MX2016006823A - Monitorizacion optica in situ de la fabricacion de elementos computacionales integrados. - Google Patents
Monitorizacion optica in situ de la fabricacion de elementos computacionales integrados.Info
- Publication number
- MX2016006823A MX2016006823A MX2016006823A MX2016006823A MX2016006823A MX 2016006823 A MX2016006823 A MX 2016006823A MX 2016006823 A MX2016006823 A MX 2016006823A MX 2016006823 A MX2016006823 A MX 2016006823A MX 2016006823 A MX2016006823 A MX 2016006823A
- Authority
- MX
- Mexico
- Prior art keywords
- ice
- layers
- design
- forming
- integrated computational
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title abstract 3
- 238000012544 monitoring process Methods 0.000 title abstract 2
- 238000011065 in-situ storage Methods 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000523 sample Substances 0.000 abstract 2
- 238000000034 method Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B47/00—Survey of boreholes or wells
- E21B47/12—Means for transmitting measuring-signals or control signals from the well to the surface, or from the surface to the well, e.g. for logging while drilling
- E21B47/13—Means for transmitting measuring-signals or control signals from the well to the surface, or from the surface to the well, e.g. for logging while drilling by electromagnetic energy, e.g. radio frequency
- E21B47/135—Means for transmitting measuring-signals or control signals from the well to the surface, or from the surface to the well, e.g. for logging while drilling by electromagnetic energy, e.g. radio frequency using light waves, e.g. infrared or ultraviolet waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B47/00—Survey of boreholes or wells
- E21B47/12—Means for transmitting measuring-signals or control signals from the well to the surface, or from the surface to the well, e.g. for logging while drilling
-
- E—FIXED CONSTRUCTIONS
- E21—EARTH OR ROCK DRILLING; MINING
- E21B—EARTH OR ROCK DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
- E21B49/00—Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
- E21B49/08—Obtaining fluid samples or testing fluids, in boreholes or wells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/12—Circuits of general importance; Signal processing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V8/00—Prospecting or detecting by optical means
- G01V8/10—Detecting, e.g. by using light barriers
- G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Remote Sensing (AREA)
- Life Sciences & Earth Sciences (AREA)
- Mining & Mineral Resources (AREA)
- Geology (AREA)
- General Physics & Mathematics (AREA)
- Fluid Mechanics (AREA)
- Geophysics (AREA)
- Geochemistry & Mineralogy (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Electromagnetism (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Las técnicas incluyen recibir un diseño de un elemento computacional integrado (ICE), el cual diseño de ICE que incluye especificación de un sustrato y múltiples capas, sus espesores e índices de refracción complejos diana respectivos, los cuales índices de refracción complejos de capas adyacentes son diferentes entre sí, y en donde un ICE hipotético fabricado de acuerdo con el diseño de ICE está relacionado con una característica de una muestra sobre un intervalo de longitud de onda operativo; formar al menos algunas de las capas del ICE de acuerdo con el diseño de ICE; monitorizar ópticamente, durante dicha formación, las propiedades ópticas de las capas formadas utilizando una luz de sonda cuasi monocromática que tiene una longitud de onda de sonda que se encuentra fuera del intervalo de longitud de onda operativo del ICE; y ajustar la formación, al menos en parte, en función de las propiedades ópticas monitorizadas ópticamente de las capas formadas del ICE.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US2013/077686 WO2015099708A1 (en) | 2013-12-24 | 2013-12-24 | In-situ optical monitoring of fabrication of integrated computational elements |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2016006823A true MX2016006823A (es) | 2016-12-08 |
Family
ID=53479374
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2016006823A MX2016006823A (es) | 2013-12-24 | 2013-12-24 | Monitorizacion optica in situ de la fabricacion de elementos computacionales integrados. |
Country Status (4)
Country | Link |
---|---|
US (1) | US20160298955A1 (es) |
EP (1) | EP3060752A1 (es) |
MX (1) | MX2016006823A (es) |
WO (1) | WO2015099708A1 (es) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10954777B2 (en) * | 2016-02-29 | 2021-03-23 | Halliburton Energy Services, Inc. | Fixed-wavelength fiber optic telemetry for casing collar locator signals |
EP3482045A4 (en) * | 2016-09-29 | 2020-03-18 | Halliburton Energy Services, Inc. | OPTICAL ANALYSIS DEVICE AND METHOD USING MULTIPLE INTEGRATED CALCULATION ELEMENTS |
US10365206B2 (en) * | 2017-09-21 | 2019-07-30 | Japan Aerospace Exploration Agency | Surface condition monitoring apparatus |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6777684B1 (en) * | 1999-08-23 | 2004-08-17 | Rose Research L.L.C. | Systems and methods for millimeter and sub-millimeter wave imaging |
US20020090650A1 (en) * | 2000-04-06 | 2002-07-11 | Quantum Dot Corporation | Two-dimensional spectral imaging system |
US6781692B1 (en) * | 2000-08-28 | 2004-08-24 | Therma-Wave, Inc. | Method of monitoring the fabrication of thin film layers forming a DWDM filter |
US7138156B1 (en) * | 2000-09-26 | 2006-11-21 | Myrick Michael L | Filter design algorithm for multi-variate optical computing |
US7224540B2 (en) * | 2005-01-31 | 2007-05-29 | Datalogic Scanning, Inc. | Extended depth of field imaging system using chromatic aberration |
US20070019204A1 (en) * | 2005-07-25 | 2007-01-25 | Thomas Peter B | Spectrometer based multiband optical monitoring of thin films |
FR2913210B1 (fr) * | 2007-03-02 | 2009-05-29 | Sidel Participations | Perfectionnements a la chauffe des matieres plastiques par rayonnement infrarouge |
US20130035262A1 (en) * | 2011-08-05 | 2013-02-07 | Freese Robert P | Integrated Computational Element Analytical Methods for Microorganisms Treated with a Pulsed Light Source |
-
2013
- 2013-12-24 WO PCT/US2013/077686 patent/WO2015099708A1/en active Application Filing
- 2013-12-24 EP EP13900315.6A patent/EP3060752A1/en not_active Withdrawn
- 2013-12-24 MX MX2016006823A patent/MX2016006823A/es unknown
- 2013-12-24 US US14/412,308 patent/US20160298955A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP3060752A1 (en) | 2016-08-31 |
WO2015099708A1 (en) | 2015-07-02 |
US20160298955A1 (en) | 2016-10-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
MX359911B (es) | Monitorizacion in situ de la fabricacion de elementos computacionales integrados. | |
WO2011035230A3 (en) | Planar gradient index optical metamaterials | |
DE112014002071A5 (de) | Optische Überwachungseinrichtung für ein Kraftfahrzeug, insbesondere Überwachungskamera mit einer optisch transparenten Abdeckung | |
MX367538B (es) | Utilización de dispositivos informáticos ópticos para determinar analitos desconocidos. | |
WO2014130026A8 (en) | Optical design techniques for providing favorable fabrication characteristics | |
MX2015016227A (es) | Elementos computaciones integrados con filtros espectrales distribuidos lateralmente. | |
MX2016006823A (es) | Monitorizacion optica in situ de la fabricacion de elementos computacionales integrados. | |
MX361644B (es) | Monitorización en tiempo real de la fabricación de elementos computacionales integrados. | |
MX359718B (es) | Sistemas y metodos para mejorar la fidelidad del espectro optico en elementos informaticos integrados. | |
FR3016082B1 (fr) | Dispositif optoelectronique a elements semiconducteurs et son procede de fabrication | |
SA516371599B1 (ar) | طريقة لتصميم قلب عنصر حاسوبي مدمج | |
MX360943B (es) | Fabricación de elementos informáticos integrados mediante el uso de un soporte de sustrato con forma que coincida con el perfil de la pluma de deposición. | |
MX362272B (es) | Ajuste de la fabricacion de elementos computacionales integrados. | |
MX2015014124A (es) | Optimizacion de sensor optico e implementacion de sistema con estructura de capa simplificada. | |
SA516380575B1 (ar) | طريقة لتصميم تقنيات عنصر حسابي مدمج | |
MX2015016398A (es) | Elementos informaticos integrados con una superficie selectiva en frecuencia. | |
PT3105623T (pt) | Fibra ótica microestruturada com espaços seletivamente alargados de índice de refração reduzido | |
MX2016006700A (es) | Fabricacion de capas criticas de elementos computacionales integrados. | |
FI20105058A0 (fi) | Omnidirektionaalinen linssi, linssiä hyödyntävät optiset laitteet sekä menetelmä optiseksi mittaamiseksi | |
MX359196B (es) | Espectroscopía in situ para el monitoreo de la fabricación de elementos computacionales integrados. | |
FR2987131B1 (fr) | Sonde active pour microscopie optique en champ proche et son procede de fabrication. | |
TW201614313A (en) | Wafer-level lens systems and methods for manufacturing the same | |
MX2016006699A (es) | Monitorizacion resuelta espacialmente de la fabricacion de elementos computacionales integrados. | |
MX364436B (es) | Fabricación de elementos informáticos integrados que depende de la temperatura. | |
MX361204B (es) | Determinación de la dependencia de temperatura de índices de refracción complejos de los materiales de capa durante la fabricación de elementos informáticos integrados. |