NL2022769A - Spatial modulation of a light beam - Google Patents

Spatial modulation of a light beam Download PDF

Info

Publication number
NL2022769A
NL2022769A NL2022769A NL2022769A NL2022769A NL 2022769 A NL2022769 A NL 2022769A NL 2022769 A NL2022769 A NL 2022769A NL 2022769 A NL2022769 A NL 2022769A NL 2022769 A NL2022769 A NL 2022769A
Authority
NL
Netherlands
Prior art keywords
target
light
light beam
modified
components
Prior art date
Application number
NL2022769A
Other languages
English (en)
Inventor
Weimin Zhang Kevin
Anthony Purvis Michael
Alan Stinson Cory
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of NL2022769A publication Critical patent/NL2022769A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • H01S3/0085Modulating the output, i.e. the laser beam is modulated outside the laser cavity
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001Production of X-ray radiation generated from plasma
    • H05G2/008Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/005Optical devices external to the laser cavity, specially adapted for lasers, e.g. for homogenisation of the beam or for manipulating laser pulses, e.g. pulse shaping
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/23Arrangements of two or more lasers not provided for in groups H01S3/02 - H01S3/22, e.g. tandem arrangements of separate active media
    • H01S3/2383Parallel arrangements
    • H01S3/2391Parallel arrangements emitting at different wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • X-Ray Techniques (AREA)
  • Plasma Technology (AREA)

Claims (3)

  1. CONCLUSIE
    1. Een lithografieinrichting omvattende:
    een belichtinginrichting ingericht voor het leveren van een stralingsbundel;
  2. 5 een drager geconstrueerd voor het dragen van een patroneerinrichting, welke patroneerinrichting in staat is een patroon aan te brengen in een doorsnede van de stralingsbundel ter vorming van een gepatroneerde stralingsbundel;
    een substraattafel geconstrueerd om een substraat te dragen; en een projectieinrichting ingericht voor het projecteren van de gepatroneerde stralingsbundel op
  3. 10 een doelgebied van het substraat, met het kenmerk, dat de substraattafel is ingericht voor het positioneren van het doelgebied van het substraat in een brandpuntsvlak van de projectieinrichting.
    Figure NL2022769A_C0001
    FIG. 1B
    Figure NL2022769A_C0002
    Figure NL2022769A_C0003
    3/10
    Figure NL2022769A_C0004
    233..G
    4/10
    Figure NL2022769A_C0005
    Figure NL2022769A_C0006
    o <3
    Li_
    5/10
    Figure NL2022769A_C0007
    Figure NL2022769A_C0008
NL2022769A 2018-04-03 2019-03-20 Spatial modulation of a light beam NL2022769A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US201862651928P 2018-04-03 2018-04-03

Publications (1)

Publication Number Publication Date
NL2022769A true NL2022769A (en) 2019-10-09

Family

ID=65904410

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2022769A NL2022769A (en) 2018-04-03 2019-03-20 Spatial modulation of a light beam

Country Status (5)

Country Link
JP (1) JP7356439B2 (nl)
CN (1) CN111955058A (nl)
NL (1) NL2022769A (nl)
TW (1) TWI820102B (nl)
WO (1) WO2019192841A1 (nl)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11262591B2 (en) * 2018-11-09 2022-03-01 Kla Corporation System and method for pumping laser sustained plasma with an illumination source having modified pupil power distribution
US11297289B2 (en) * 2019-12-26 2022-04-05 Himax Technologies Limited Structured light projector
IL296535A (en) * 2020-04-09 2022-11-01 Asml Netherlands Bv Laser seed system for radiation source
CN117296455A (zh) * 2021-05-10 2023-12-26 通快激光系统半导体制造有限公司 Euv激发光源和euv光源
EP4125165B1 (de) * 2021-07-28 2023-11-01 TRUMPF Lasersystems for Semiconductor Manufacturing GmbH Fokussiereinrichtung mit einer parallel oder deckungsgleich zu einer targetebene verlaufenden bildebene
DE102022119609A1 (de) 2022-08-04 2024-02-15 Trumpf Laser Gmbh Lasersystem und Verfahren zur Bereitstellung eines zur Wechselwirkung mit einem Targetmaterial vorgesehenen gepulsten Laserstrahls

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3698677B2 (ja) * 2002-03-15 2005-09-21 川崎重工業株式会社 レーザパルス制御方法と装置およびx線発生方法と装置
JP2007503723A (ja) * 2003-08-22 2007-02-22 プレックス・エルエルシー 光学アドレス式極紫外線モジュレータ及びこのモジュレータを含むリソグラフィー装置
WO2005026843A2 (en) * 2003-09-12 2005-03-24 Carl Zeiss Smt Ag Illumination system for a microlithography projection exposure installation
CN101470269A (zh) * 2007-12-26 2009-07-01 中国科学院微电子研究所 激光远距离传输中央光斑的超分辨压缩振幅光调制器
CN102472981B (zh) * 2009-08-14 2015-07-08 Asml荷兰有限公司 Euv辐射系统和光刻设备
JP5758662B2 (ja) * 2011-03-23 2015-08-05 国立大学法人大阪大学 極端紫外光生成装置及び極端紫外光生成方法
US8993976B2 (en) * 2011-08-19 2015-03-31 Asml Netherlands B.V. Energy sensors for light beam alignment
JP6498680B2 (ja) * 2014-01-27 2019-04-10 エーエスエムエル ネザーランズ ビー.ブイ. 放射源
US9357625B2 (en) * 2014-07-07 2016-05-31 Asml Netherlands B.V. Extreme ultraviolet light source
WO2016012192A1 (en) * 2014-07-21 2016-01-28 Asml Netherlands B.V. Radiation source
WO2017194393A1 (en) * 2016-05-11 2017-11-16 Asml Netherlands B.V. Radiation conditioning system, illumination system and metrology apparatus, device manufacturing method

Also Published As

Publication number Publication date
WO2019192841A1 (en) 2019-10-10
CN111955058A (zh) 2020-11-17
TWI820102B (zh) 2023-11-01
KR20200138728A (ko) 2020-12-10
JP7356439B2 (ja) 2023-10-04
TW201945792A (zh) 2019-12-01
JP2021517662A (ja) 2021-07-26

Similar Documents

Publication Publication Date Title
JP7356439B2 (ja) 光ビームの空間変調
KR102072064B1 (ko) 방사선 소스
US9986628B2 (en) Method and apparatus for generating radiation
US20130077073A1 (en) Methods to control euv exposure dose and euv lithographic methods and apparatus using such methods
JP4966342B2 (ja) 放射源、放射を生成する方法およびリソグラフィ装置
US20220151052A1 (en) System for monitoring a plasma
JP6869242B2 (ja) リソグラフィ装置のためのeuvソースチャンバーおよびガス流れ様式、多層ミラー、およびリソグラフィ装置
US12007693B2 (en) Laser focussing module
KR20130040883A (ko) Euⅴ 방사선 소스 및 euⅴ 방사선 생성 방법
NL2004837A (en) Radiation system and lithographic apparatus.
US20140218706A1 (en) Radiation source and lithographic apparatus
KR102718115B1 (ko) 광빔의 공간적 변조
CN112930714B (zh) 监测光发射
NL2020778A (en) Laser produced plasma source
TWI825198B (zh) 極紫外線(euv)光源及用於euv光源之設備、用於形成光學脈衝之設備及調整光學脈衝之性質的方法
NL2007861A (en) Radiation source and lithographic apparatus.
NL2005750A (en) Euv radiation source and euv radiation generation method.