MX2022012449A - Sistemas y metodos para interpretar la interaccion de alta energia. - Google Patents

Sistemas y metodos para interpretar la interaccion de alta energia.

Info

Publication number
MX2022012449A
MX2022012449A MX2022012449A MX2022012449A MX2022012449A MX 2022012449 A MX2022012449 A MX 2022012449A MX 2022012449 A MX2022012449 A MX 2022012449A MX 2022012449 A MX2022012449 A MX 2022012449A MX 2022012449 A MX2022012449 A MX 2022012449A
Authority
MX
Mexico
Prior art keywords
methods
quantitative
systems
detector
energy interactions
Prior art date
Application number
MX2022012449A
Other languages
English (en)
Inventor
Brandon Lee Goodchild Drake
Original Assignee
Decision Tree Llc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Decision Tree Llc filed Critical Decision Tree Llc
Publication of MX2022012449A publication Critical patent/MX2022012449A/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods
    • G01N2201/1296—Using chemometrical methods using neural networks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/306—Accessories, mechanical or electrical features computer control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Theoretical Computer Science (AREA)
  • Molecular Biology (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Data Mining & Analysis (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Artificial Intelligence (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La presente invención describe sistemas y métodos para interpretar interacciones de alta energía en una muestra. En particular, esta solicitud describe sistemas y métodos de análisis, que comprenden la radiación incidente a partir de una fuente sobre un analito, la detección de interacciones de energía resultantes de la radiación incidente usando un detector, el ajuste de una señal emitida por el detector de radiación usando un método de preprocesamiento para enfatizar características de esa señal, el uso de un módulo de aprendizaje automático para interpretar partes específicas de la señal ajustada, la producción de un modelo cuantitativo y/o cualitativo usando el módulo de aprendizaje automático, y la aplicación del modelo cuantitativo y/o cualitativo a una interacción de energía separada. Los modelos cuantitativos y cualitativos derivados de esta formación se pueden aplicar a nuevas entradas de detectores del mismo instrumento o de instrumentos similares.
MX2022012449A 2020-04-03 2020-04-03 Sistemas y metodos para interpretar la interaccion de alta energia. MX2022012449A (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2020/026698 WO2021201883A1 (en) 2020-04-03 2020-04-03 Systems and methods for interpreting high energy interactions

Publications (1)

Publication Number Publication Date
MX2022012449A true MX2022012449A (es) 2022-10-27

Family

ID=77929756

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2022012449A MX2022012449A (es) 2020-04-03 2020-04-03 Sistemas y metodos para interpretar la interaccion de alta energia.

Country Status (8)

Country Link
US (1) US20230204527A1 (es)
EP (1) EP4127662A4 (es)
AU (1) AU2020439463A1 (es)
CA (1) CA3178717A1 (es)
CL (1) CL2022002710A1 (es)
MX (1) MX2022012449A (es)
PE (1) PE20230272A1 (es)
WO (1) WO2021201883A1 (es)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7130267B2 (ja) * 2020-09-03 2022-09-05 株式会社リガク 全反射蛍光ｘ線分析装置及び推定方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002065090A2 (en) * 2001-01-26 2002-08-22 Sensys Medical Noninvasive measurement of glucose through the optical properties of tissue
WO2006002027A2 (en) * 2004-06-15 2006-01-05 Griffin Analytical Technologies, Inc. Portable mass spectrometer configured to perform multidimensional mass analysis
US10697953B2 (en) * 2014-06-18 2020-06-30 Texas Tech University System Portable apparatus for liquid chemical characterization
CN111373256B (zh) * 2017-11-09 2022-07-22 株式会社岛津制作所 波形分析装置
US11627895B2 (en) * 2018-08-10 2023-04-18 Samsung Electronics Co., Ltd. Apparatus and method for estimating analyte concentration, and apparatus and method for generating analyte concentration estimation model
US11874240B2 (en) * 2018-10-04 2024-01-16 Decision Tree, Llc Systems and methods for interpreting high energy interactions

Also Published As

Publication number Publication date
EP4127662A4 (en) 2023-12-27
CA3178717A1 (en) 2021-10-07
CL2022002710A1 (es) 2023-05-26
US20230204527A1 (en) 2023-06-29
PE20230272A1 (es) 2023-02-08
EP4127662A1 (en) 2023-02-08
WO2021201883A1 (en) 2021-10-07
AU2020439463A1 (en) 2022-12-01

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