MX160189A - Un aparato para inspeccionar automaticamente puntas de conexion electricas - Google Patents
Un aparato para inspeccionar automaticamente puntas de conexion electricasInfo
- Publication number
- MX160189A MX160189A MX1664A MX166486A MX160189A MX 160189 A MX160189 A MX 160189A MX 1664 A MX1664 A MX 1664A MX 166486 A MX166486 A MX 166486A MX 160189 A MX160189 A MX 160189A
- Authority
- MX
- Mexico
- Prior art keywords
- electrical connection
- connection points
- automatically inspect
- inspect electrical
- automatically
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/707,116 US4696047A (en) | 1985-02-28 | 1985-02-28 | Apparatus for automatically inspecting electrical connecting pins |
Publications (1)
Publication Number | Publication Date |
---|---|
MX160189A true MX160189A (es) | 1989-12-21 |
Family
ID=24840410
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX1664A MX160189A (es) | 1985-02-28 | 1986-02-25 | Un aparato para inspeccionar automaticamente puntas de conexion electricas |
Country Status (6)
Country | Link |
---|---|
US (1) | US4696047A (es) |
EP (1) | EP0194104B1 (es) |
JP (1) | JPH0727941B2 (es) |
DE (1) | DE3684938D1 (es) |
MX (1) | MX160189A (es) |
PT (1) | PT82119B (es) |
Families Citing this family (49)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4821157A (en) * | 1986-02-21 | 1989-04-11 | Hewlett-Packard Co. | System for sensing and forming objects such as leads of electronic components |
US4969199A (en) * | 1986-02-28 | 1990-11-06 | Kabushiki Kaisha Toshiba | Apparatus for inspecting the molded case of an IC device |
US4730213A (en) * | 1986-04-25 | 1988-03-08 | Rca Corporation | Method measuring transparent elements and an opaque medium |
GB8700754D0 (en) * | 1987-01-14 | 1987-02-18 | Int Computers Ltd | Test apparatus for printed circuit boards |
US4875778A (en) * | 1987-02-08 | 1989-10-24 | Luebbe Richard J | Lead inspection system for surface-mounted circuit packages |
US4862510A (en) * | 1987-03-24 | 1989-08-29 | Emhart Industries, Inc. | Lead sense system for component insertion machine |
DE3741616C2 (de) * | 1987-12-09 | 1998-05-07 | Zahoransky Anton Gmbh & Co | Prüfeinrichtung zur Endkontrolle von Bürsten, insbesondere von Zahnbürsten |
US5058177A (en) * | 1988-01-04 | 1991-10-15 | Motorola, Inc. | Method for inspection of protruding features |
JPH01182742A (ja) * | 1988-01-13 | 1989-07-20 | Mitsubishi Electric Corp | 半導体装置の外観検査機 |
US4875779A (en) * | 1988-02-08 | 1989-10-24 | Luebbe Richard J | Lead inspection system for surface-mounted circuit packages |
US4815204A (en) * | 1988-05-02 | 1989-03-28 | Emhart Industries, Inc. | Electronic component insertion machine |
FR2643721B1 (fr) * | 1989-02-28 | 1991-06-28 | Aerospatiale | Systeme pour verifier le branchement d'extremites de conducteurs dans un connecteur, et installation automatique de branchement equipee dudit systeme |
US4914514A (en) * | 1989-04-19 | 1990-04-03 | Baker Hughes Incorporated | Method and apparatus for gauging well screens |
US4945766A (en) * | 1989-09-08 | 1990-08-07 | General Motors Corporation | Method and apparatus for ultrasonic inspection |
US5058178A (en) * | 1989-12-21 | 1991-10-15 | At&T Bell Laboratories | Method and apparatus for inspection of specular, three-dimensional features |
JPH0794976B2 (ja) * | 1990-05-10 | 1995-10-11 | 松下電器産業株式会社 | 電子部品のリード浮きの検出方法 |
US5115475A (en) * | 1990-06-04 | 1992-05-19 | Motorola, Inc. | Automatic semiconductor package inspection method |
JP2870142B2 (ja) * | 1990-07-17 | 1999-03-10 | 日本電気株式会社 | コプラナリティ測定方法及びその装置 |
US5185811A (en) * | 1990-12-27 | 1993-02-09 | International Business Machines Corporation | Automated visual inspection of electronic component leads prior to placement |
US5097516A (en) * | 1991-02-28 | 1992-03-17 | At&T Bell Laboratories | Technique for illuminating a surface with a gradient intensity line of light to achieve enhanced two-dimensional imaging |
US5245409A (en) * | 1991-11-27 | 1993-09-14 | Arvin Industries, Inc. | Tube seam weld inspection device |
US5212390A (en) * | 1992-05-04 | 1993-05-18 | Motorola, Inc. | Lead inspection method using a plane of light for producing reflected lead images |
JP2851023B2 (ja) * | 1992-06-29 | 1999-01-27 | 株式会社鷹山 | Icの傾き検査方法 |
JPH07120237A (ja) * | 1993-10-22 | 1995-05-12 | Nichiden Mach Ltd | 画像認識装置 |
US5408537A (en) * | 1993-11-22 | 1995-04-18 | At&T Corp. | Mounted connector pin test using image processing |
US5805722A (en) * | 1993-11-22 | 1998-09-08 | Cognex Corporation | Method and apparatus for locating, inspecting, and placing large leaded devices |
US5648853A (en) * | 1993-12-09 | 1997-07-15 | Robotic Vision Systems, Inc. | System for inspecting pin grid arrays |
US6128034A (en) * | 1994-02-18 | 2000-10-03 | Semiconductor Technologies & Instruments, Inc. | High speed lead inspection system |
US5563703A (en) * | 1994-06-20 | 1996-10-08 | Motorola, Inc. | Lead coplanarity inspection apparatus and method thereof |
US5663799A (en) * | 1996-01-24 | 1997-09-02 | Competitive Technologies Of Pa, Inc. | Optical diffraction method and apparatus for integrated circuit lead inspection |
DE19652124C2 (de) * | 1996-12-14 | 2002-10-17 | Micronas Gmbh | Verfahren und Vorrichtung zum automatischen Überprüfen von Positionsdaten j-förmiger elektrischer Kontaktanschlüsse |
US5774227A (en) * | 1997-01-28 | 1998-06-30 | The Whitaker Corporation | Anomally detection machine for fabricated parts formed on a carrier strip and method of use |
US5956134A (en) * | 1997-07-11 | 1999-09-21 | Semiconductor Technologies & Instruments, Inc. | Inspection system and method for leads of semiconductor devices |
US6055055A (en) * | 1997-12-01 | 2000-04-25 | Hewlett-Packard Company | Cross optical axis inspection system for integrated circuits |
US6538750B1 (en) | 1998-05-22 | 2003-03-25 | Cyberoptics Corporation | Rotary sensor system with a single detector |
US6292261B1 (en) * | 1998-05-22 | 2001-09-18 | Cyberoptics Corporation | Rotary sensor system with at least two detectors |
US6571006B1 (en) * | 1998-11-30 | 2003-05-27 | Cognex Corporation | Methods and apparatuses for measuring an extent of a group of objects within an image |
US6701001B1 (en) * | 2000-06-20 | 2004-03-02 | Dunkley International, Inc. | Automated part sorting system |
US6532063B1 (en) | 2000-11-10 | 2003-03-11 | Semiconductor Technologies & Instruments | 3-D lead inspection |
US7027637B2 (en) * | 2002-02-21 | 2006-04-11 | Siemens Corporate Research, Inc. | Adaptive threshold determination for ball grid array component modeling |
US7061616B2 (en) * | 2002-03-28 | 2006-06-13 | Samsung Electronics Co., Ltd. | Optical transceiver and method for image density measurement |
DE502004000712D1 (de) * | 2003-10-30 | 2006-07-20 | Vision Tools Bildanalyse Syste | Messeinrichtung und messverfahren für stifte, insbesondere steckerstifte |
US20050226489A1 (en) | 2004-03-04 | 2005-10-13 | Glenn Beach | Machine vision system for identifying and sorting projectiles and other objects |
US9424634B2 (en) | 2004-03-04 | 2016-08-23 | Cybernet Systems Corporation | Machine vision system for identifying and sorting projectiles and other objects |
US9251346B2 (en) * | 2013-02-27 | 2016-02-02 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Preventing propagation of hardware viruses in a computing system |
US9703623B2 (en) | 2014-11-11 | 2017-07-11 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Adjusting the use of a chip/socket having a damaged pin |
JP6829946B2 (ja) * | 2016-04-28 | 2021-02-17 | 川崎重工業株式会社 | 部品検査装置および方法 |
US10495579B2 (en) | 2016-05-02 | 2019-12-03 | Kla-Tencor Corporation | System and method for compensation of illumination beam misalignment |
WO2020012628A1 (ja) * | 2018-07-13 | 2020-01-16 | 株式会社Fuji | 異物検出方法および電子部品装着装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1288936A (es) * | 1969-05-20 | 1972-09-13 | ||
JPS6042885B2 (ja) * | 1978-05-18 | 1985-09-25 | 日本電気株式会社 | Icリ−ド曲り検査装置 |
US4264202A (en) * | 1979-09-04 | 1981-04-28 | Automation Systems, Inc. | Pin receptacle inspection apparatus and method |
US4472056A (en) * | 1980-07-23 | 1984-09-18 | Hitachi, Ltd. | Shape detecting apparatus |
CA1193709A (en) * | 1980-11-17 | 1985-09-17 | Gary G. Wagner | Operator programmable inspection apparatus |
US4398256A (en) * | 1981-03-16 | 1983-08-09 | Hughes Aircraft Company | Image processing architecture |
SE8103773L (sv) * | 1981-06-16 | 1982-12-17 | Asea Ab | Optisk digitizer/legesmetare |
JPS5870110A (ja) * | 1981-08-03 | 1983-04-26 | マイクロコンポ−ネント テクノロジ− インコ−ポレ−テツド | リ−ド整列状態検査装置 |
US4553843A (en) * | 1981-08-03 | 1985-11-19 | Micro Component Technology, Inc. | Apparatus for determining the alignment of leads on a body |
US4550432A (en) * | 1983-04-13 | 1985-10-29 | At&T Bell Laboratories | Image processor using a moment generator |
-
1985
- 1985-02-28 US US06/707,116 patent/US4696047A/en not_active Expired - Fee Related
-
1986
- 1986-02-25 MX MX1664A patent/MX160189A/es unknown
- 1986-02-27 JP JP61042769A patent/JPH0727941B2/ja not_active Expired - Lifetime
- 1986-02-27 DE DE8686301423T patent/DE3684938D1/de not_active Expired - Lifetime
- 1986-02-27 EP EP86301423A patent/EP0194104B1/en not_active Expired - Lifetime
- 1986-02-28 PT PT82119A patent/PT82119B/pt not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPS61280629A (ja) | 1986-12-11 |
EP0194104A3 (en) | 1989-01-18 |
PT82119A (en) | 1986-03-01 |
DE3684938D1 (de) | 1992-05-27 |
EP0194104A2 (en) | 1986-09-10 |
JPH0727941B2 (ja) | 1995-03-29 |
US4696047A (en) | 1987-09-22 |
EP0194104B1 (en) | 1992-04-22 |
PT82119B (pt) | 1992-05-29 |
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