MX2023001720A - Placa de circuito con fuentes de luz incorporadas. - Google Patents

Placa de circuito con fuentes de luz incorporadas.

Info

Publication number
MX2023001720A
MX2023001720A MX2023001720A MX2023001720A MX2023001720A MX 2023001720 A MX2023001720 A MX 2023001720A MX 2023001720 A MX2023001720 A MX 2023001720A MX 2023001720 A MX2023001720 A MX 2023001720A MX 2023001720 A MX2023001720 A MX 2023001720A
Authority
MX
Mexico
Prior art keywords
major surface
circuit board
substrate
image
light sources
Prior art date
Application number
MX2023001720A
Other languages
English (en)
Inventor
Manish Deshpande
Iii Willis Howard
Original Assignee
Siemens Healthcare Diagnostics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Healthcare Diagnostics Inc filed Critical Siemens Healthcare Diagnostics Inc
Publication of MX2023001720A publication Critical patent/MX2023001720A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8483—Investigating reagent band
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V19/00—Fastening of light sources or lamp holders
    • F21V19/001—Fastening of light sources or lamp holders the light sources being semiconductors devices, e.g. LEDs
    • F21V19/0015—Fastening arrangements intended to retain light sources
    • F21V19/0025—Fastening arrangements intended to retain light sources the fastening means engaging the conductors of the light source, i.e. providing simultaneous fastening of the light sources and their electric connections
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/90—Determination of colour characteristics
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/70—Circuitry for compensating brightness variation in the scene
    • H04N23/74—Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21Y—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21K, F21L, F21S and F21V, RELATING TO THE FORM OR THE KIND OF THE LIGHT SOURCES OR OF THE COLOUR OF THE LIGHT EMITTED
    • F21Y2115/00—Light-generating elements of semiconductor light sources
    • F21Y2115/10—Light-emitting diodes [LED]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N2021/7756—Sensor type
    • G01N2021/7759—Dipstick; Test strip
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G01N2201/0626—Use of several LED's for spatial resolution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/127—Calibration; base line adjustment; drift compensation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10024—Color image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Plasma & Fusion (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)

Abstract

Se divulga un analizador de reactivos que tiene una placa de circuito, un sistema de formación de imágenes y un procesador. La placa de circuito tiene un sustrato, y una pluralidad de cables conductores. El sustrato tiene una primera y una segunda superficie principal. La primera superficie principal es opuesta a la segunda superficie principal. El sustrato tiene una abertura que se extiende entre la primera superficie principal y la segunda superficie principal. El analizador de reactivos también incluye un sistema de formación de imágenes que tiene un campo de visión que se extiende a través de la abertura formada en el sustrato y se configura para capturar una imagen de un dispositivo de prueba de reactivos húmedo colocado en una posición de lectura en el campo de visión, la imagen tiene una pluralidad de píxeles. El procesador se configura para recibir la imagen y para analizar píxeles de la imagen para determinar la presencia o ausencia de un constituyente objetivo que está en una muestra aplicada a la almohadilla de reactivo húmeda.
MX2023001720A 2020-08-12 2021-08-10 Placa de circuito con fuentes de luz incorporadas. MX2023001720A (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202063064609P 2020-08-12 2020-08-12
US202163225124P 2021-07-23 2021-07-23
PCT/US2021/045374 WO2022035846A1 (en) 2020-08-12 2021-08-10 Circuit board with onboard light sources

Publications (1)

Publication Number Publication Date
MX2023001720A true MX2023001720A (es) 2023-02-22

Family

ID=80247285

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2023001720A MX2023001720A (es) 2020-08-12 2021-08-10 Placa de circuito con fuentes de luz incorporadas.

Country Status (5)

Country Link
US (1) US20230324307A1 (es)
EP (1) EP4196720A4 (es)
JP (1) JP2023539444A (es)
MX (1) MX2023001720A (es)
WO (1) WO2022035846A1 (es)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4247156A4 (en) * 2020-11-20 2024-03-20 Catch Data Ip Holdings Ltd METHOD AND DEVICE FOR CONTROLLING PESTS
WO2024020305A2 (en) * 2022-07-18 2024-01-25 Siemens Healthcare Diagnostics Inc. Analyzer having a transparent shield for protecting an imaging system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5519496A (en) * 1994-01-07 1996-05-21 Applied Intelligent Systems, Inc. Illumination system and method for generating an image of an object
JP5685538B2 (ja) * 2008-09-24 2015-03-18 ストラウス ホールディングス インコーポレイテッド 分析物を検出するためのキットおよび装置
CN102216745A (zh) * 2008-11-19 2011-10-12 西门子医疗保健诊断公司 用于光学诊断设备的偏振光学元件
EP2823269B1 (en) * 2012-03-09 2017-12-06 Siemens Healthcare Diagnostics Inc. Calibration method for reagent card analyzers
GB201304797D0 (en) * 2013-03-15 2013-05-01 Diagnostics For The Real World Ltd Apparatus and method for automated sample preparation and adaptor for use in the apparatus
US9984302B2 (en) * 2013-05-24 2018-05-29 Life Technologies Corporation Methods and systems for detection of a consumable in a system
CA3103543C (en) * 2016-03-15 2023-08-01 Purdue Research Foundation Devices, systems, and methods for detecting targeted compounds
GB2550602B (en) * 2016-05-24 2020-04-29 Molecular Vision Ltd Optical device
US11585804B2 (en) * 2018-10-19 2023-02-21 Youcount Inc. Urinalysis device and test strip for home and point of care use
US11268957B2 (en) * 2019-06-05 2022-03-08 Genprime Substrate reader and method of reading a substrate

Also Published As

Publication number Publication date
US20230324307A1 (en) 2023-10-12
WO2022035846A1 (en) 2022-02-17
EP4196720A1 (en) 2023-06-21
EP4196720A4 (en) 2024-01-24
JP2023539444A (ja) 2023-09-14

Similar Documents

Publication Publication Date Title
MX2023001720A (es) Placa de circuito con fuentes de luz incorporadas.
US10591533B2 (en) Display substrate, display panel and display device
US6298149B1 (en) Semiconductor device image inspection with contrast enhancement
US9903807B2 (en) Wearable device for testing biological information of user and testing system having the same
US7324685B2 (en) Inspection systems and methods
WO2016099154A1 (ko) 부품이 실장된 기판 검사방법 및 검사장치
TW200739080A (en) Connection point assembly and lsi chip detection device for the same
KR20130044750A (ko) 휴대폰 카메라를 이용한 시료 검사 장치
SE511985C2 (sv) Topografisk bestämning av en av infallande ljus belyst yta
US9825384B2 (en) Solderless edge connector
WO2021256705A1 (ko) 광원 장치와 이를 이용한 카메라 검사 장치
CN107024487B (zh) Ito导电玻璃检测系统及其检测方法
JP2005504986A (ja) 十分に対照を成さないバックグラウンドを背にした金属性の物体の計算機視覚認識
US20070217675A1 (en) Z-axis optical detection of mechanical feature height
CN109668830B (zh) 一种试剂检测载物台
CN203908967U (zh) 取像装置及光学检测设备
JP2012225716A (ja) 基板の外観検査装置および外観検査方法
US6211959B1 (en) Method of checking for the presence of connection balls
US10411646B2 (en) Inspection method and inspection system of solar cell
CN114174831A (zh) 测试条、监测装置和用于制造测试条的方法
CN101809431B (zh) 用于观察样本表面的设备
KR101604783B1 (ko) 부품 장착 검사 방법 및 장치
JP2532513B2 (ja) 物体有無検査方法
CN211348543U (zh) 芯片测试压头和芯片测试装置
TWI731507B (zh) 圖像採集裝置及具有圖像採集裝置的電子設備