NL2000670A1 - Transistorschakeling welke in staat is de invloed van parameters van componenten te elimineren en temperatuuraftastinrichting welke deze gebruikt. - Google Patents

Transistorschakeling welke in staat is de invloed van parameters van componenten te elimineren en temperatuuraftastinrichting welke deze gebruikt.

Info

Publication number
NL2000670A1
NL2000670A1 NL2000670A NL2000670A NL2000670A1 NL 2000670 A1 NL2000670 A1 NL 2000670A1 NL 2000670 A NL2000670 A NL 2000670A NL 2000670 A NL2000670 A NL 2000670A NL 2000670 A1 NL2000670 A1 NL 2000670A1
Authority
NL
Netherlands
Prior art keywords
eliminating
parameters
influence
components
sensing device
Prior art date
Application number
NL2000670A
Other languages
English (en)
Other versions
NL2000670C2 (nl
Inventor
Ping-Pao Cheng
Yen-Hung Chen
Original Assignee
Ite Tech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ite Tech filed Critical Ite Tech
Publication of NL2000670A1 publication Critical patent/NL2000670A1/nl
Application granted granted Critical
Publication of NL2000670C2 publication Critical patent/NL2000670C2/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/20—Compensating for effects of temperature changes other than those to be measured, e.g. changes in ambient temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Amplifiers (AREA)
NL2000670A 2007-01-05 2007-05-31 Transistorschakeling welke in staat is de invloed van parameters van componenten te elimineren en temperatuuraftastinrichting welke deze gebruikt. NL2000670C2 (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW096100467A TWI314986B (en) 2007-01-05 2007-01-05 Transistor circuit with eliminating effect of parameter and temperature sensing apparatus using the same
TW96100467 2007-01-05

Publications (2)

Publication Number Publication Date
NL2000670A1 true NL2000670A1 (nl) 2008-07-08
NL2000670C2 NL2000670C2 (nl) 2009-08-04

Family

ID=39477809

Family Applications (1)

Application Number Title Priority Date Filing Date
NL2000670A NL2000670C2 (nl) 2007-01-05 2007-05-31 Transistorschakeling welke in staat is de invloed van parameters van componenten te elimineren en temperatuuraftastinrichting welke deze gebruikt.

Country Status (4)

Country Link
US (1) US20080165826A1 (nl)
DE (1) DE102007025363A1 (nl)
NL (1) NL2000670C2 (nl)
TW (1) TWI314986B (nl)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110967128A (zh) * 2018-09-28 2020-04-07 台湾积体电路制造股份有限公司 热传感器和温度测量的方法

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070237207A1 (en) * 2004-06-09 2007-10-11 National Semiconductor Corporation Beta variation cancellation in temperature sensors
JP4641164B2 (ja) * 2004-09-14 2011-03-02 ルネサスエレクトロニクス株式会社 過熱検出回路
TW201007148A (en) * 2008-08-14 2010-02-16 Ite Tech Inc Temperature measuring method and temperature measuring apparatus using the same
US8197127B2 (en) * 2008-09-08 2012-06-12 Infineon Technologies Austria Ag Ultra low current consumption comparator for thermal shutdown
US8425113B2 (en) * 2008-12-31 2013-04-23 Stmicroelectronics, Inc. System and method for remote temperature sensing
US8308358B2 (en) * 2009-06-25 2012-11-13 Texas Instruments Incorporated Circuit and method for beta variation compensation in single-transistor temperature sensor
EP2682715B1 (en) * 2012-07-02 2015-03-11 Sensirion AG Portable electronic device
KR102075990B1 (ko) * 2014-01-16 2020-02-11 삼성전자주식회사 온도 감지 회로
WO2017014336A1 (ko) * 2015-07-21 2017-01-26 주식회사 실리콘웍스 비선형 성분이 보상된 온도 센서 회로 및 온도 센서 회로의 보상 방법
DE102017104434B3 (de) 2017-03-03 2018-07-12 Infineon Technologies Ag Vorrichtung und Verfahren zum Bestimmen einer Temperatur oder eines zur Bestimmung der Temperatur nutzbaren temperaturabhängigen Werts, Temperatursensor, Drucksensor und Kombinationssensor
TWI841958B (zh) * 2022-05-04 2024-05-11 開曼群島商臉萌有限公司 溫度測量電路、方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG80573A1 (en) * 1997-06-02 2001-05-22 Motorola Inc Integrated temperature sensor
JP3419274B2 (ja) * 1997-10-03 2003-06-23 富士電機株式会社 センサ出力補償回路
US6149299A (en) * 1997-12-11 2000-11-21 National Semiconductor Corporation Direct temperature sensing of a semiconductor device semiconductor device
US6008685A (en) * 1998-03-25 1999-12-28 Mosaic Design Labs, Inc. Solid state temperature measurement
US6097239A (en) * 1999-02-10 2000-08-01 Analog Devices, Inc. Decoupled switched current temperature circuit with compounded ΔV be
US6554469B1 (en) * 2001-04-17 2003-04-29 Analog Devices, Inc. Four current transistor temperature sensor and method
US20070237207A1 (en) * 2004-06-09 2007-10-11 National Semiconductor Corporation Beta variation cancellation in temperature sensors
US7170334B2 (en) * 2005-06-29 2007-01-30 Analog Devices, Inc. Switched current temperature sensing circuit and method to correct errors due to beta and series resistance
US7341374B2 (en) * 2005-10-25 2008-03-11 Aimtron Technology Corp. Temperature measurement circuit calibrated through shifting a conversion reference level

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110967128A (zh) * 2018-09-28 2020-04-07 台湾积体电路制造股份有限公司 热传感器和温度测量的方法

Also Published As

Publication number Publication date
TW200829895A (en) 2008-07-16
US20080165826A1 (en) 2008-07-10
NL2000670C2 (nl) 2009-08-04
TWI314986B (en) 2009-09-21
DE102007025363A1 (de) 2008-07-10

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AD1A A request for search or an international type search has been filed
PD2B A search report has been drawn up
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Effective date: 20160601