MX2018005765A - Punta de contacto que tiene una fuente de luz y disposicion de punta de contacto que tiene una fuente de luz. - Google Patents
Punta de contacto que tiene una fuente de luz y disposicion de punta de contacto que tiene una fuente de luz.Info
- Publication number
- MX2018005765A MX2018005765A MX2018005765A MX2018005765A MX2018005765A MX 2018005765 A MX2018005765 A MX 2018005765A MX 2018005765 A MX2018005765 A MX 2018005765A MX 2018005765 A MX2018005765 A MX 2018005765A MX 2018005765 A MX2018005765 A MX 2018005765A
- Authority
- MX
- Mexico
- Prior art keywords
- contact pin
- light source
- arrangement
- pin arrangement
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
- G01R1/06738—Geometry aspects related to tip portion
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
Abstract
La invención se refiere a una punta de contacto (2), en particular una punta de contacto telescópica, que comprende un manguito de camisa (4), en el cual se guía para desplazamiento longitudinal un émbolo de contacto (5). Se proporciona al menos una fuente de luz (15) que se dispone dentro de la punta de contacto (2), la cual comprende al menos un medio de iluminación (6) activado eléctricamente (16), siendo que la punta de contacto (2) tiene al menos una abertura de salida de luz (18) para la luz emitida por la fuente de luz (15).
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE202015007901 | 2015-11-09 | ||
PCT/EP2016/077163 WO2017081096A1 (de) | 2015-11-09 | 2016-11-09 | Kontaktstift mit lichtquelle und kontaktstiftanordnung mit lichtquelle |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2018005765A true MX2018005765A (es) | 2018-08-01 |
Family
ID=57288401
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2018005765A MX2018005765A (es) | 2015-11-09 | 2016-11-09 | Punta de contacto que tiene una fuente de luz y disposicion de punta de contacto que tiene una fuente de luz. |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP3374775B1 (es) |
CN (1) | CN108885228B (es) |
DE (1) | DE202016008239U1 (es) |
MX (1) | MX2018005765A (es) |
TN (1) | TN2018000123A1 (es) |
WO (1) | WO2017081096A1 (es) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102018205828B4 (de) * | 2018-04-17 | 2019-11-14 | Asm Assembly Systems Gmbh & Co. Kg | System aus Überprüfungselement und Wendeadapter sowie Verfahren zum Vermessen einer Bestückgenauigkeit |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2916698A (en) * | 1956-07-30 | 1959-12-08 | Phaostron Instr And Electronic | Probe |
US6551122B2 (en) * | 2000-10-04 | 2003-04-22 | Teradyne, Inc. | Low profile pneumatically actuated docking module with power fault release |
US6894519B2 (en) * | 2002-04-11 | 2005-05-17 | Solid State Measurements, Inc. | Apparatus and method for determining electrical properties of a semiconductor wafer |
DE10220343B4 (de) * | 2002-05-07 | 2007-04-05 | Atg Test Systems Gmbh & Co. Kg Reicholzheim | Vorrichtung und Verfahren zum Prüfen von Leiterplatten und Prüfsonde |
FR2867566B1 (fr) * | 2004-03-10 | 2006-06-02 | Chauvin Arnoux | Agencement d'un instrument de mesure avec une famille de capteurs |
DE102005023425A1 (de) * | 2005-05-20 | 2006-11-23 | Rohde & Schwarz Gmbh & Co Kg | Tast- oder Meßkopf mit Beleuchtung des Kontaktbereichs |
US8253784B2 (en) * | 2008-11-13 | 2012-08-28 | Honeywell International Inc. | Image capturing device assembly for use with test probe |
DE102011102791A1 (de) * | 2011-05-27 | 2012-11-29 | Feinmetall Gmbh | Federkontaktstiftanordnung |
US20150109016A1 (en) * | 2013-10-18 | 2015-04-23 | Star Technologies, Inc. | Test probe card |
-
2016
- 2016-11-09 WO PCT/EP2016/077163 patent/WO2017081096A1/de active Application Filing
- 2016-11-09 DE DE202016008239.7U patent/DE202016008239U1/de not_active Expired - Lifetime
- 2016-11-09 EP EP16795004.7A patent/EP3374775B1/de active Active
- 2016-11-09 CN CN201680065538.8A patent/CN108885228B/zh active Active
- 2016-11-09 TN TNP/2018/000123A patent/TN2018000123A1/en unknown
- 2016-11-09 MX MX2018005765A patent/MX2018005765A/es active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
EP3374775B1 (de) | 2019-09-04 |
DE202016008239U1 (de) | 2017-06-12 |
WO2017081096A1 (de) | 2017-05-18 |
EP3374775A1 (de) | 2018-09-19 |
CN108885228A (zh) | 2018-11-23 |
WO2017081096A9 (de) | 2017-10-12 |
TN2018000123A1 (en) | 2019-10-04 |
CN108885228B (zh) | 2021-03-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG | Grant or registration |