NL6406437A - - Google Patents
Info
- Publication number
- NL6406437A NL6406437A NL6406437A NL6406437A NL6406437A NL 6406437 A NL6406437 A NL 6406437A NL 6406437 A NL6406437 A NL 6406437A NL 6406437 A NL6406437 A NL 6406437A NL 6406437 A NL6406437 A NL 6406437A
- Authority
- NL
- Netherlands
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| SE633963 | 1963-06-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL6406437A true NL6406437A (xx) | 1964-12-08 |
Family
ID=20268425
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL6406437A NL6406437A (xx) | 1963-06-07 | 1964-06-05 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US3402292A (xx) |
| DE (1) | DE1245174B (xx) |
| GB (1) | GB1069754A (xx) |
| NL (1) | NL6406437A (xx) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5111429Y1 (xx) * | 1969-03-29 | 1976-03-27 | ||
| JPS515316B1 (xx) * | 1969-09-25 | 1976-02-19 | ||
| US3801785A (en) * | 1972-11-01 | 1974-04-02 | Raytheon Co | Spatially modulated imaging system |
| US3860817A (en) * | 1973-08-10 | 1975-01-14 | Gen Electric | Reducing patient X-ray dose during fluoroscopy with an image system |
| US4499591A (en) * | 1982-11-17 | 1985-02-12 | Gary Hartwell | Fluoroscopic filtering |
| NL8400845A (nl) * | 1984-03-16 | 1985-10-16 | Optische Ind De Oude Delft Nv | Inrichting voor spleetradiografie. |
| US5778041A (en) * | 1983-10-13 | 1998-07-07 | Honeywell-Measurex Corporation | System and process for measuring ash in paper |
| DE3500812A1 (de) * | 1985-01-11 | 1986-07-17 | Siemens AG, 1000 Berlin und 8000 München | Roentgendiagnostikeinrichtung mit halbtransparenter blende |
| US4860329A (en) * | 1986-02-24 | 1989-08-22 | Upa Technology, Inc. | X-ray fluorescence thickness measuring device |
| US4987582A (en) * | 1989-10-19 | 1991-01-22 | Hughes Aircraft Company | X-ray fluorescence imaging of elements |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3079499A (en) * | 1959-06-19 | 1963-02-26 | Hilger & Watts Ltd | X-ray beam intensity responsive sequential spectrometer |
| US3218458A (en) * | 1960-02-29 | 1965-11-16 | Picker X Ray Corp | Diffractometer |
-
1964
- 1964-06-02 US US372049A patent/US3402292A/en not_active Expired - Lifetime
- 1964-06-03 GB GB23010/64A patent/GB1069754A/en not_active Expired
- 1964-06-05 NL NL6406437A patent/NL6406437A/xx unknown
- 1964-06-05 DE DEB77118A patent/DE1245174B/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US3402292A (en) | 1968-09-17 |
| DE1245174B (de) | 1967-07-20 |
| GB1069754A (en) | 1967-05-24 |