MX9206673A - Sistema optico de integracion para usarse en la construccion de tubos de rayos catodicos - Google Patents
Sistema optico de integracion para usarse en la construccion de tubos de rayos catodicosInfo
- Publication number
- MX9206673A MX9206673A MX9206673A MX9206673A MX9206673A MX 9206673 A MX9206673 A MX 9206673A MX 9206673 A MX9206673 A MX 9206673A MX 9206673 A MX9206673 A MX 9206673A MX 9206673 A MX9206673 A MX 9206673A
- Authority
- MX
- Mexico
- Prior art keywords
- construction
- ray tubes
- integration system
- optical integration
- cathodic ray
- Prior art date
Links
- 238000010276 construction Methods 0.000 title 1
- 230000010354 integration Effects 0.000 title 1
- 230000003287 optical effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
- H01J9/18—Assembling together the component parts of electrode systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/42—Measurement or testing during manufacture
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2209/00—Apparatus and processes for manufacture of discharge tubes
- H01J2209/18—Assembling together the component parts of the discharge tube
- H01J2209/185—Machines therefor, e.g. electron gun assembling devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2229/00—Details of cathode ray tubes or electron beam tubes
- H01J2229/07—Shadow masks
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/799,590 US5145432A (en) | 1991-11-27 | 1991-11-27 | Optical interprogation system for use in constructing flat tension shadow mask CRTS |
Publications (1)
Publication Number | Publication Date |
---|---|
MX9206673A true MX9206673A (es) | 1993-05-01 |
Family
ID=25176286
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX9206673A MX9206673A (es) | 1991-11-27 | 1992-11-19 | Sistema optico de integracion para usarse en la construccion de tubos de rayos catodicos |
Country Status (4)
Country | Link |
---|---|
US (1) | US5145432A (es) |
KR (1) | KR100291607B1 (es) |
CA (1) | CA2077727C (es) |
MX (1) | MX9206673A (es) |
Families Citing this family (43)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6067379A (en) * | 1988-12-09 | 2000-05-23 | Cognex Corporation | Method and apparatus for locating patterns in an optical image |
US6026176A (en) | 1995-07-25 | 2000-02-15 | Cognex Corporation | Machine vision methods and articles of manufacture for ball grid array inspection |
JP3658110B2 (ja) * | 1995-11-27 | 2005-06-08 | キヤノン株式会社 | 画像表示装置のための製造方法及び製造装置 |
US5825483A (en) * | 1995-12-19 | 1998-10-20 | Cognex Corporation | Multiple field of view calibration plate having a reqular array of features for use in semiconductor manufacturing |
US5768443A (en) * | 1995-12-19 | 1998-06-16 | Cognex Corporation | Method for coordinating multiple fields of view in multi-camera |
US5872870A (en) * | 1996-02-16 | 1999-02-16 | Cognex Corporation | Machine vision methods for identifying extrema of objects in rotated reference frames |
US5909504A (en) * | 1996-03-15 | 1999-06-01 | Cognex Corporation | Method of testing a machine vision inspection system |
US6259827B1 (en) | 1996-03-21 | 2001-07-10 | Cognex Corporation | Machine vision methods for enhancing the contrast between an object and its background using multiple on-axis images |
US5949901A (en) * | 1996-03-21 | 1999-09-07 | Nichani; Sanjay | Semiconductor device image inspection utilizing image subtraction and threshold imaging |
US6298149B1 (en) | 1996-03-21 | 2001-10-02 | Cognex Corporation | Semiconductor device image inspection with contrast enhancement |
US5978502A (en) * | 1996-04-01 | 1999-11-02 | Cognex Corporation | Machine vision methods for determining characteristics of three-dimensional objects |
US5943089A (en) * | 1996-08-23 | 1999-08-24 | Speedline Technologies, Inc. | Method and apparatus for viewing an object and for viewing a device that acts upon the object |
US6137893A (en) * | 1996-10-07 | 2000-10-24 | Cognex Corporation | Machine vision calibration targets and methods of determining their location and orientation in an image |
US5960125A (en) | 1996-11-21 | 1999-09-28 | Cognex Corporation | Nonfeedback-based machine vision method for determining a calibration relationship between a camera and a moveable object |
US5953130A (en) * | 1997-01-06 | 1999-09-14 | Cognex Corporation | Machine vision methods and apparatus for machine vision illumination of an object |
US6075881A (en) * | 1997-03-18 | 2000-06-13 | Cognex Corporation | Machine vision methods for identifying collinear sets of points from an image |
US5974169A (en) * | 1997-03-20 | 1999-10-26 | Cognex Corporation | Machine vision methods for determining characteristics of an object using boundary points and bounding regions |
US6141033A (en) * | 1997-05-15 | 2000-10-31 | Cognex Corporation | Bandwidth reduction of multichannel images for machine vision |
KR100257826B1 (ko) * | 1997-06-09 | 2000-07-01 | 윤종용 | 영상표시장치의 기울기 조정 방법 및 장치 |
US6608647B1 (en) | 1997-06-24 | 2003-08-19 | Cognex Corporation | Methods and apparatus for charge coupled device image acquisition with independent integration and readout |
US5978080A (en) * | 1997-09-25 | 1999-11-02 | Cognex Corporation | Machine vision methods using feedback to determine an orientation, pixel width and pixel height of a field of view |
US6025854A (en) * | 1997-12-31 | 2000-02-15 | Cognex Corporation | Method and apparatus for high speed image acquisition |
US6282328B1 (en) | 1998-01-28 | 2001-08-28 | Cognex Corporation | Machine vision systems and methods for morphological transformation of an image with non-uniform offsets |
US6236769B1 (en) | 1998-01-28 | 2001-05-22 | Cognex Corporation | Machine vision systems and methods for morphological transformation of an image with zero or other uniform offsets |
US6381375B1 (en) | 1998-02-20 | 2002-04-30 | Cognex Corporation | Methods and apparatus for generating a projection of an image |
US6215915B1 (en) | 1998-02-20 | 2001-04-10 | Cognex Corporation | Image processing methods and apparatus for separable, general affine transformation of an image |
JP2000200551A (ja) * | 1998-10-26 | 2000-07-18 | Toshiba Corp | 陰極線管の製造方法およびその装置 |
US6687402B1 (en) | 1998-12-18 | 2004-02-03 | Cognex Corporation | Machine vision methods and systems for boundary feature comparison of patterns and images |
US6381366B1 (en) | 1998-12-18 | 2002-04-30 | Cognex Corporation | Machine vision methods and system for boundary point-based comparison of patterns and images |
KR100357948B1 (ko) | 1999-11-10 | 2002-10-25 | 삼성에스디아이 주식회사 | 평면형 칼러 음극선관 |
US6684402B1 (en) | 1999-12-01 | 2004-01-27 | Cognex Technology And Investment Corporation | Control methods and apparatus for coupling multiple image acquisition devices to a digital data processor |
US6748104B1 (en) | 2000-03-24 | 2004-06-08 | Cognex Corporation | Methods and apparatus for machine vision inspection using single and multiple templates or patterns |
US7006669B1 (en) | 2000-12-31 | 2006-02-28 | Cognex Corporation | Machine vision method and apparatus for thresholding images of non-uniform materials |
WO2002058094A1 (fr) * | 2001-01-18 | 2002-07-25 | Matsushita Electric Industrial Co., Ltd. | Methode et dispositif d'assemblage d'un tube cathodique couleur |
KR100407169B1 (ko) * | 2001-08-08 | 2003-11-28 | 박수관 | 초박형 평면 브라운관 공정중 스크린/전극 아세이위치결정장치 및 그 검사방법 |
US6727125B2 (en) * | 2002-04-17 | 2004-04-27 | Sharp Laboratories Of America, Inc. | Multi-pattern shadow mask system and method for laser annealing |
US7295352B2 (en) * | 2002-05-23 | 2007-11-13 | Hewlett-Packard Development Company, L.P. | Scanning apparatus |
US8111904B2 (en) | 2005-10-07 | 2012-02-07 | Cognex Technology And Investment Corp. | Methods and apparatus for practical 3D vision system |
US8162584B2 (en) | 2006-08-23 | 2012-04-24 | Cognex Corporation | Method and apparatus for semiconductor wafer alignment |
CN101821081B (zh) * | 2007-08-23 | 2014-06-25 | 3D系统公司 | 利用激光扫描反射计的自动几何校准 |
US9254641B2 (en) * | 2013-08-05 | 2016-02-09 | Asm Technology Singapore Pte. Ltd. | Screen printer, and method of cleaning a stencil of a screen printer |
US20170095827A1 (en) * | 2014-04-30 | 2017-04-06 | Advantech Global, Ltd | Universal Alignment Adapter |
US20170208825A1 (en) * | 2016-01-21 | 2017-07-27 | Alan Backus | Gaseous transfer device |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4556902A (en) * | 1984-01-19 | 1985-12-03 | Rca Corporation | System and method for measuring the area and dimensions of apertures in an opaque medium |
US4711579A (en) * | 1986-08-12 | 1987-12-08 | H. Fred Johnston | System for automatically inspecting a flat workpiece for holes |
US4717955A (en) * | 1987-03-31 | 1988-01-05 | Rca Corporation | RAM interface control circuit |
JPS6448344A (en) * | 1987-08-17 | 1989-02-22 | Mitsubishi Electric Corp | Tensely laying method for shadow mask |
US4834686A (en) * | 1987-12-29 | 1989-05-30 | Zenith Electronics Corporation | Rail mapping method and apparatus |
US4998901A (en) * | 1988-07-22 | 1991-03-12 | Zenith Electronics Corporation | Method and apparatus for making flat tension mask color cathode ray tubes |
US4902257A (en) * | 1988-07-22 | 1990-02-20 | Zenith Electronics Corporation | Methods and apparatus for making flat tension mask color cathode ray tubes |
IE882350L (en) * | 1988-07-29 | 1990-01-29 | Westinghouse Electric Systems | Image processing system for inspecting articles |
US4980570A (en) * | 1990-02-23 | 1990-12-25 | Riken Denshi Co., Ltd | Device for determining location of apertures |
-
1991
- 1991-11-27 US US07/799,590 patent/US5145432A/en not_active Expired - Fee Related
-
1992
- 1992-09-08 CA CA002077727A patent/CA2077727C/en not_active Expired - Fee Related
- 1992-11-19 MX MX9206673A patent/MX9206673A/es not_active IP Right Cessation
- 1992-11-21 KR KR1019920021949A patent/KR100291607B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR930011052A (ko) | 1993-06-23 |
CA2077727A1 (en) | 1993-05-28 |
KR100291607B1 (ko) | 2001-09-17 |
CA2077727C (en) | 2002-04-02 |
US5145432A (en) | 1992-09-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant or registration | ||
MM | Annulment or lapse due to non-payment of fees |