MX2015007420A - Metodos y circuitos para medir un elemento de impedancia alta con base en las mediciones de constantes de tiempo. - Google Patents

Metodos y circuitos para medir un elemento de impedancia alta con base en las mediciones de constantes de tiempo.

Info

Publication number
MX2015007420A
MX2015007420A MX2015007420A MX2015007420A MX2015007420A MX 2015007420 A MX2015007420 A MX 2015007420A MX 2015007420 A MX2015007420 A MX 2015007420A MX 2015007420 A MX2015007420 A MX 2015007420A MX 2015007420 A MX2015007420 A MX 2015007420A
Authority
MX
Mexico
Prior art keywords
time constant
measuring
circuits
methods
high impedance
Prior art date
Application number
MX2015007420A
Other languages
English (en)
Other versions
MX347311B (es
Inventor
Frederick E Frantz
Original Assignee
Dust Company Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dust Company Inc filed Critical Dust Company Inc
Publication of MX2015007420A publication Critical patent/MX2015007420A/es
Publication of MX347311B publication Critical patent/MX347311B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
    • G01N27/228—Circuits therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing

Abstract

Un método para medir impedancia incluye determinar una primera constante de tiempo con base en una impedancia conocida y un capacitador, determinar una segunda constante de tiempo con base en una impedancia objetivo y el capacitador, y determinar la impedancia objetivo con base en la primera constante de tiempo y la segunda constante de tiempo.
MX2015007420A 2012-12-11 2013-12-11 Métodos y circuitos para medir un elemento de impedancia alta con base en las mediciones de constantes de tiempo. MX347311B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/710,896 US9482706B2 (en) 2012-12-11 2012-12-11 Methods and circuits for measuring a high impedance element based on time constant measurements
PCT/US2013/074266 WO2014093426A1 (en) 2012-12-11 2013-12-11 Methods and circuits for measuring a high impedance element based on time constant measurements

Publications (2)

Publication Number Publication Date
MX2015007420A true MX2015007420A (es) 2015-12-03
MX347311B MX347311B (es) 2017-04-20

Family

ID=49877066

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2015007420A MX347311B (es) 2012-12-11 2013-12-11 Métodos y circuitos para medir un elemento de impedancia alta con base en las mediciones de constantes de tiempo.

Country Status (6)

Country Link
US (1) US9482706B2 (es)
EP (1) EP2932281B1 (es)
CA (1) CA2894759C (es)
MX (1) MX347311B (es)
PL (1) PL2932281T3 (es)
WO (1) WO2014093426A1 (es)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014207478A1 (de) * 2014-04-17 2015-10-22 Robert Bosch Gmbh Verfahren und Vorrichtung zur Ermittlung eines Isolationswiderstandes sowie Hochvoltbatteriesystem mit einer solchen Vorrichtung
US20170219545A1 (en) * 2016-02-02 2017-08-03 Empire Technology Development Llc Produce item ripeness determination
EP3553538B1 (en) * 2018-04-13 2021-03-10 Nokia Technologies Oy An apparatus, electronic device and method for estimating impedance

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3642861A1 (de) 1986-12-16 1988-06-30 Diehl Gmbh & Co Schaltungsanordnung
US5287061A (en) * 1992-05-19 1994-02-15 Auburn International, Inc. On line triboelectric probe contamination detector
US5371469A (en) * 1993-02-16 1994-12-06 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Constant current loop impedance measuring system that is immune to the effects of parasitic impedances
JPH07218596A (ja) * 1994-02-03 1995-08-18 Mitsubishi Electric Corp 半導体試験装置
DE69511020T2 (de) * 1994-04-05 2000-02-24 Koninkl Philips Electronics Nv Widerstandsmessschaltung, und thermische vorrichtung, elektrischer temperaturfühler und kälteerzeugungsvorrichtung mit einer solchen messschaltung
DE4420998C2 (de) 1994-06-17 1999-03-25 Diehl Stiftung & Co Schaltungseinrichtung zum genauen Messen eines elektrischen Widerstandes
JP3224977B2 (ja) * 1994-12-12 2001-11-05 本田技研工業株式会社 非接地電源の絶縁検出方法及び装置
DE19546304A1 (de) 1995-12-12 1997-06-19 Ingenieurgesellschaft Tempelwa Schaltungsanordnung zur Temperaturmessung
US6191723B1 (en) 1999-07-22 2001-02-20 Fluke Corporation Fast capacitance measurement
AUPQ685900A0 (en) 2000-04-12 2000-05-11 Goyen Controls Co Pty Limited Method and apparatus for detecting particles in a gas flow
CA2407766C (en) * 2000-11-22 2010-06-29 Ecole De Technologie Superieure Vddq integrated circuit testing system and method
DE10119080B4 (de) 2001-04-19 2005-05-04 Acam-Messelectronic Gmbh Verfahren und Schaltanordnung zur Widerstandsmessung
US20030151418A1 (en) * 2002-02-08 2003-08-14 Leger Roger Joseph Low voltage circuit tester
ATE335206T1 (de) * 2002-09-20 2006-08-15 Koninkl Philips Electronics Nv Verfahren und einrichtung zur ruhestrombestimmung
US7173438B2 (en) 2005-05-18 2007-02-06 Seagate Technology Llc Measuring capacitance
FR2978828B1 (fr) * 2011-08-02 2013-09-06 Snecma Capteur multi-electrode pour determiner la teneur en gaz dans un ecoulement diphasique

Also Published As

Publication number Publication date
WO2014093426A1 (en) 2014-06-19
PL2932281T3 (pl) 2022-02-14
CA2894759C (en) 2021-04-20
EP2932281B1 (en) 2021-09-29
CA2894759A1 (en) 2014-06-19
US9482706B2 (en) 2016-11-01
EP2932281A1 (en) 2015-10-21
US20140159747A1 (en) 2014-06-12
MX347311B (es) 2017-04-20

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