MX2023001364A - Metodo para el manejo de ajustes de producto de los parametros operativos de un sistema de inspeccion de productos, sistema de inspeccion de productos y programa de computadora. - Google Patents

Metodo para el manejo de ajustes de producto de los parametros operativos de un sistema de inspeccion de productos, sistema de inspeccion de productos y programa de computadora.

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Publication number
MX2023001364A
MX2023001364A MX2023001364A MX2023001364A MX2023001364A MX 2023001364 A MX2023001364 A MX 2023001364A MX 2023001364 A MX2023001364 A MX 2023001364A MX 2023001364 A MX2023001364 A MX 2023001364A MX 2023001364 A MX2023001364 A MX 2023001364A
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MX
Mexico
Prior art keywords
product
validated
settings
user
control unit
Prior art date
Application number
MX2023001364A
Other languages
English (en)
Inventor
Nick Bridger
Original Assignee
Mettler Toledo Safeline X Ray Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mettler Toledo Safeline X Ray Ltd filed Critical Mettler Toledo Safeline X Ray Ltd
Publication of MX2023001364A publication Critical patent/MX2023001364A/es

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q30/00—Commerce
    • G06Q30/018—Certifying business or products
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/30—Authentication, i.e. establishing the identity or authorisation of security principals
    • G06F21/31—User authentication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/60—Protecting data
    • G06F21/604—Tools and structures for managing or administering access control systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/60—Protecting data
    • G06F21/62—Protecting access to data via a platform, e.g. using keys or access control rules
    • G06F21/6218—Protecting access to data via a platform, e.g. using keys or access control rules to a system of files or objects, e.g. local or distributed file system or database
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/052—Investigating materials by wave or particle radiation by diffraction, scatter or reflection reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/306—Accessories, mechanical or electrical features computer control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/401—Imaging image processing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/408—Imaging display on monitor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/646—Specific applications or type of materials flaws, defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/652—Specific applications or type of materials impurities, foreign matter, trace amounts
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37439—Computer assisted inspection, cad interactive with manual commands
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2221/00—Indexing scheme relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F2221/21—Indexing scheme relating to G06F21/00 and subgroups addressing additional information or applications relating to security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F2221/2149—Restricted operating environment

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Chemical & Material Sciences (AREA)
  • Business, Economics & Management (AREA)
  • Computer Hardware Design (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Automation & Control Theory (AREA)
  • Bioethics (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Databases & Information Systems (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Accounting & Taxation (AREA)
  • Development Economics (AREA)
  • Economics (AREA)
  • Finance (AREA)
  • Marketing (AREA)
  • Strategic Management (AREA)
  • General Business, Economics & Management (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • General Factory Administration (AREA)

Abstract

La presente invención está relacionada con un método para manejar los ajustes de producto de los parámetros operativos de un sistema de inspección de producto, tal sistema de inspección de producto que comprende una unidad de control electrónico, una unidad de radiación controlada por tal unidad de control para hacer que la radiación incida sobre un producto en cuestión, una unidad de detección controlada por tal unidad de control para detectar la radiación transmitida a través o reflejada desde tal producto en cuestión, una unidad de visualización en comunicación con tal unidad de control y una unidad de entrada en comunicación con tal unidad de control, el método que comprende: Paso 1: mostrar una primera representación en pantalla de un estado validado de ajustes de producto validados asociados a un producto seleccionado en la unidad de presentación visual y negar el acceso para modificar al menos uno de los ajustes de producto validados asociados al producto seleccionado; Paso 2: solicitar la eliminación del estado validado mediante una entrada del usuario en la unidad de entrada; Paso 3: Solicitar, mediante la unidad de control electrónico, en respuesta a la solicitud de eliminación, un inicio de sesión de usuario, mostrándose tal solicitud de inicio de sesión de usuario en una segunda representación en pantalla en la unidad de presentación visual; Paso 4: introducir un inicio de sesión de usuario mediante una entrada de usuario en la unidad de presentación visual; Paso 5: en respuesta a una operación de inicio de sesión de usuario satisfactoria, mostrar una tercera representación en pantalla de un estado no validado de los ajustes del producto asociados con el producto seleccionado en la unidad de presentación visual y permitir el acceso para modificar al menos uno de los ajustes del producto asociados al producto seleccionado.
MX2023001364A 2022-03-08 2023-01-31 Metodo para el manejo de ajustes de producto de los parametros operativos de un sistema de inspeccion de productos, sistema de inspeccion de productos y programa de computadora. MX2023001364A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP22160718.7A EP4242887A1 (en) 2022-03-08 2022-03-08 Method for handling product settings of operating parameters of a product inspection system, product inspection system and computer program

Publications (1)

Publication Number Publication Date
MX2023001364A true MX2023001364A (es) 2023-09-11

Family

ID=80684104

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2023001364A MX2023001364A (es) 2022-03-08 2023-01-31 Metodo para el manejo de ajustes de producto de los parametros operativos de un sistema de inspeccion de productos, sistema de inspeccion de productos y programa de computadora.

Country Status (8)

Country Link
US (1) US20230288919A1 (es)
EP (1) EP4242887A1 (es)
JP (1) JP2023131116A (es)
KR (1) KR20230132391A (es)
CN (1) CN116739615A (es)
AU (1) AU2023200755A1 (es)
CA (1) CA3191096A1 (es)
MX (1) MX2023001364A (es)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090119500A1 (en) * 2007-11-02 2009-05-07 Microsoft Corporation Managing software configuration using mapping and repeatable processes
EP2577260B1 (en) 2010-06-01 2022-08-31 Ackley Machine Corp. Inspection system
US10853469B1 (en) 2014-06-06 2020-12-01 Amazon Technologies, Inc User interface locking system
JP6871680B2 (ja) * 2016-03-25 2021-05-12 フクダ電子株式会社 生体情報計測装置およびその制御方法、プログラム
US20200265226A1 (en) 2017-10-02 2020-08-20 Ishida Co., Ltd. Food product processing device, food product processing device management system, and food product processing device management method
CA3018916A1 (en) 2018-09-27 2020-03-27 The Toronto-Dominion Bank Systems and methods for delegating access to a protected resource

Also Published As

Publication number Publication date
CN116739615A (zh) 2023-09-12
CA3191096A1 (en) 2023-09-08
EP4242887A1 (en) 2023-09-13
KR20230132391A (ko) 2023-09-15
AU2023200755A1 (en) 2023-09-28
JP2023131116A (ja) 2023-09-21
US20230288919A1 (en) 2023-09-14

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