NL1016470A1 - Device for the determination of crystalline and polycrystalline materials of an object. - Google Patents

Device for the determination of crystalline and polycrystalline materials of an object.

Info

Publication number
NL1016470A1
NL1016470A1 NL1016470A NL1016470A NL1016470A1 NL 1016470 A1 NL1016470 A1 NL 1016470A1 NL 1016470 A NL1016470 A NL 1016470A NL 1016470 A NL1016470 A NL 1016470A NL 1016470 A1 NL1016470 A1 NL 1016470A1
Authority
NL
Netherlands
Prior art keywords
crystalline
determination
polycrystalline materials
polycrystalline
materials
Prior art date
Application number
NL1016470A
Other languages
Dutch (nl)
Other versions
NL1016470C2 (en
Inventor
Hermann Ries
Frank Cordes
Patricia Schall
Martin Hartick
Original Assignee
Heimann Systems Gmbh & Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Heimann Systems Gmbh & Co filed Critical Heimann Systems Gmbh & Co
Publication of NL1016470A1 publication Critical patent/NL1016470A1/en
Application granted granted Critical
Publication of NL1016470C2 publication Critical patent/NL1016470C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/04—Irradiation devices with beam-forming means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Geophysics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
NL1016470A 1999-11-13 2000-10-24 Device for the determination of crystalline and polycrystalline materials of an article. NL1016470C2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19954664A DE19954664B4 (en) 1999-11-13 1999-11-13 Device for the determination of crystalline and polycrystalline materials of an article
DE19954664 1999-11-13

Publications (2)

Publication Number Publication Date
NL1016470A1 true NL1016470A1 (en) 2001-05-15
NL1016470C2 NL1016470C2 (en) 2004-09-16

Family

ID=7928939

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1016470A NL1016470C2 (en) 1999-11-13 2000-10-24 Device for the determination of crystalline and polycrystalline materials of an article.

Country Status (5)

Country Link
DE (1) DE19954664B4 (en)
FR (1) FR2801105B1 (en)
GB (1) GB2359718B (en)
NL (1) NL1016470C2 (en)
RU (1) RU2265830C2 (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19954662B4 (en) * 1999-11-13 2004-06-03 Smiths Heimann Gmbh Apparatus and method for detecting unauthorized luggage items
WO2008050298A2 (en) * 2006-10-27 2008-05-02 Koninklijke Philips Electronics N.V. Imaging system for imaging an object
US7651270B2 (en) * 2007-08-31 2010-01-26 Rigaku Innovative Technologies, Inc. Automated x-ray optic alignment with four-sector sensor
BRPI0821603B1 (en) * 2007-12-25 2019-05-07 Rapiscan Systems, Inc IMAGE TRAINING APPARATUS FOR DETECTION OF A HIDDEN OBJECT CARRIED IN A HUMAN BODY
WO2010109390A1 (en) * 2009-03-27 2010-09-30 Koninklijke Philips Electronics N. V. Achromatic phase-contrast imaging
RU2589394C2 (en) * 2011-04-15 2016-07-10 Американ Сайенс Энд Инджиниринг, Инк. Back-scattering system with variable size matrix sensors
CN104897703B (en) * 2014-03-04 2018-09-28 清华大学 Check equipment, method and system
CN105094725B (en) * 2014-05-14 2019-02-19 同方威视技术股份有限公司 Image display method

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4986273A (en) * 1989-08-07 1991-01-22 Medical & Scientific Enterprises, Inc. Method of radiologically scanning the spine for measuring bone density
EP0311177B1 (en) * 1987-10-05 1993-12-15 Philips Patentverwaltung GmbH System for examining a body with a radiance source
US5007072A (en) * 1988-08-03 1991-04-09 Ion Track Instruments X-ray diffraction inspection system
DE3909147A1 (en) * 1988-09-22 1990-09-27 Philips Patentverwaltung ARRANGEMENT FOR MEASURING THE IMPULSE TRANSFER
DE4101544A1 (en) * 1991-01-19 1992-07-23 Philips Patentverwaltung ROENTGENGERAET
DE4130039A1 (en) * 1991-09-10 1993-03-11 Philips Patentverwaltung X=ray beam expander used in computer tomograph - has beam shaping aperture formed by confinement bodies
DE19510168C2 (en) * 1995-03-21 2001-09-13 Heimann Systems Gmbh & Co Method and device for determining crystalline and polycrystalline materials in an examination area
DE19745669B4 (en) * 1997-10-17 2004-03-04 Bruker Daltonik Gmbh Analysis system for the non-destructive identification of the contents of objects, especially explosives and chemical warfare agents
WO1999066317A1 (en) * 1998-06-18 1999-12-23 American Science And Engineering, Inc. Coherent scattering for material identification

Also Published As

Publication number Publication date
GB2359718A (en) 2001-08-29
FR2801105A1 (en) 2001-05-18
GB2359718B (en) 2003-12-31
RU2265830C2 (en) 2005-12-10
DE19954664B4 (en) 2006-06-08
NL1016470C2 (en) 2004-09-16
FR2801105B1 (en) 2005-03-18
DE19954664A1 (en) 2001-06-07
GB0027194D0 (en) 2000-12-27

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Legal Events

Date Code Title Description
AD1A A request for search or an international type search has been filed
RD2N Patents in respect of which a decision has been taken or a report has been made (novelty report)

Effective date: 20040513

PD2B A search report has been drawn up
MK Patent expired because of reaching the maximum lifetime of a patent

Effective date: 20201023