MX2016010066A - X-ray diffraction analyzer and analyzing method. - Google Patents
X-ray diffraction analyzer and analyzing method.Info
- Publication number
- MX2016010066A MX2016010066A MX2016010066A MX2016010066A MX2016010066A MX 2016010066 A MX2016010066 A MX 2016010066A MX 2016010066 A MX2016010066 A MX 2016010066A MX 2016010066 A MX2016010066 A MX 2016010066A MX 2016010066 A MX2016010066 A MX 2016010066A
- Authority
- MX
- Mexico
- Prior art keywords
- ray diffraction
- test sample
- unit
- ray
- intensity profile
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
The X-ray diffraction analyzer (1) according to an embodiment of the present invention is provided with: a measurement unit (2) for measuring the X-ray diffraction intensity profile of a test sample (16); a distance measurement unit (9) for measuring the separation distance (Z) between the test sample (16) and the measurement unit (2); and a data processing unit (10) for correction processing of the X-ray diffraction intensity profile. The measurement unit (2) has an X-ray irradiation unit (3) for irradiating the test sample (16) with X-rays, an X-ray detection unit (6) for one-dimensional detection or two-dimensional detection of multiple refracted X-rays from the test sample (16), and a chassis (8) in which the X-ray irradiation unit (3) and the X-ray detection unit (6) are fixedly arranged relative to a reference plane (17). The data processing unit (10) calculates displacement (?Z) of the test sample (16) on the basis of the separation distance (Z); in accordance with the calculated displacement (?Z), calculates the true X-ray diffraction angle (2θ) at the measurement point on the test sample (16); and corrects the X-ray diffraction intensity profile on the basis of the calculated true X-ray diffraction angle (2θ).
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014020327 | 2014-02-05 | ||
| PCT/JP2015/052699 WO2015119056A1 (en) | 2014-02-05 | 2015-01-30 | X-ray diffraction analyzer and analyzing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| MX2016010066A true MX2016010066A (en) | 2016-10-07 |
| MX361122B MX361122B (en) | 2018-11-28 |
Family
ID=53777863
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| MX2016010066A MX361122B (en) | 2014-02-05 | 2015-01-30 | X-ray diffraction analyzer and analyzing method. |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP5850211B1 (en) |
| CN (1) | CN105960590B (en) |
| MX (1) | MX361122B (en) |
| WO (1) | WO2015119056A1 (en) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102104082B1 (en) * | 2016-09-29 | 2020-04-24 | 브루커 제이브이 이스라엘 리미티드 | Closedloop control of xray knife edge |
| US10753890B2 (en) * | 2017-03-09 | 2020-08-25 | Malvern Panalytical B.V. | High resolution X-ray diffraction method and apparatus |
| JP6776181B2 (en) * | 2017-05-31 | 2020-10-28 | 株式会社神戸製鋼所 | Stress measurement method |
| JP6775777B2 (en) * | 2017-08-29 | 2020-10-28 | 株式会社リガク | How to display the measurement result in X-ray diffraction measurement |
| KR102450776B1 (en) * | 2017-10-27 | 2022-10-05 | 삼성전자주식회사 | Laser processing method, substrate dicing method, and substrate processing apparatus for performing the same |
| JP2019128307A (en) * | 2018-01-26 | 2019-08-01 | 国立大学法人東北大学 | Stress measuring device for conveyed object |
| CN110632108B (en) * | 2019-10-29 | 2023-08-22 | 中国华能集团有限公司 | Flux addition control system and method based on X-ray diffraction analysis |
| JP7165416B2 (en) * | 2020-01-15 | 2022-11-04 | 株式会社リガク | X-ray analysis device, X-ray analysis method, and X-ray analysis program |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0544007A (en) * | 1991-08-09 | 1993-02-23 | Nisshin Steel Co Ltd | Method for controlling alloying degree of galvannealed steel sheet |
| JPH0625894A (en) * | 1992-07-08 | 1994-02-01 | Kobe Steel Ltd | Production of fe-zn alloy plated steel sheet |
| JPH0968507A (en) * | 1995-08-31 | 1997-03-11 | Shimadzu Corp | X-ray diffraction device |
| JP3675079B2 (en) * | 1996-12-24 | 2005-07-27 | 株式会社島津製作所 | X-ray diffractometer |
| JP4458513B2 (en) * | 2003-08-18 | 2010-04-28 | 株式会社リガク | Equipment for evaluating specific polymer crystals |
| JP5403193B1 (en) * | 2012-04-25 | 2014-01-29 | 新日鐵住金株式会社 | Method and apparatus for measuring Fe-Zn alloy phase thickness of galvannealed steel sheet |
-
2015
- 2015-01-30 JP JP2015545215A patent/JP5850211B1/en active Active
- 2015-01-30 CN CN201580007179.6A patent/CN105960590B/en active Active
- 2015-01-30 MX MX2016010066A patent/MX361122B/en active IP Right Grant
- 2015-01-30 WO PCT/JP2015/052699 patent/WO2015119056A1/en active Application Filing
Also Published As
| Publication number | Publication date |
|---|---|
| CN105960590B (en) | 2018-12-21 |
| WO2015119056A1 (en) | 2015-08-13 |
| JP5850211B1 (en) | 2016-02-03 |
| CN105960590A (en) | 2016-09-21 |
| MX361122B (en) | 2018-11-28 |
| JPWO2015119056A1 (en) | 2017-03-23 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG | Grant or registration |