MX9100697A - Metodo y aparato medidor electrico para analizar la impedancia de la fuente de un voltaje alterno real - Google Patents
Metodo y aparato medidor electrico para analizar la impedancia de la fuente de un voltaje alterno realInfo
- Publication number
- MX9100697A MX9100697A MX9100697A MX9100697A MX9100697A MX 9100697 A MX9100697 A MX 9100697A MX 9100697 A MX9100697 A MX 9100697A MX 9100697 A MX9100697 A MX 9100697A MX 9100697 A MX9100697 A MX 9100697A
- Authority
- MX
- Mexico
- Prior art keywords
- impedance
- analyze
- source
- measuring device
- electrical measuring
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/145—Indicating the presence of current or voltage
- G01R19/155—Indicating the presence of voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06766—Input circuits therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/568,713 US5105181A (en) | 1990-08-17 | 1990-08-17 | Method and electrical measuring apparatus for analyzing the impedance of the source of an actual alternating voltage |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| MX9100697A true MX9100697A (es) | 1992-04-01 |
Family
ID=24272421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX9100697A MX9100697A (es) | 1990-08-17 | 1991-08-16 | Metodo y aparato medidor electrico para analizar la impedancia de la fuente de un voltaje alterno real |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US5105181A (es) |
| EP (1) | EP0543877A1 (es) |
| JP (1) | JPH05509406A (es) |
| KR (1) | KR960006867B1 (es) |
| CN (1) | CN1030800C (es) |
| AR (1) | AR243684A1 (es) |
| BR (1) | BR9106766A (es) |
| CA (1) | CA2089664C (es) |
| HU (1) | HU211049B (es) |
| MX (1) | MX9100697A (es) |
| WO (1) | WO1992003743A1 (es) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5958879A (en) * | 1989-10-12 | 1999-09-28 | Ohio University/Edison Biotechnology Institute | Growth hormone receptor antagonists and methods of reducing growth hormone activity in a mammal |
| US5350836A (en) * | 1989-10-12 | 1994-09-27 | Ohio University | Growth hormone antagonists |
| US6787336B1 (en) | 1989-10-12 | 2004-09-07 | Ohio University/Edison Biotechnology Institute | DNA encoding growth hormone antagonists |
| US6583115B1 (en) | 1989-10-12 | 2003-06-24 | Ohio University/Edison Biotechnology Institute | Methods for treating acromegaly and giantism with growth hormone antagonists |
| DE4134695A1 (de) * | 1991-10-21 | 1993-04-22 | Beha C Gmbh | Pruefgeraet zur anzeige elektrischer spannung |
| DE4211944A1 (de) * | 1992-04-09 | 1993-10-14 | Philips Patentverwaltung | Hochspannungseinheit mit einer Meßteiler-Widerstandsanordnung |
| US5293122A (en) * | 1992-06-08 | 1994-03-08 | Lecroy Corporation | Signal probe with remote control function |
| US6380751B2 (en) | 1992-06-11 | 2002-04-30 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
| US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| US5503007A (en) * | 1992-10-05 | 1996-04-02 | Motorola, Inc. | Misfire detection method and apparatus therefor |
| US5387253A (en) * | 1992-12-28 | 1995-02-07 | Motorola, Inc. | Spectral misfire detection system and method therefor |
| DE69423095T2 (de) * | 1993-09-07 | 2000-09-28 | Motorola, Inc. | System zur bestimmung von fehlzündungen bei einer brennkraftmaschine |
| US5561377A (en) | 1995-04-14 | 1996-10-01 | Cascade Microtech, Inc. | System for evaluating probing networks |
| US6100679A (en) * | 1996-09-17 | 2000-08-08 | Tasco, Inc. | Voltage indicating instrument |
| US6002263A (en) | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
| US6259243B1 (en) | 1999-06-04 | 2001-07-10 | Lynn C. Lundquist | Method for electromagnetically shielding inductive voltage detectors |
| US6445202B1 (en) | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
| US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
| US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| CA2348799A1 (fr) * | 2001-05-22 | 2002-11-22 | Marcel Blais | Appareil d'essai de composants electroniques |
| US6836135B2 (en) | 2001-08-31 | 2004-12-28 | Cascade Microtech, Inc. | Optical testing device |
| US6777964B2 (en) | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
| US6847219B1 (en) | 2002-11-08 | 2005-01-25 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
| US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
| US6861856B2 (en) | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
| US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
| US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
| US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
| US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
| US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |
| US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
| US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US8319503B2 (en) | 2008-11-24 | 2012-11-27 | Cascade Microtech, Inc. | Test apparatus for measuring a characteristic of a device under test |
| CN101539598B (zh) * | 2009-04-14 | 2011-12-28 | 江苏工业学院 | 交流毫欧表的二端对测试方法 |
| CN103003180B (zh) * | 2010-06-02 | 2015-08-19 | 奥的斯电梯公司 | 开关检测系统 |
| CN102998520B (zh) * | 2012-12-25 | 2015-01-21 | 黄石供电公司变电运行中心 | 伸缩杆数字显示高压验电器 |
| CN103219719B (zh) * | 2013-03-21 | 2015-11-11 | 国家电网公司 | 一种利用线路出串运行限制短路电流的分析方法 |
| CN115426547A (zh) * | 2022-08-30 | 2022-12-02 | 广东电网有限责任公司 | 一种变电站告警上传系统及方法 |
| CN119986221B (zh) * | 2025-04-14 | 2025-06-24 | 崂山国家实验室 | 一种自动识别信号源接口类型的模拟信号采集电路及方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3956697A (en) * | 1972-04-17 | 1976-05-11 | Ipa Internationale Patent - Und Lizenz-Anstalt | Voltage detector for detecting different voltage levels in conductors of an electrical power line |
| US3868569A (en) * | 1973-05-08 | 1975-02-25 | Carl H Faust | Apparatus and method for distinguishing between energized and induced voltages on high voltage power lines |
| US4225817A (en) * | 1978-10-10 | 1980-09-30 | Kahlden Gerald D | Combined continuity and voltage test instrument |
| DE3513247A1 (de) * | 1985-04-13 | 1986-10-16 | Brown, Boveri & Cie Ag, 6800 Mannheim | Messverfahren zur bestimmung des schleifen- oder innenwiderstandes eines wechselstromnetzes und vorrichtung zur anwendung des verfahrens |
| DE3521633A1 (de) * | 1985-06-15 | 1986-12-18 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Schaltungsanordnung zur ermittlung des kleinsignal-innenwiderstandes einer nichtlinearen impulssignalquelle |
-
1990
- 1990-08-17 US US07/568,713 patent/US5105181A/en not_active Expired - Fee Related
-
1991
- 1991-08-08 CA CA002089664A patent/CA2089664C/en not_active Expired - Fee Related
- 1991-08-08 EP EP91914593A patent/EP0543877A1/en not_active Withdrawn
- 1991-08-08 WO PCT/CA1991/000280 patent/WO1992003743A1/en not_active Ceased
- 1991-08-08 BR BR919106766A patent/BR9106766A/pt not_active Application Discontinuation
- 1991-08-08 KR KR1019930700396A patent/KR960006867B1/ko not_active Expired - Fee Related
- 1991-08-08 HU HU9300419A patent/HU211049B/hu not_active IP Right Cessation
- 1991-08-08 JP JP3513472A patent/JPH05509406A/ja active Pending
- 1991-08-16 MX MX9100697A patent/MX9100697A/es unknown
- 1991-08-16 AR AR91320428A patent/AR243684A1/es active
- 1991-08-17 CN CN91105861A patent/CN1030800C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1030800C (zh) | 1996-01-24 |
| KR960006867B1 (ko) | 1996-05-23 |
| BR9106766A (pt) | 1993-06-15 |
| EP0543877A1 (en) | 1993-06-02 |
| US5105181A (en) | 1992-04-14 |
| CA2089664A1 (en) | 1992-02-18 |
| KR930701752A (ko) | 1993-06-12 |
| HUT65316A (en) | 1994-05-02 |
| JPH05509406A (ja) | 1993-12-22 |
| WO1992003743A1 (en) | 1992-03-05 |
| CN1059407A (zh) | 1992-03-11 |
| CA2089664C (en) | 1997-02-04 |
| HU211049B (en) | 1995-10-30 |
| HU9300419D0 (en) | 1993-05-28 |
| AR243684A1 (es) | 1993-08-31 |
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