NL246011A - - Google Patents
Info
- Publication number
- NL246011A NL246011A NL246011DA NL246011A NL 246011 A NL246011 A NL 246011A NL 246011D A NL246011D A NL 246011DA NL 246011 A NL246011 A NL 246011A
- Authority
- NL
- Netherlands
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/21—Means for adjusting the focus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Electron Tubes For Measurement (AREA)
- Measurement Of Radiation (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Image-Pickup Tubes, Image-Amplification Tubes, And Storage Tubes (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DES61313A DE1108347B (de) | 1959-01-14 | 1959-01-14 | Verfahren zur Scharfstellung des Bildes eines Elektronenmikroskops und Anordnung zur Durchfuehrung des Verfahrens |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NL246011A true NL246011A (en:Method) |
Family
ID=7494761
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NL246011D NL246011A (en:Method) | 1959-01-14 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US2991361A (en:Method) |
| DE (1) | DE1108347B (en:Method) |
| GB (1) | GB912986A (en:Method) |
| NL (1) | NL246011A (en:Method) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3134899A (en) * | 1960-08-23 | 1964-05-26 | Zeiss Jena Veb Carl | Intensity measuring and/or recording devices for corpuscular radiation apparatus, particularly electron microscopes |
| US3644700A (en) * | 1969-12-15 | 1972-02-22 | Ibm | Method and apparatus for controlling an electron beam |
| US3917946A (en) * | 1972-04-12 | 1975-11-04 | Philips Corp | Electron-optical device for the recording of selected diffraction patterns |
| US4962309A (en) * | 1989-08-21 | 1990-10-09 | Rockwell International Corporation | Magnetic optics adaptive technique |
| JPH05109378A (ja) * | 1991-10-15 | 1993-04-30 | Hitachi Ltd | 電子顕微像観察方法及び装置 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2464396A (en) * | 1948-01-30 | 1949-03-15 | Rca Corp | Art of focusing electron microscopes, etc. |
| US2561988A (en) * | 1949-06-30 | 1951-07-24 | Westinghouse Electric Corp | Electron diffraction detector system |
| US2660669A (en) * | 1950-03-16 | 1953-11-24 | Raytheon Mfg Co | Electron discharge device |
-
0
- NL NL246011D patent/NL246011A/xx unknown
-
1959
- 1959-01-14 DE DES61313A patent/DE1108347B/de active Pending
- 1959-12-10 US US858701A patent/US2991361A/en not_active Expired - Lifetime
-
1960
- 1960-01-08 GB GB763/60A patent/GB912986A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| US2991361A (en) | 1961-07-04 |
| DE1108347B (de) | 1961-06-08 |
| GB912986A (en) | 1962-12-12 |