NL2032037B1 - Method and equipment for delivering dynamic deformation beam spots by la-icp-ms - Google Patents

Method and equipment for delivering dynamic deformation beam spots by la-icp-ms Download PDF

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Publication number
NL2032037B1
NL2032037B1 NL2032037A NL2032037A NL2032037B1 NL 2032037 B1 NL2032037 B1 NL 2032037B1 NL 2032037 A NL2032037 A NL 2032037A NL 2032037 A NL2032037 A NL 2032037A NL 2032037 B1 NL2032037 B1 NL 2032037B1
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NL
Netherlands
Prior art keywords
sample
icp
module
deformable
deformable piece
Prior art date
Application number
NL2032037A
Other languages
English (en)
Dutch (nl)
Other versions
NL2032037A (en
Inventor
Zhang Li
Yang Yi
Gu Yaya
Dai Zhihui
Liu Jianzhong
Li Yang
Zeng Xiaojia
Li Rui
Ji Jinzhu
Original Assignee
Inst Geochemistry Cas
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Inst Geochemistry Cas filed Critical Inst Geochemistry Cas
Publication of NL2032037A publication Critical patent/NL2032037A/en
Application granted granted Critical
Publication of NL2032037B1 publication Critical patent/NL2032037B1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463Desorption by laser or particle beam, followed by ionisation as a separate step
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/09Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
    • G02B27/0927Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Sampling And Sample Adjustment (AREA)
NL2032037A 2022-02-28 2022-05-31 Method and equipment for delivering dynamic deformation beam spots by la-icp-ms NL2032037B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210184932.0A CN114509493A (zh) 2022-02-28 2022-02-28 La-icp-ms动态变形束斑的测试方法与设备

Publications (2)

Publication Number Publication Date
NL2032037A NL2032037A (en) 2023-09-06
NL2032037B1 true NL2032037B1 (en) 2024-02-16

Family

ID=81553760

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2032037A NL2032037B1 (en) 2022-02-28 2022-05-31 Method and equipment for delivering dynamic deformation beam spots by la-icp-ms

Country Status (2)

Country Link
CN (1) CN114509493A (zh)
NL (1) NL2032037B1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116773507B (zh) * 2023-06-09 2024-01-26 上海凯来仪器有限公司 一种三维激光剥蚀质谱仪、联用检测系统及检测方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109073593B (zh) * 2016-04-18 2021-06-18 株式会社岛津制作所 质谱分析装置

Also Published As

Publication number Publication date
CN114509493A (zh) 2022-05-17
NL2032037A (en) 2023-09-06

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