NL2011796C2 - High efficiency photoelectrochemical device for splitting water. - Google Patents

High efficiency photoelectrochemical device for splitting water. Download PDF

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NL2011796C2
NL2011796C2 NL2011796A NL2011796A NL2011796C2 NL 2011796 C2 NL2011796 C2 NL 2011796C2 NL 2011796 A NL2011796 A NL 2011796A NL 2011796 A NL2011796 A NL 2011796A NL 2011796 C2 NL2011796 C2 NL 2011796C2
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layer
doped
nanocrystalline
intrinsic
sic
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NL2011796A
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Lihao Han
Miro Zeman
Arno Smets
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Univ Delft Tech
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
    • H01L31/075Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PIN type
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25BELECTROLYTIC OR ELECTROPHORETIC PROCESSES FOR THE PRODUCTION OF COMPOUNDS OR NON-METALS; APPARATUS THEREFOR
    • C25B1/00Electrolytic production of inorganic compounds or non-metals
    • C25B1/50Processes
    • C25B1/55Photoelectrolysis
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
    • H01L31/075Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PIN type
    • H01L31/076Multiple junction or tandem solar cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/548Amorphous silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P20/00Technologies relating to chemical industry
    • Y02P20/10Process efficiency
    • Y02P20/133Renewable energy sources, e.g. sunlight

Description

High efficiency photoelectrochemical device for splitting water
FIELD OF THE INVENTION
The present invention is in the field of a high efficiency photoelectrochemical device for splitting water, a method of operating said device, an oxide type layer for use in said device and a method of producing said oxide layer.
BACKGROUND OF THE INVENTION
The present invention is in the field of electrical sustainable energy, and specifically relates to a photoelectrochemical device for splitting water.
The present invention relates to a specific type of an electrolytic cell. An electrolytic cell is an electrochemical cell that undergoes a chemical reaction, namely a redox reaction, when electrical energy is applied. In a sub domain, in a process called electrolysis, it relates to decomposition of a chemical compound. An electrolytic cell usually consists of two half cells.
Important examples of electrolysis are the decomposition of water into hydrogen and oxygen, as in the present case, and bauxite into aluminium and other chemicals.
An electrolytic cell has three functional parts, namely an electrolyte and two electrodes, a cathode and an anode. The electrolyte is usually a solution of a solvent, such as water, in which ions may dissolve. The electrolyte provides ions or charged species that flow to and from the electrodes (cathode and anode) under application of an external voltage. At the electrodes the actual reaction takes place, one reduction reaction and one oxidizing reaction, respectively. The reactions do not take place under "normal" or ambient conditions. The applied voltage (or potential) needs to be of sufficient magnitude, in order to carry out the reactions. It is noted that species formed, such as hydrogen and oxygen, would under normal conditions being brought into contact reverse the redox reaction.
The cathode is usually defined as the electrode to which cations (positively charged ions) flow, to be reduced by reacting with electrons (negatively charged) from that electrode. Likewise the anode is usually defined as the electrode to which anions (negatively charged ions) flow, to be oxidized by depositing electrons on the electrode.
Photoelectrochemical water-splitting devices typically use solar energy, i.e. solar radiation, to convert water into its components hydrogen and oxygen. The solar energy may be converted to electrical energy. The electrical energy (or potential) splits water. The obtained hydrogen is a source for e.g. combustion engines directly, or it can be converted into a hydrocarbon, such as methane, and then be used. The water splitting devices have been investigated for decades.
For converting solar energy typically multi-junction designs are most efficient, as they can absorb enough solar energy and provide sufficient free energy for water cleavage. However, complex devices come at high cost.. Typical solar-to-hydrogen (STH) conversion efficiencies are in the order of a few percent, being somewhat higher for complex designs, and somewhat lower for simple designs. A photoelectrochemical process is considered as a promising approach to split water into hydrogen and oxygen, using sunlight directly. Hydrogen may be considered as an energy source as well as an energy carrier. It has a high caloric value and upon combustion only water is produced.
In the prior art a photocathode has been proposed based on hydrogenated amorphous silicon carbide (a-SiC:H) layers. For producing such a layer typically a plasma enhanced chemical vapour technique (PECVD) is used. As a substrate a fluorine doped tin oxide (FTO) layer on glass may be used. Thereon a relatively thin doped a-SiC:H p-layer is deposited. On the p-doped layer a relatively thicker a-SiC:H intrinsic layer is deposited. Upon radiation with sunlight the cathode produces hydrogen (H2) and the anode produces oxygen (02) .
It has been found that the STH conversion of the above device is too low. Also the structure of the cathode is considered sub-optimal, e.g. in terms of photon to electron conversion efficiency. Further, the cathode is not designed optimally in view of the envisaged hydrogen production.
In general, there is room for improvement.
The present invention therefore relates to a high efficiency photoelectrochemical device being relatively simple of design and providing high conversion efficiencies, which solve one or more of the above problems and drawbacks of the prior art, providing reliable results, without jeopardizing functionality and advantages.
SUMMARY OF THE INVENTION
The present invention relates to a high efficiency photoelectrochemical device for splitting water. The device comprises an integrated cathode and an anode. In principle the anode may be integrated as well. Likewise an integrated anode is considered, with a cathode being provided further.
The present cathode comprises a sequence of layers. The layers are deposited on a substrate. Typically a flat substrate is selected, such as glass, silicon, such as a wafer, etc. The substrate may be treated, e.g. by providing a coating, such as fluorine-doped Sn02 coated glass.
The layers may be directly on top of one and another, or may comprise further (intermediate) layers.
In order to capture light a p-doped layer is provided, amongst others. For doping Group III (or Group 13) elements, such as boron, aluminium, Gallium and indium, are considered. It is preferred to use boron. A doping concentration for the present silicon based semiconductors is from 1013 cm-3 to 1018 cm-3, such as from 5*1014 cm-3 to 2*1017 cm-3.
The p-doped layer may be relatively thin, such as 5-100 nm, preferably 10-20 nm. It is preferred to use an amorphous SiC:H layer. Doping may be provided upon growing such a layer, or by ion implantation.
On the p-doped layer and intrinsic layer is provided. It is preferred to use an amorphous SiC:H layer. Also the intrinsic layer may be relatively thin, such as 10-50Ó nm, preferably 50-200 nm, though typically somewhat thicker than the p-doped layer.
This sequence of layers provides electrons from solar radiation, and thus a potential.
For carrying out the electrolysis an aqueous electrolyte is provided, such as aqueous H3NS03. The concentration of H3NS03 is preferably from 10"6 mole/1-10"1 mole/1, more preferably 10'5 mole/1-10'2 mole/1. The concentration is preferably not too high, in view of acidity of the solution. The is preferably not too low, in view of amount hydrogen being formed. The hydrogen is formed at the surface of the layer sequence.
The electrolyte further comprises a wire or the like, such as a noble metal wire, such as Pt and Pd. The wire is typically in electrical contact with a contact provided in the sequence f layers, such as an Al contact. As alternative materials a bismuth vanadate can be used. At the wire oxygen is formed.
The electrolyte is typically provided in a container, preferably an inert container.
It has been found that the STH conversion of the present device is much improved compared to the prior art. The present STH efficiency is in the order of 18%. Also the structure of the cathode is optimized, e.g. in terms of photon to electron conversion efficiency. Further, the cathode is designed optimally in view of the envisaged hydrogen production. The present device can now be operated without a need of an external bias voltage, which is considered a further advantage .
The present device provides a relatively high photocurrent density, such as -5 mA/cm2 at 0 V (versus reversible hydrogen electrode; RHE). Unless stated otherwise, for reasons of comparison, the current density is taken at 0 V (versus the reversible hydrogen electrode). Such corresponds to a solar-to-hydrogen (STH) efficiency of 6.3 % (relative to input of solar energy).
The present invention provides a simple design, using readily available resources, such as silicon.
The present device also relates to a cheap and effective membrane film, capable of separating hydrogen and oxygen. The present device is very stable in the environment provided, e.g. electrolyte. No degradation over time has been observed yet. Such is considered especially relevant in view of prior art catalyst and the like, which are less stable.
Of course integrating e.g. more layers makes e.g. deposition times longer. It has been found however that the benefits of the present device more than compensate for production drawbacks.
Further the present invention provides a method of operating the present device.
It is noted that the present device may also be applied for C02 reduction, water treatment, etc.
Also the present invention provides a nanocrystal-line-SiOx:H matrix layer comprising Si domains in the matrix for use in a photoelectrochemical device, and a method of producing said matrix layer.
The present device can be produced efficiently, e.g. in one multi-chamber cluster tool. Therein a p-dopant concentration, such as boron, may be reduced by tuning gas flows real time during the production process.
For a silicon based device the present device performs very well, comparable to much more complicated III-V devices. Such is considered important, as the present device can be, contrary to III-V devices, fully integrated in present silicon based semiconductor production technologies. The present device and its characteristics may be considered as a future benchmark.
Thereby the present invention provides a solution to one or more of the above mentioned problems and drawbacks.
Advantages of the present description are detailed throughout the description.
DETAILED DESCRIPTION OF THE INVENTION
The present invention relates in a first aspect to a high efficiency photoelectrochemical device for splitting water according to claim 1.
In an example of the present device the cathode comprises a contact, such as an Al contact, wherein the contact is integrated in the substrate layer. In principle the contact may be of any suitable conducting metal, such as Al, Cu, W,
Ti, and combinations thereof, as well as of any suitable semiconducting material. Preferably the material is suited to be integrated in a production process, such as a semi-conductor production process. It is an advantage of the present device that the contact can be integrated in an existing production process. Also the contact can be made of a readily available material.
In an example of the present device the p-doped layer comprises at least two sub-layers, wherein any p-doped layer closer to the substrate layer has a higher doping than any p-doped layer closer to the intrinsic layer, or wherein the doping continuously drops from a higher level to 0. It has been found that such a device has a higher conversion of photons to electrons, and as a result a higher STH ratio. With the present method a continuous doped layer can be made, having an initial doping concentration closer to the substrate and no doping at the intrinsic layer. It has been fund that especially a continuous doped layer has a high STH ratio. Likewise a semi-continuous stack of layers, such as a stack of 5-100 layers, provides a good STH ratio.
In an example of the present device the p-doped layer comprises 3-50 sub-layers. From a conversion point of view a higher number of layers would be preferred, from a manufacturing point of a view a lower number is preferred. In this respect a continuous decreasing dopant layer is preferred.
In an example of the present device between the intrinsic layer and electrolyte (f) at least one n-doped nanocrystalline (nc) layer is present, such as a nanocrystalline oxide layer, such as an nc-SiOx:H layer. Such a layer provides a good protection and does not jeopardize functionality of the present device.
In an example the present device further comprises one or more of (al) a photon reflector layer, preferably between the fluorine-doped Sn02 layer and glass substrate, especially for photons with a wavelength of 280-1000 nm, such as an Ag-layer, and an Al-layer, (b) a bottom cell, preferably comprising at least one p-doped layer, at least one intrinsic layer, and at least one n-doped layer, such as nc-Si:H layers, and (c) a top cell, preferably comprising at least one p-doped layer, at least one intrinsic layer, and at least one n-doped layer, such as nc-Si:H layers.
It has been found that a photon reflector layer increase the STH ratio with a few percent.
By providing a bottom and/or top cell a conversion of photons to electrons has been found to increase as well. As a result also the STH ratio increases. It has been found that the best results are obtained with a combination of p-doped, intrinsic, and n-doped layers. The doping concentration of the n-doped layers is similar to the p-doping concentration mentioned. Is has been found that especially nanocrystalline layers, such as Si:H layers perform well.
For doping of n-layers Group V (or Group 15) elements, such as phosphorus, aluminium, Gallium and indium, are considered. It is preferred to use phosphorous. A doping concentration for the present n-type silicon based semiconductors is from 1013 cm-3 to 1018 cm-3, such as from 5*1014 cm'3 to 2*1017 cm'3.
In an example the present device further comprises one or more of (v) a back contact, (w) a thin first a-SiC:H layer, comprising at least one p-doped layer, and at least one intrinsic layer, (y) a p-doped layer, such as a wafer substrate, and (z) a thin second a-SiC:H layer, comprising at least one intrinsic layer, and at least one n-doped layer.
The back contact may be fully integrated in the device and/or in the production process thereof.
In an example the present device comprises a 3-dimensional type structure, such as pillars, and a holographic raster. It has been found that especially the electrolytic reaction benefits from such a structure, e.g. in terms of selectivity, conversion and yield (of e.g. hydrogen).
In a second aspect the present invention relates to a method of operating a photoelectrochemical device according to the invention, comprising the steps of (i) applying light, and (ii) harvesting hydrogen.
The light applied is preferably from the sun (solar energy). As such the present invention provides a profitable way of converting sunlight into green energy, i.c. hydrogen.
In an example of the present method an external bias voltage is 0V or absent. Such is considered an advantage, as no extra measures have to be taken in order to operate the present device. Further, the advantages of the present device are not jeopardized at all.
In an example of the present method no current limitation is applied. Such is considered an advantage as well.
In a third aspect the present invention relates to a nanocrystalline-SiOx:H matrix layer comprising nanocrystalline Si domains in an oxide matrix for use in a photoelectrochemi-cal device. The present nanocrystalline-SiOx:H matrix layer provides an excellent coating with protective properties. It remains however transparent to optical radiation. It further does not jeopardize electrolytic functionality.
In an example the nanocrystalline-SiOx:H matrix layer comprises 10-50 wt. % Si domains, such as 20-35 wt. %.
In a fourth aspect the present invention relates to a method of producing a nanocrystalline-SiOx:H matrix layer comprising nanocrystalline Si domains in an oxide matrix, comprising the steps of providing SiH4, PH3, H2 and C02, and depositing the nanocrystalline-SiOx:H matrix layer comprising nanocrystalline Si domains.
SiH4 may be provided in an amount of 0.5-2 seem, such as 1 seem, PH3 may be provided in an amount of 0.5-2 seem, such as 1.2 seem, H2 may be provided in an amount of 50-200 seem, such as 100 seem, and C02 may be provided in an amount of 0.5-2 seem, such as 1.6 seem.
The one or more of the above examples and embodiments may be combined, falling within the scope of the invention.
EXAMPLES/EXPERIMENTS
The present invention relies on scientific research carried out at the Technical University Delft, the Netherlands . Various results and background of these experiments will be published in a PhD-Thesis by Lihao Han. The results and background of the experiments are incorporated into the present application by reference.
Some details are given below. PECVD fabrication
In an example an a-SiC:H photocathodes were deposited by a radio frequency (RF-) PECVD multi-chamber tool. A 2.5 cm x 10 cm Asahi vu-type substrate, with a thick (~600 nm) fluorine-doped Sn02 (FTO) on textured glass, was heated at 170°C during the deposition.
In an example an a-SiC:H(B) layer was deposited as the p-layer, decomposed from SiH4( CH4, and B2H6 diluted H2 gas flow in a controlled pressure. The gradient B doping layer was deposited by a programmed 10-step recipe in which 2 seem H2 diluted B2H6 gas flow rate was evenly reduced per 72 seconds from the same B concentration as the initial p-layer until 0 seem like the i-layer. A H2 treatment is followed in the same chamber in order to improve the p/i interface. The i-type a-SiC:H was deposited in another chamber specifically to avoid the possible contamination.
In an example after a-SiC:H thin films were synthesized, a stripe of 300 nm Al was coated on the pre-covered region of the sample as the front contact using a Provac evaporator in rotation mode. The purpose of the Al stripe is to insure the generated photocurrent can be effectively collected.
In an example PEC characterization was carried out in a three-electrodes configuration, where an a-SiC:H device with a reaction area of 0.283 cm2 (an illuminated hole of 6 mm in diameter) was acting as the working photocathode, a coiled Pt wire as the counter electrode, and an Ag/AgCl electrode (XR300, saturated KC1 and AgCl solution, Radiometer Analytical) as the reference electrodes, respectively, 0.1 M (mole/L). Sulphamic acid (H3NS03) was utilized as the electrolyte, buffered to pH -3.75 by potassium bi-phthalate (KHP).
The following equation was used to convert the potential vs. the reference cell into the potential vs. RHE [ref]:
Erhe = EAg/Agci + E0Ag/Agci vs. RHE + 0.059xpH
The invention is further detailed by the accompanying figures, which are exemplary and explanatory of nature and are not limiting the scope of the invention. To the person skilled in the art it may be clear that many variants, being obvious or not, may be conceivable falling within the scope of protection, defined by the present claims.
FIGURES
The invention although described in detailed explanatory context may be best understood in conjunction with the accompanying figures.
Fig. 1 shows a basic photocathode.
Fig. 2 shows a gradient doped cathode.
Fig. 3 shows an N-type nanocrystalline silicon oxide technique on the photocathode .
Fig. 4 shows a tandem solar cell integration with the photocathode to provide the over-potential for water reduction
Fig. 5 shows a HIT (Hetero-structure with Intrinsic Thin Layer) solar cell integration with the photocathode to provide the over-potential for water reduction without any current limitation.
Fig. 6 shows a current density versus electrical field.
Fig. 7 shows a current density versus electrical field.
Fig. 8 shows a current density versus electrical field. DETAILED DESCRIPTION OF THE FIGURES Fig. 1 shows a basic photocathode. Therein 1. 4H+ + 4e“ -> 2H2| 2 . 2H20 - 4e~ ^ 4H+ + 02t
3. ί-type a-SiC:H
4 . p-type a-SiC:H
5 . FTO 6. glass (textured for light management) 7. Al contact 8 . H3NSO3 electrolyte 9. Pt
Fig. 2 shows a gradient doped cathode. Therein
1. 4H+ + 4e‘ -» 2H2T 2 . 2H20 - 4e~ -> 4H+ + 02t
3. 2-type a-SiC:H 4. p-- -type a-SiC:H (gradient reducing B doping)
5. p-type a-SiC:H
6. FTO 7. glass (textured for light management) 8. Al contact 9. H3NSO3 electrolyte 10. Pt
Fig. 3 shows an N-type nanocrystalline silicon oxide technique on the photocathode. Therein 1. 4H+ + 4e“ -> 2H21 2 . 2H20 - 4e' -► 4H+ + 02t
3. n-type nc-SiOx:H
4. i-type a-SiC:H 5. p— -type a-SiC:H (gradient reducing B doping)
6. p-type a-SiC:H
7 . FTO 8. glass (textured for light management) 9 . Al contact 10. H3NSO3 electrolyte 11. Pt
Fig. 4 shows a tandem solar cell integration with the photocathode to provide the over-potential for water reduction. Therein 1. 4H+ + 4e' -* 2H2f 2. 2H20 - 4e“ 4H+ + 02|
3. n-type nc-SiOx:H
4. i-type a-SiC:H 5. p-- -type a-SiC:H (gradient reducing B doping)
6. p-type a-SiC:H
7 . i-type nc-Si:H
8. p-type nc-SiOx:H
9 . FTO 10 . back reflector 11. glass (textured for light management) 12 . H3NSO3 electrolyte 13 . Pt
Fig. 5 shows a HIT (Hetero-structure with Intrinsic Thin Layer) solar cell integration with the photocathode to provide the over-potential for water reduction without any current limitation. Therein 1. 4H+ + 4e' -+ 2H21 2. 2H20 - 4e' -+ 4H+ + 02t
3. n-type nc-SiOx:H
4. i-type a-SiC:H 5. p-- -type a-SiC:H (gradient reducing B doping)
6. p-type a-SiC:H
7. n-type a-Si:H
8. i-type a-Si:H 9. p-type c-Si wafer
10. p-type a-Si:H 11. back contact 12 . H3NSO3 electrolyte 13 . Pt
Fig. 6 shows a current density versus electrical field. Therein a "normal" layer (a), having a 10 nm p-doped layer and a 80 nm intrinsic layer, a reference p/i junction layer (b), having a 50 nm p-doped layer and a 40 nm intrinsic layer, a doping profile (c), having a 10 nm p-doped layer, a 40 nm intermediate less doped p-layer, and a 40 nm intrinsic layer, and (d) a gradient doped profile, having a 10 nm p-doped layer, ten 4 nm intermediate in a sequence continuously less doped p-layer, and a 40 nm intrinsic layer, are compared in view of current density j (mA/cm2) versus applied field. Clearly the present continuously doped profile provides the highest current density.
Fig. 7 shows a current density versus electrical field. Therein a photocathodes with (a) and without an n-nc-SiOx:H layer (b) is shown. The radiation is provided in an on-off mode. In the off mode it can be seen that no current density is present. No electrolysis takes place. If radiation is present, at a lower (more negative) electrical field a higher current density is observed. In comparison, the photocathode with the n-nc-SiOx:H layer (b) has a higher current density.
Fig. 8 shows a current density versus electrical field for various solar cells. The measurement is comparable with that of figure 7. Therein an a-SiC:H photocathode is shown. The photocathode is integrated with a-Si:H/a-Si:H (a), with nc-Si:H/a-Si:H (b) , with nc-Si :H/nc-Si:H (c) , with a-Si:H (d), and without PV (e). The cathode without PV has a small onset potential of about -0.2 V. All other cathodes have an onset potential of about 1.0 V, which is very advantageous for use in a hydrogen producing electrolytic cell.
In the tables below deposition data of the structures 1-5 (equivalent to a-e) are given.
Figure NL2011796CD00141
Figure NL2011796CD00151
Figure NL2011796CD00161
Table 1

Claims (14)

1. Hoog rendement op silicium gebaseerde foto-elektrochemische inrichting voor het splitsen van water omvattende een fotokathode, waarbij de fotokathode omvat een opeenvolging van: (a) een substraatlaag, zoals fluor gedoteerde Sn02 gecoat glas, (d) een p-gedoteerde laag, zoals een 10-20 nm boor gedoteerd amorfe SiC:H laag, (e) een intrinsieke (i)-laag, zoals een 50-200 nm amorfe SiC:H laag, en (g) een waterig elektrolyt, zoals waterig H3NS03.A high-efficiency silicon-based photoelectrochemical device for splitting water comprising a photocathode, the photocathode comprising a sequence of: (a) a substrate layer, such as fluorine-doped SnO 2 coated glass, (d) a p-doped layer, such as a 10-20 nm boron doped amorphous SiC: H layer, (e) an intrinsic (i) layer, such as a 50-200 nm amorphous SiC: H layer, and (g) an aqueous electrolyte, such as aqueous H 3 NS 3. 2. Foto-elektrochemische volgens conclusie 1, waarbij de kathode een contact omvat, zoals een Al contact, waarbij het contact is geïntegreerd in de substraatlaag.The photoelectrochemical according to claim 1, wherein the cathode comprises a contact, such as an Al contact, wherein the contact is integrated in the substrate layer. 3. Foto-elektrochemische inrichting volgens één der voorgaande conclusies, waarbij de p-gedoteerde laag ten minste twee deellagen omvat, waarbij een p-gedoteerde laag dichter bij de substraatlaag een hogere dotering heeft dan een p-gedoteerde laag dichter bij de intrinsieke laag, of waarbij de dotering continu daalt van een hoger niveau naar 0.A photo-electrochemical device according to any one of the preceding claims, wherein the p-doped layer comprises at least two sub-layers, wherein a p-doped layer closer to the substrate layer has a higher doping than a p-doped layer closer to the intrinsic layer, or wherein the doping continuously drops from a higher level to 0. 4. Foto-elektrochemische inrichting volgens conclusie 3, waarbij de p-gedoteerde laag 3-50 sublagen omvat.The photoelectrochemical device of claim 3, wherein the p-doped layer comprises 3-50 sublayers. 5. Foto-elektrochemische inrichting volgens één van de voorgaande conclusies, waarbij tussen de intrinsieke laag en elektrolyt (f) ten minste één n-gedoteerde nanokristallijne (nc) laag aanwezig is, zoals een nanokristallijne oxidelaag, zoals een nc-SiO:H laag.A photo-electrochemical device according to any one of the preceding claims, wherein at least one n-doped nanocrystalline (nc) layer is present between the intrinsic layer and electrolyte (f), such as a nanocrystalline oxide layer, such as an nc-SiO: H layer . 6. Foto-elektrochemische inrichting volgens één der voorgaande conclusies, verder omvattende één of meer van (al) een foton reflectorlaag, bij voorkeur tussen de fluor gedoteerde Sn02 laag en glassubstraat, in het bijzonder voor fotonen met een golflengte van 280-1000 nm, zoals een Ag-laag, en een Al-laag, (b) een onderste cel, bij voorkeur omvattende ten minste één p-gedoteerde laag, ten minste één intrinsieke laag, en ten minste één n-gedoteerde laag, zoals nc-Si:H lagen, en (c) een bovenste cel, bij voorkeur omvattende ten minste één p-gedoteerde laag, ten minste één intrinsieke laag, en ten minste één n-gedoteerde laag, zoals nc-Si:H lagen.Photo-electrochemical device according to any one of the preceding claims, further comprising one or more of (a1) a photon reflector layer, preferably between the fluorine-doped SnO2 layer and glass substrate, in particular for photons with a wavelength of 280-1000 nm, such as an Ag layer, and an Al layer, (b) a lower cell, preferably comprising at least one p-doped layer, at least one intrinsic layer, and at least one n-doped layer, such as nc-Si: H layers, and (c) an upper cell, preferably comprising at least one p-doped layer, at least one intrinsic layer, and at least one n-doped layer, such as nc-Si: H layers. 7. Foto-elektrochemische inrichting volgens één der voorgaande conclusies, verder omvattende één of meer van (v) een back contact, (w) een dunne eerste a-SiC:H laag, omvattende ten minste één p-gedoteerde laag, en ten minste één intrinsieke laag, (y) een p-gedoteerde laag, zoals een wafersubstraat, en (z) een tweede dunne a-SiC:H laag, omvattende ten minste één intrinsieke laag, en ten minste één n-gedoteerde laag.The photoelectrochemical device according to any one of the preceding claims, further comprising one or more of (v) a back contact, (w) a thin first a-SiC: H layer, comprising at least one p-doped layer, and at least one intrinsic layer, (y) a p-doped layer, such as a wafer substrate, and (z) a second thin α-SiC: H layer, comprising at least one intrinsic layer, and at least one n-doped layer. 8. Foto-elektrochemische inrichting volgens één van de voorgaande conclusies, waarbij de inrichting omvat een 3-dimensionale type structuur, zoals zuilen, en een holografisch raster.A photoelectrochemical device according to any one of the preceding claims, wherein the device comprises a 3-dimensional type of structure, such as columns, and a holographic grid. 9. Werkwijze voor het bedienen van een foto-elektrochemische inrichting volgens één der voorgaande conclusies, omvattende de stappen van (i) het toepassen van licht, en (ii) het oogsten waterstof.A method for operating a photoelectrochemical device according to any one of the preceding claims, comprising the steps of (i) applying light, and (ii) harvesting hydrogen. 10. Werkwijze volgens conclusie 9, waarbij een externe voorspanning 0V is of afwezig is.The method of claim 9, wherein an external bias voltage is 0V or is absent. 11. Werkwijze volgens conclusie 9 of 10, waarbij geen stroombegrenzing wordt toegepast.The method according to claim 9 or 10, wherein no current limitation is applied. 12. Nanokristallijn-SiOx:H matrixlaag omvattende na-nocrystallijne Si domeinen in een oxide matrix voor toepassing in een foto-elektrochemische inrichting.A nanocrystalline SiOx: H matrix layer comprising na-nocrystalline Si domains in an oxide matrix for use in a photoelectrochemical device. 13. Nanokristallijne-SiOx:H matrix laag volgens conclusie 12, die 10-50 gew. % Si domeinen omvat.The nanocrystalline SiOx: H matrix layer according to claim 12, which is 10-50 wt. % Si domains. 14. Werkwijze om een nanokristallijne-SiO:H matrixlaag bevattende nanokristallijne Si domeinen in een oxide matrix te produceren, omvattende de stappen van het verschaffen van SiH4, PH3, H2 en C02, en het af zetten van de nanokristal-lijne-SiO:H matrixlaag die nanokristallijne Si domeinen omvat.A method of producing a nanocrystalline SiO: H matrix layer containing nanocrystalline Si domains in an oxide matrix comprising the steps of providing SiH 4, PH 3, H 2 and CO 2, and depositing the nanocrystalline SiO: H matrix layer comprising nanocrystalline Si domains.
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