TN2018000123A1 - Contact pin having a light source and contact pin arrangement having a light source - Google Patents

Contact pin having a light source and contact pin arrangement having a light source

Info

Publication number
TN2018000123A1
TN2018000123A1 TNP/2018/000123A TN2018000123A TN2018000123A1 TN 2018000123 A1 TN2018000123 A1 TN 2018000123A1 TN 2018000123 A TN2018000123 A TN 2018000123A TN 2018000123 A1 TN2018000123 A1 TN 2018000123A1
Authority
TN
Tunisia
Prior art keywords
contact pin
light source
arrangement
light
pin arrangement
Prior art date
Application number
TNP/2018/000123A
Inventor
Jörg Burgold
Hans-Albert Büsse
Kai Dahlhaus
Original Assignee
Feinmetall Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Feinmetall Gmbh filed Critical Feinmetall Gmbh
Publication of TN2018000123A1 publication Critical patent/TN2018000123A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Adornments (AREA)
  • Fastening Of Light Sources Or Lamp Holders (AREA)

Abstract

The invention relates to a contact pin (2), especially spring contact pin, with casing sleeve (4), in which a contact piston (5) is guided longitudinally relocatable. It is provided, that at least one light source (15) is arranged inside the contact pin (2), which has at least one electrically activatable illuminant (16), whereby the contact pin (2) has at least one light exit opening (18) for the light, which is emit.
TNP/2018/000123A 2015-11-09 2016-11-09 Contact pin having a light source and contact pin arrangement having a light source TN2018000123A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE202015007901 2015-11-09
PCT/EP2016/077163 WO2017081096A1 (en) 2015-11-09 2016-11-09 Contact pin having a light source and contact pin arrangement having a light source

Publications (1)

Publication Number Publication Date
TN2018000123A1 true TN2018000123A1 (en) 2019-10-04

Family

ID=57288401

Family Applications (1)

Application Number Title Priority Date Filing Date
TNP/2018/000123A TN2018000123A1 (en) 2015-11-09 2016-11-09 Contact pin having a light source and contact pin arrangement having a light source

Country Status (6)

Country Link
EP (1) EP3374775B1 (en)
CN (1) CN108885228B (en)
DE (1) DE202016008239U1 (en)
MX (1) MX2018005765A (en)
TN (1) TN2018000123A1 (en)
WO (1) WO2017081096A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102018205828B4 (en) * 2018-04-17 2019-11-14 Asm Assembly Systems Gmbh & Co. Kg System consisting of inspection element and turning adapter as well as method for measuring placement accuracy

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2916698A (en) * 1956-07-30 1959-12-08 Phaostron Instr And Electronic Probe
US6551122B2 (en) * 2000-10-04 2003-04-22 Teradyne, Inc. Low profile pneumatically actuated docking module with power fault release
US6894519B2 (en) * 2002-04-11 2005-05-17 Solid State Measurements, Inc. Apparatus and method for determining electrical properties of a semiconductor wafer
DE10220343B4 (en) * 2002-05-07 2007-04-05 Atg Test Systems Gmbh & Co. Kg Reicholzheim Apparatus and method for testing printed circuit boards and probes
FR2867566B1 (en) * 2004-03-10 2006-06-02 Chauvin Arnoux ARRANGEMENT OF A MEASURING INSTRUMENT WITH A FAMILY OF SENSORS
DE102005023425A1 (en) * 2005-05-20 2006-11-23 Rohde & Schwarz Gmbh & Co Kg Probe or measuring head with illumination of the contact area
US8253784B2 (en) * 2008-11-13 2012-08-28 Honeywell International Inc. Image capturing device assembly for use with test probe
DE102011102791A1 (en) * 2011-05-27 2012-11-29 Feinmetall Gmbh Spring contact pin arrangement
TWM499642U (en) * 2013-10-18 2015-04-21 Star Techn Inc Test probe card

Also Published As

Publication number Publication date
CN108885228B (en) 2021-03-12
WO2017081096A1 (en) 2017-05-18
WO2017081096A9 (en) 2017-10-12
EP3374775B1 (en) 2019-09-04
DE202016008239U1 (en) 2017-06-12
CN108885228A (en) 2018-11-23
MX2018005765A (en) 2018-08-01
EP3374775A1 (en) 2018-09-19

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