE1497539A1/de
Priority to CH1664366A priority patent/CH470651A/de
Priority to SE15924/66A priority patent/SE332721B/xx
Priority to GB52258/66A priority patent/GB1138225A/en
Priority to BE690100D priority patent/BE690100A/xx
Priority to FR84861A priority patent/FR1502280A/fr
Publication of NL6515207A publication Critical patent/NL6515207A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02097Self-interferometers
    • G01B9/02098Shearing interferometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/45Multiple detectors for detecting interferometer signals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
NL6515207A 1965-11-24 1965-11-24 NL6515207A (fr)

Priority Applications (7)

Application Number Priority Date Filing Date Title
NL6515207A NL6515207A (fr) 1965-11-24 1965-11-24
DE19661497539 DE1497539A1 (de) 1965-11-24 1966-11-19 Optisches Interferometer mit einem optischen Element,welches das von einer Quelle herruehrende Strahlungsbuendel in raeumlich getrennte Teilbuendel teilt
CH1664366A CH470651A (de) 1965-11-24 1966-11-21 Optisches Interferometer mit einem optischen Element, welches das von einer Quelle herrührende Strahlungsbündel in räumlich getrennte Teilbundel teilt
SE15924/66A SE332721B (fr) 1965-11-24 1966-11-21
GB52258/66A GB1138225A (en) 1965-11-24 1966-11-22 Improvements in or relating to optical interferometers
BE690100D BE690100A (fr) 1965-11-24 1966-11-23
FR84861A FR1502280A (fr) 1965-11-24 1966-11-24 Interféromètre optique

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL6515207A NL6515207A (fr) 1965-11-24 1965-11-24

Publications (1)

Publication Number Publication Date
NL6515207A true NL6515207A (fr) 1967-05-25

Family

ID=19794724

Family Applications (1)

Application Number Title Priority Date Filing Date
NL6515207A NL6515207A (fr) 1965-11-24 1965-11-24

Country Status (7)

Country Link
BE (1) BE690100A (fr)
CH (1) CH470651A (fr)
DE (1) DE1497539A1 (fr)
FR (1) FR1502280A (fr)
GB (1) GB1138225A (fr)
NL (1) NL6515207A (fr)
SE (1) SE332721B (fr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2082403A5 (fr) * 1970-03-13 1971-12-10 Thomson Csf
DE3031961C2 (de) * 1980-08-25 1985-02-07 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Interferometrische Einrichtung zur Messung physikalischer Größen
US4647196A (en) * 1981-01-20 1987-03-03 Hitachi Metals, Ltd. Surface flaw detection method
US5872629A (en) * 1997-06-23 1999-02-16 Charles Evans & Associates Analytical depth monitor utilizing differential interferometric analysis
CN116448243B (zh) * 2023-06-19 2023-09-22 中国工程物理研究院激光聚变研究中心 一种基于交叉偏振波的三维光场自参考测量装置及方法

Also Published As

Publication number Publication date
SE332721B (fr) 1971-02-15
BE690100A (fr) 1967-05-23
CH470651A (de) 1969-03-31
GB1138225A (en) 1968-12-27
FR1502280A (fr) 1967-11-18
DE1497539A1 (de) 1969-03-27
DE1497539B2 (fr) 1975-07-03

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