NL270945A - - Google Patents
Info
- Publication number
- NL270945A NL270945A NL270945DA NL270945A NL 270945 A NL270945 A NL 270945A NL 270945D A NL270945D A NL 270945DA NL 270945 A NL270945 A NL 270945A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
- H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Details Of Television Scanning (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US92889A US3235727A (en) | 1961-03-02 | 1961-03-02 | Electron probe system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL270945A true NL270945A (cg-RX-API-DMAC7.html) |
Family
ID=22235657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL270945D NL270945A (cg-RX-API-DMAC7.html) | 1961-03-02 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3235727A (cg-RX-API-DMAC7.html) |
| GB (1) | GB1000560A (cg-RX-API-DMAC7.html) |
| NL (1) | NL270945A (cg-RX-API-DMAC7.html) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1299498B (de) * | 1964-07-24 | 1969-07-17 | Steigerwald Strahltech | Vorrichtung zur UEberwachung des Strahlauftreffbereichs in Korpuskularstrahl-Bearbeitungsgeraeten |
| US3337729A (en) * | 1964-11-27 | 1967-08-22 | Richard E Thomas | Method and apparatus for investigating variations in surface work function by electron beam scanning |
| US3435211A (en) * | 1966-01-04 | 1969-03-25 | Stanford Research Inst | Gaseous glow discharge tube with cathode means surrounding anode means |
| US3341704A (en) * | 1966-02-07 | 1967-09-12 | Richard E Thomas | System for investigating work function distribution and field distribution of a surface by electron beam scanning |
| US3488494A (en) * | 1967-06-15 | 1970-01-06 | Atomic Energy Commission | Ion microscope the image of which represents the intensity of secondary radiation as a function of the position of the primary ions causing the radiation |
| US3502870A (en) * | 1967-07-05 | 1970-03-24 | Hitachi Ltd | Apparatus for simultaneously displaying a plurality of images of an object being analyzed in an electron beam device |
| US3614311A (en) * | 1968-02-28 | 1971-10-19 | Hitachi Ltd | Apparatus for simultaneously displaying a plurality of images of an object being analyzed in an electron beam device |
| JPS515315B1 (cg-RX-API-DMAC7.html) * | 1969-05-16 | 1976-02-19 | ||
| JPS5034439B1 (cg-RX-API-DMAC7.html) * | 1969-05-16 | 1975-11-08 | ||
| GB1280013A (en) * | 1969-09-05 | 1972-07-05 | Atomic Energy Authority Uk | Improvements in or relating to apparatus bombarding a target with ions |
| US3761676A (en) * | 1971-05-20 | 1973-09-25 | Farland G Mc | Portable electron beam welding apparatus |
| US3986027A (en) * | 1975-04-07 | 1976-10-12 | American Optical Corporation | Stereo scanning microprobe |
| US4214267A (en) * | 1977-11-23 | 1980-07-22 | Roese John A | Stereofluoroscopy system |
| JPH0238850A (ja) * | 1988-07-28 | 1990-02-08 | Jeol Ltd | Ｘ線分光器を用いた定性分析方法 |
| US6826255B2 (en) * | 2003-03-26 | 2004-11-30 | General Electric Company | X-ray inspection system and method of operating |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2418029A (en) * | 1943-10-08 | 1947-03-25 | Rca Corp | Electron probe analysis employing X-ray spectrography |
| US2439324A (en) * | 1945-08-01 | 1948-04-06 | Us Sec War | Electrical circuit |
| US2916621A (en) * | 1958-04-24 | 1959-12-08 | California Inst Res Found | Electron probe microanalyzer |
| US2914697A (en) * | 1959-04-08 | 1959-11-24 | Vernon L Smith | Time calibrated oscilloscope sweep circuit |
-
0
- NL NL270945D patent/NL270945A/xx unknown
-
1961
- 1961-03-02 US US92889A patent/US3235727A/en not_active Expired - Lifetime
- 1961-09-29 GB GB35345/61A patent/GB1000560A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1000560A (en) | 1965-08-04 |
| US3235727A (en) | 1966-02-15 |