NL2021608A - Control system for a lithographic apparatus - Google Patents

Control system for a lithographic apparatus Download PDF

Info

Publication number
NL2021608A
NL2021608A NL2021608A NL2021608A NL2021608A NL 2021608 A NL2021608 A NL 2021608A NL 2021608 A NL2021608 A NL 2021608A NL 2021608 A NL2021608 A NL 2021608A NL 2021608 A NL2021608 A NL 2021608A
Authority
NL
Netherlands
Prior art keywords
mirror
radiation
radiation beam
wavefront
mirrors
Prior art date
Application number
NL2021608A
Other languages
English (en)
Dutch (nl)
Inventor
Charles Dominique Deneuville Francois
Sergeevich Tychkov Andrey
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of NL2021608A publication Critical patent/NL2021608A/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/08Mirrors
    • G02B5/0891Ultraviolet [UV] mirrors
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70008Production of exposure light, i.e. light sources
    • G03F7/70033Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05GX-RAY TECHNIQUE
    • H05G2/00Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
    • H05G2/001Production of X-ray radiation generated from plasma
    • H05G2/008Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Lasers (AREA)
  • Microscoopes, Condenser (AREA)
  • X-Ray Techniques (AREA)
NL2021608A 2017-09-20 2018-09-12 Control system for a lithographic apparatus NL2021608A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP17192125 2017-09-20

Publications (1)

Publication Number Publication Date
NL2021608A true NL2021608A (en) 2019-03-26

Family

ID=59923324

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2021608A NL2021608A (en) 2017-09-20 2018-09-12 Control system for a lithographic apparatus

Country Status (5)

Country Link
JP (1) JP2020534674A (ja)
KR (1) KR20200057003A (ja)
CN (1) CN111095041B (ja)
NL (1) NL2021608A (ja)
WO (1) WO2019057583A1 (ja)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3820783A1 (de) * 1988-06-20 1990-01-04 Fraunhofer Ges Forschung Optische anordnung zur korrektur einer astigmatischen abbildung
JP3341269B2 (ja) * 1993-12-22 2002-11-05 株式会社ニコン 投影露光装置、露光方法、半導体の製造方法及び投影光学系の調整方法
US7372633B2 (en) * 2006-07-18 2008-05-13 Asml Netherlands B.V. Lithographic apparatus, aberration correction device and device manufacturing method
KR101795610B1 (ko) * 2009-12-23 2017-11-08 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치 및 디바이스 제조 방법
NL2009844A (en) * 2011-12-22 2013-06-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
DE102012202057B4 (de) * 2012-02-10 2021-07-08 Carl Zeiss Smt Gmbh Projektionsobjektiv für EUV-Mikrolithographie, Folienelement und Verfahren zur Herstellung eines Projektionsobjektivs mit Folienelement
DE102014012456A1 (de) * 2014-08-21 2016-02-25 Steinmeyer Mechatronik GmbH Optische Strahlführungseinheit und Materialbearbeitungsvorrichtung mit einer optischen Strahlführungseinheit
CN105511231B (zh) * 2014-10-16 2019-03-29 中芯国际集成电路制造(上海)有限公司 Euv光源和曝光装置

Also Published As

Publication number Publication date
CN111095041A (zh) 2020-05-01
CN111095041B (zh) 2022-06-28
JP2020534674A (ja) 2020-11-26
KR20200057003A (ko) 2020-05-25
WO2019057583A1 (en) 2019-03-28

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