NL2024861B1 - Method for recording and correlating light and charged particle microscopy images - Google Patents
Method for recording and correlating light and charged particle microscopy images Download PDFInfo
- Publication number
- NL2024861B1 NL2024861B1 NL2024861A NL2024861A NL2024861B1 NL 2024861 B1 NL2024861 B1 NL 2024861B1 NL 2024861 A NL2024861 A NL 2024861A NL 2024861 A NL2024861 A NL 2024861A NL 2024861 B1 NL2024861 B1 NL 2024861B1
- Authority
- NL
- Netherlands
- Prior art keywords
- charged particle
- view
- image
- sample
- images
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/226—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object
- H01J37/228—Optical arrangements for illuminating the object; optical arrangements for collecting light from the object whereby illumination and light collection take place in the same area of the discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/22—Treatment of data
- H01J2237/226—Image reconstruction
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL2024861A NL2024861B1 (en) | 2020-02-07 | 2020-02-07 | Method for recording and correlating light and charged particle microscopy images |
PCT/NL2021/050075 WO2021158111A1 (fr) | 2020-02-07 | 2021-02-05 | Procédé d'enregistrement et de corrélation d'images de microscopie à lumière et à particules chargées |
EP21708080.3A EP4100985A1 (fr) | 2020-02-07 | 2021-02-05 | Procédé d'enregistrement et de corrélation d'images de microscopie à lumière et à particules chargées |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL2024861A NL2024861B1 (en) | 2020-02-07 | 2020-02-07 | Method for recording and correlating light and charged particle microscopy images |
Publications (1)
Publication Number | Publication Date |
---|---|
NL2024861B1 true NL2024861B1 (en) | 2021-09-13 |
Family
ID=70155270
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL2024861A NL2024861B1 (en) | 2020-02-07 | 2020-02-07 | Method for recording and correlating light and charged particle microscopy images |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP4100985A1 (fr) |
NL (1) | NL2024861B1 (fr) |
WO (1) | WO2021158111A1 (fr) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040217297A1 (en) * | 2000-12-01 | 2004-11-04 | Yeda Research And Development Co. Ltd. | Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope |
US20100091362A1 (en) * | 2008-10-15 | 2010-04-15 | Kabushiki Kaisha Topcon | Complex type microscopic device |
US20180053627A1 (en) * | 2011-05-13 | 2018-02-22 | Fibics Incorporated | Microscopy imaging method and system |
-
2020
- 2020-02-07 NL NL2024861A patent/NL2024861B1/en active
-
2021
- 2021-02-05 WO PCT/NL2021/050075 patent/WO2021158111A1/fr unknown
- 2021-02-05 EP EP21708080.3A patent/EP4100985A1/fr active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040217297A1 (en) * | 2000-12-01 | 2004-11-04 | Yeda Research And Development Co. Ltd. | Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope |
US20100091362A1 (en) * | 2008-10-15 | 2010-04-15 | Kabushiki Kaisha Topcon | Complex type microscopic device |
US20180053627A1 (en) * | 2011-05-13 | 2018-02-22 | Fibics Incorporated | Microscopy imaging method and system |
Non-Patent Citations (3)
Title |
---|
NALAN LIV ET AL: "Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy", PLOS ONE, vol. 8, no. 2, 8 February 2013 (2013-02-08), pages e55707, XP055666091, DOI: 10.1371/journal.pone.0055707 * |
SCHORB MARTIN ET AL: "New hardware and workflows for semi-automated correlative cryo-fluorescence and cryo-electron microscopy/tomography", JOURNAL OF STRUCTURAL BIOLOGY, ACADEMIC PRESS, UNITED STATES, vol. 197, no. 2, 28 June 2016 (2016-06-28), pages 83 - 93, XP029894438, ISSN: 1047-8477, DOI: 10.1016/J.JSB.2016.06.020 * |
VAN DRIEL L F ET AL: "Tools for correlative cryo-fluorescence microscopy and cryo-electron tomography applied to whole mitochondria in human endothelial cells", EUROPEAN JOURNAL OF CELL BIOLOGY, WISSENSCHAFLICHE VERLAGSGESELLSCHAFT, STUTTGART, DE, vol. 88, no. 11, 1 November 2009 (2009-11-01), pages 669 - 684, XP026585829, ISSN: 0171-9335, [retrieved on 20090902], DOI: 10.1016/J.EJCB.2009.07.002 * |
Also Published As
Publication number | Publication date |
---|---|
WO2021158111A1 (fr) | 2021-08-12 |
EP4100985A1 (fr) | 2022-12-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8314837B2 (en) | System and method for imaging with enhanced depth of field | |
US20110090327A1 (en) | System and method for imaging with enhanced depth of field | |
EP1762878B1 (fr) | Appareil et procédé d'observation | |
EP2273302B1 (fr) | Appareil de capture d'images, procédé de capture d'images et programme de capture d'images | |
US7885447B2 (en) | Image acquiring apparatus including macro image acquiring and processing portions, image acquiring method, and image acquiring program | |
US8440969B2 (en) | Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images | |
JP7252190B2 (ja) | 生物試料の向上された被写界深度の合成2d画像を生成するシステム | |
US20110091125A1 (en) | System and method for imaging with enhanced depth of field | |
EP2834832B1 (fr) | Appareil d'inspection integrée avec un système de particules chargées et un système optique | |
US9378921B2 (en) | Integrated optical and charged particle inspection apparatus | |
EP2976747B1 (fr) | Évaluation de la qualité d'image des images obtenues par microscopie | |
NL2013262B1 (en) | Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscope. | |
EP2618197A1 (fr) | Dispositif pour observer un point confocal tridimensionnel, et unité de déplacement/correction de plan focal d'observation | |
JP3813798B2 (ja) | 電子顕微鏡 | |
AU2014236055A1 (en) | Referencing in multi-acquisition slide imaging | |
US7709773B2 (en) | Scanning optical device which sets hardware in association with a depth of a focus position based on hardware set values stored in association with depths of focus positions | |
JP6474409B2 (ja) | レーザーマイクロダイセクションシステムのレーザー偏向装置を較正するための方法およびレーザーマイクロダイセクションシステム | |
US20200379232A1 (en) | Optical scanning arrangement and method | |
JP6131568B2 (ja) | 顕微鏡装置及び画像形成方法 | |
JP5963487B2 (ja) | レーザ顕微鏡および観察方法 | |
NL2024861B1 (en) | Method for recording and correlating light and charged particle microscopy images | |
EP2263070B1 (fr) | Formation d'image synchronisée au moyen d'un procédé optique et de microscopie à force atomique | |
JP7287957B2 (ja) | 放射線検出装置、コンピュータプログラム及び位置決め方法 | |
JP2006228748A (ja) | 電子顕微鏡 | |
US20220335580A1 (en) | Method for producing a corrected image and apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PD | Change of ownership |
Owner name: DELMIC IP B.V.; NL Free format text: DETAILS ASSIGNMENT: CHANGE OF OWNER(S), ASSIGNMENT; FORMER OWNER NAME: TECHNISCHE UNIVERSITEIT DELFT Effective date: 20230118 |