MX159519A - Metodo mejorado para detectar y eliminar trayectorias de corriente de corto circuito en dispositivos fotovoltaicos - Google Patents
Metodo mejorado para detectar y eliminar trayectorias de corriente de corto circuito en dispositivos fotovoltaicosInfo
- Publication number
- MX159519A MX159519A MX199163A MX19916383A MX159519A MX 159519 A MX159519 A MX 159519A MX 199163 A MX199163 A MX 199163A MX 19916383 A MX19916383 A MX 19916383A MX 159519 A MX159519 A MX 159519A
- Authority
- MX
- Mexico
- Prior art keywords
- detecting
- short circuit
- improved method
- circuit current
- photovoltaic devices
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/34—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies not provided for in groups H01L21/18, H10D48/04 and H10D48/07, with or without impurities, e.g. doping materials
- H01L21/46—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428
- H01L21/461—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/469—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/428 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After-treatment of these layers
- H01L21/47—Organic layers, e.g. photoresist
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/17—Photovoltaic cells having only PIN junction potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
- H10F71/10—Manufacture or treatment of devices covered by this subclass the devices comprising amorphous semiconductor material
- H10F71/107—Continuous treatment of the devices, e.g. roll-to roll processes or multi-chamber deposition
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Photovoltaic Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/520,054 US4464823A (en) | 1982-10-21 | 1983-08-03 | Method for eliminating short and latent short circuit current paths in photovoltaic devices |
Publications (1)
Publication Number | Publication Date |
---|---|
MX159519A true MX159519A (es) | 1989-06-26 |
Family
ID=24071012
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX199163A MX159519A (es) | 1983-08-03 | 1983-10-20 | Metodo mejorado para detectar y eliminar trayectorias de corriente de corto circuito en dispositivos fotovoltaicos |
Country Status (8)
Country | Link |
---|---|
EP (1) | EP0134364A3 (enrdf_load_stackoverflow) |
JP (1) | JPS6046080A (enrdf_load_stackoverflow) |
KR (1) | KR850003476A (enrdf_load_stackoverflow) |
AU (1) | AU2042183A (enrdf_load_stackoverflow) |
BR (1) | BR8305792A (enrdf_load_stackoverflow) |
ES (1) | ES526597A0 (enrdf_load_stackoverflow) |
IN (1) | IN160221B (enrdf_load_stackoverflow) |
MX (1) | MX159519A (enrdf_load_stackoverflow) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0213910B1 (en) * | 1985-08-24 | 1994-03-02 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device free from the current leakage through a semi-conductor layer |
US6228662B1 (en) | 1999-03-24 | 2001-05-08 | Kaneka Corporation | Method for removing short-circuited sections of a solar cell |
EP1039554B1 (en) * | 1999-03-25 | 2003-05-14 | Kaneka Corporation | Method of manufacturing thin film solar cell-modules |
JP4627575B2 (ja) * | 1999-08-12 | 2011-02-09 | 株式会社カネカ | 太陽電池の短絡部除去方法 |
AU766466B2 (en) * | 1999-05-14 | 2003-10-16 | Kaneka Corporation | Reverse biasing apparatus for solar battery module |
JP2007189199A (ja) | 2005-12-12 | 2007-07-26 | Tdk Corp | キャパシタおよびその製造方法 |
JPWO2010029939A1 (ja) | 2008-09-09 | 2012-02-02 | 三洋電機株式会社 | 太陽電池モジュールの製造方法 |
CA2854909C (en) * | 2011-11-14 | 2018-01-30 | Kabushiki Kaisha Nihon Micronics | Repair apparatus of sheet type cell |
DE102018001057A1 (de) | 2018-02-07 | 2019-08-08 | Aic Hörmann Gmbh & Co. Kg | Verfahren zur Verbesserung des ohmschen Kontaktverhaltens zwischen einem Kontaktgitter und einer Ermitterschicht einer Siliziumsolarzelle |
CN108233329B (zh) * | 2018-03-16 | 2024-05-31 | 西安赛诺克新能源科技有限公司 | 一种提高主电路断开响应速度的保护电路 |
CN117353651B (zh) * | 2023-10-16 | 2024-04-16 | 中科宏一教育科技集团有限公司 | 光伏系统控制方法、装置、设备和介质 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4197141A (en) * | 1978-01-31 | 1980-04-08 | Massachusetts Institute Of Technology | Method for passivating imperfections in semiconductor materials |
US4166918A (en) * | 1978-07-19 | 1979-09-04 | Rca Corporation | Method of removing the effects of electrical shorts and shunts created during the fabrication process of a solar cell |
JPS5683981A (en) * | 1979-12-13 | 1981-07-08 | Matsushita Electric Ind Co Ltd | Semiconductor device and manufacture |
US4385971A (en) * | 1981-06-26 | 1983-05-31 | Rca Corporation | Electrolytic etch for eliminating shorts and shunts in large area amorphous silicon solar cells |
-
1983
- 1983-10-19 AU AU20421/83A patent/AU2042183A/en not_active Abandoned
- 1983-10-20 KR KR1019830004960A patent/KR850003476A/ko not_active Withdrawn
- 1983-10-20 MX MX199163A patent/MX159519A/es unknown
- 1983-10-20 JP JP58196928A patent/JPS6046080A/ja active Granted
- 1983-10-20 BR BR8305792A patent/BR8305792A/pt unknown
- 1983-10-20 ES ES526597A patent/ES526597A0/es active Granted
- 1983-10-21 EP EP83306405A patent/EP0134364A3/en not_active Withdrawn
- 1983-10-29 IN IN722/DEL/83A patent/IN160221B/en unknown
Also Published As
Publication number | Publication date |
---|---|
ES8503889A1 (es) | 1985-03-01 |
BR8305792A (pt) | 1985-05-21 |
IN160221B (enrdf_load_stackoverflow) | 1987-07-04 |
EP0134364A3 (en) | 1986-06-04 |
KR850003476A (ko) | 1985-06-17 |
EP0134364A2 (en) | 1985-03-20 |
JPS6046080A (ja) | 1985-03-12 |
AU2042183A (en) | 1985-02-07 |
ES526597A0 (es) | 1985-03-01 |
JPH0572756B2 (enrdf_load_stackoverflow) | 1993-10-12 |
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