NL217744A - - Google Patents

Info

Publication number: NL217744A
Authority: NL; Netherlands

Application number

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1956-06-01

Publication of NL217744A publication Critical patent/NL217744A/xx

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
- G01N23/20025—Sample holders or supports therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J47/00—Tubes for determining the presence, intensity, density or energy of radiation or particles
- H01J47/06—Proportional counter tubes
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence

Landscapes

Chemical & Material Sciences (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Crystallography & Structural Chemistry (AREA)
Analysing Materials By The Use Of Radiation (AREA)

NL217744D 1956-06-01 NL217744A (xx)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US588898A US2924715A (en)	1956-06-01	1956-06-01	X-ray analysis apparatus

Publications (1)

Publication Number	Publication Date
NL217744A true NL217744A (xx)

Family

ID=24355764

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
NL217744D NL217744A (xx)	1956-06-01

Country Status (4)

Country	Link
US (1)	US2924715A (xx)
DE (1)	DE1068032B (xx)
FR (1)	FR1176408A (xx)
NL (1)	NL217744A (xx)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US3073952A (en) *	1956-09-11	1963-01-15	Gen Electric	X-ray diffraction apparatus
US3084255A (en) *	1958-11-13	1963-04-02	Lab For Electronics Inc	Radiation sensitive system
US3086116A (en) *	1959-03-24	1963-04-16	Sylvania Electric Prod	Apparatus for determining radioactive material ratios
US3052795A (en) *	1959-03-27	1962-09-04	Perkin Elmer Corp	Radiation dispersion system
US3042801A (en) *	1959-12-30	1962-07-03	United States Steel Corp	Apparatus for analyzing a sample of material
DE1288341B (de) *	1960-03-12	1969-01-30	Well Completions Inc	Verfahren und Vorrichtung zum Nachweis von chemischen Elementen in einer aus koernigen Bestandteilen bestehenden Probe
DE1223569B (de) *	1960-09-08	1966-08-25	Commissariat Energie Atomique	Vorrichtung zur Schichtdickenbestimmung durch beta-Bestrahlung und Messung der rueckgestreuten charakteristischen Roentgenstrahlung
US3105902A (en) *	1960-09-19	1963-10-01	Standard Oil Co	Controlled atmosphere X-ray diffraction spectrometer
US3153144A (en) *	1961-02-03	1964-10-13	Applied Res Lab Inc	Position adjustment mechanism and X-ray spectrometer including it
US3100263A (en) *	1962-02-21	1963-08-06	John W Verba	Continuous rotation scattering chamber
US3126479A (en) *	1962-03-01	1964-03-24		X-ray analyzer system with ionization
NL143730B (nl) *	1962-04-19	1974-10-15	Philips Nv	Inrichting voor het meten van ioniserende straling.
US3370167A (en) *	1964-07-13	1968-02-20	American Mach & Foundry	Proton-excited soft x-ray analyzer having a rotatable target for selectively directing the x-rays to different detectors
US3471694A (en) *	1965-03-01	1969-10-07	Philips Electronics & Pharm In	Charge particle barrier consisting of magnetic means for removing electrons from an x-ray beam
US3678274A (en) *	1969-10-29	1972-07-18	President Of Tokyo Univ	Diaphragm-less radioactive radiation counter
CA935568A (en) *	1970-03-20	1973-10-16	Houtman Eliberthus	Device for examining material by x-ray fluorescence
US4417355A (en) *	1981-01-08	1983-11-22	Leningradskoe Npo "Burevestnik"	X-Ray fluorescence spectrometer
US4959848A (en) *	1987-12-16	1990-09-25	Axic Inc.	Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis
JP3950156B1 (ja) *	2006-04-11	2007-07-25	理学電機工業株式会社	蛍光ｘ線分析装置
US20160084778A1 (en) *	2013-02-28	2016-03-24	Mineral Research Society	Method for exanimation of element in living body

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US2516672A (en) *	1944-05-27	1950-07-25	Socony Vacuum Oil Co Inc	Apparatus for measuring radiant energy
US2683220A (en) *	1949-06-04	1954-07-06	Gen Aniline & Film Corp	Spectrograph device
US2602142A (en) *	1949-11-15	1952-07-01	Melpar Inc	X-ray spectrograph

0
- NL NL217744D patent/NL217744A/xx unknown
- DE DENDAT1068032D patent/DE1068032B/de active Pending
1956
- 1956-06-01 US US588898A patent/US2924715A/en not_active Expired - Lifetime
1957
- 1957-06-01 FR FR1176408D patent/FR1176408A/fr not_active Expired

Also Published As

Publication number	Publication date
FR1176408A (fr)	1959-04-10
US2924715A (en)	1960-02-09
DE1068032B (xx)	1959-10-29

Publication	Publication Date	Title
AT197311B (xx)	1958-04-25
AT202855B (xx)	1959-04-10
AT216255B (xx)	1961-07-25
AT199361B (xx)	1958-08-25
AT198114B (xx)	1958-06-10
AT202354B (xx)	1959-03-10
AT202279B (xx)	1959-02-25
AT201309B (xx)	1958-12-27
AT213780B (xx)	1961-02-27
AT195843B (xx)	1958-02-25
AT194202B (xx)	1957-12-27
AT196732B (xx)	1958-03-25
AT197702B (xx)	1958-05-27
AT196778B (xx)	1958-03-25
AT195842B (xx)	1958-02-25
AT197107B (xx)	1958-04-10
AT197110B (xx)	1958-04-10
AT196779B (xx)	1958-03-25
AT194662B (xx)	1958-01-10
AT198038B (xx)	1958-06-10
AT194974B (xx)	1958-01-25
AT198051B (xx)	1958-06-10
AT196060B (xx)	1958-02-25
AT198347B (xx)	1958-06-25
AT198677B (xx)	1958-07-25